臺灣博碩士論文加值系統

影像殘留，一直是液晶平面顯示技術探討主題之一，而過去的文獻大多以方波信號進行分析與討論，鮮少有實際LCD Driver IC驅動觀察其影像殘留現象與一般方波驅動作比較；且有鑑於一般要觀察影像殘留現象須長時間的觀察與等待。
因此本文主要探討STN LCD(Super Twisted Nematic Liquid Crystal Display) 於不同驅動信號下的影像殘留現象，包括目前實驗常用的方波、LCD實際驅動的Driver IC、及信號產生器模擬Driver IC信號的影像殘留現象；並為了縮短觀察影像殘留的實驗時間，因此我們設計實驗將4個不同影像殘留程度的LCD Panel加上含有交流信號( 0.1V / 1KHz )的直流電壓一段時間後，再移除直流電壓，並同時量測電容值變化，以觀察液晶盒內離子吸附於配向層後再釋放所需時間(ion trapping time)，其實驗結果與光學判定影像殘留方式得到相同的趨勢。

Image sticking has always been one of LC flat display technology discussion topic. In the past records, most analysis and discussion were proceeding with square wave signal, rarely driven by realistic LCD Driver IC to investigate the image sticking phenomenon and compared to general square wave driving. To investigate the image sticking, the longer time to wait and investigate is needed.
Thus, the paper is mainly to discuss STN LCD image sticking phenomenon under different driving signals, including the present generally used square wave, LCD realistic driving Driver IC, and signal generator to simulate the image sticking phenomenon. To shorten the experiment process time of investigating image sticking, Thus we design an experiment by imposing DC voltage with AC signal (0.1V/1KHz) on 4 LCD panels with different degrees of image sticking for some time, then removing the DC voltage and measuring the variation of capacity value of each LCD to inspect and record the ion trapping time during ion adhered to alignment layer at the beginning and then released from it, which is able to get the same trend as we judge the sticking image by applying Optics method.

摘要
Abstract
誌謝
目錄
圖目錄
縮寫及符號對照表
第一章 緒論
1.1 前言
1.2 文獻探討
1.2.1 影像殘留發生原因
1.2.2 液晶盒中離子的來源
1.2.3 離子橫向移動模型介紹
1.2.4 影像殘留量測方法
1.3 論文研究重點及目的
第二章 影像殘留現象觀察
2.1 實驗架設與歩驟
2.2 樣品參數說明
2.3 影像殘留現象觀察
2.4 結果與討論
第三章 影像殘留與驅動時間之穿透率量測
3.1 實驗說明
3.2 實驗架設與歩驟
3.3 樣品參數說明
3.4 T-t curve量測結果
3.5 結果與討論
第四章 電容對時間變化之量測
4.1 實驗原理說明
4.2 實驗架設與歩驟
4.3 樣品參數說明
4.4 電容對時間量測結果
4.5 結果與討論
第五章 結論及未來展望
第六章 參考文獻
附錄

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