|
Ref. 1S. Iijima, Nature 354, P.56 (1991). Ref. 2奈米科技, 馬遠榮 著;商周出版 (2002). Ref. 3Li Song et al, Advanced Material 16 (17),P.1529-1534 (2004). Ref. 4J. D. Harris et al, Materials Science and Engineering B 116, P.369–374 (2005). Ref. 5Y. Huha, J. Y. Lee, and C. J. Lee, Thin Solid Films 475, P.267–270 (2005). Ref. 6T. Sun, G. Wang, H. Liu, L. Feng, L. Jiang, and D. Zhu, Journal of the American Chemical Society 125, P.14996-14997 (2003). Ref. 7Z. P. Huang, D. L. Carnahan, J.Rybczynski, M. Giersig, M. Sennett, D. Z. Wang, J. G. Wen, K. Kempa, and Z. F. Ren, Applied Physics Letters 82 (3), P.460-462 (2003). Ref. 8O. Albrecht, H. Matsuda, K. Eguchi, and T. Nakagiri Thin Solid Films 284-285, P.152-156 (1996). Ref. 9D. Whang, S. Jin, Y. Wu, and C. M. Lieber, Nano Letters 3 (9), P.1255-1259 (2003). Ref. 10X. Q. Chen, T. Saito, H. Yamada, and K. Matsushige, Applied Physics Letters 78 (23), P.3714-3716 (2001). Ref. 11Michael D. Lynch and David L. Patrick, Nano Letters 2 (11), P.1997-1201 (2002). Ref. 12L. Huang, X. Cui, G. Dukovic, and S. P O’Brien, Nanotechnology 15, P.1450–1454 (2004). Ref. 13H. Shimoda, L. Fleminga, K. Hortonb, and O. Zhou, Physica B 323, P.135-136 (2002). Ref. 14Z. Wu, Z. Chen, X. Du, J. M. Logan, Je. Sippel, M. Nikolou, K. Kamaras, J. R. Reynolds, D. B. Tanner, A. F. Hebard, and A. G. Rinzler, Science 305, P.1273-1276 (2004). Ref. 15F. Hennrich, S. Lebedkin, S. Malik, J. Tracy, M. Barczewski, H. Rosner, and M. Kappes, Physical Chemistry Chemical Physics (4) 2273-2277 (2002). Ref. 16H. Shimoda, S. J. Oh, H. Z. Geng, R. J. Walker, X. B. Zhang, L. E. McNeil, and O. Zhou, Advanced Material 14 (12), P.899-901 (2002). Ref. 17 J. Liu, A. G. Rinzler, H. Dai, J. H. Hafner, R. K. Bradley, P. J. Boul, A. Lu, T. Iverson, K. Shelimov, C. B. Huffman, F. R. Macias, Y. S. Shon, T. R.Lee, D. T. Colbert, and R. E. Smalley, Science 280, P.1253-1256 (1998). Ref. 18H. Shimoda, B. Gao, X. P. Tang, A. Kleinhammes, L. Fleming, Y. Wu, and O. Zhou, Physical Review Letters 88 (1), P.15502 (2002). Ref. 19B. W. Smith and D. E. Luzzi, Chemical Physics Letters 321, P.169-174 (2000).
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