|
Reference: 1.Bode C.A., Sonderman T.J., Kittler R. and McIntyre M., "Addressing the Transition to 300mm Wafer Fabrication Through Automation," Global Semiconductor, to be published. 2.Brannen, Mary Yoko, “Culture as the Critical Factor in Implementing Innovation,” Business Horizons, November-December 1991, P59-67. 3.Chandler, Gaylen N., “Unraveling the Determiniants and Consequences of an Innovation-Supportive Organizational Culture,” Entreperneurship Theory and Practice, Fall 2000, P59-76. 4.Dahlgaard, Jens J, “Integrating Business Excellence and Innovation Management: Developing a Culture for Innovation, Creativity and Learning,” Total quality Management, June 1999, Vol: 10, Is: 4/5. 5.Davenport, Thomas H., “Successful Knowledge Management Projects,” Sloan Management Review, winter 1998, P43-57. 6.Dayton, “Building a Learning Organization at Coopers & Lybrand,” Planning Review, September-October 1994, P28-34. 7.Detert, James R., “A Framework for Linking Culture and Improvement Initiatives in Organizations,” Acdamady of Management Review, Vol. 25, No.4, P850-863. 8.Dougherty, Deborah, “The Effects of Organizational Downsizing on Product Innovation,” California Management Review, Summer 1995, P29-43. 9.Drucker, Peter F., “Breakthrough Thinking,” Harvard Business Review, November-December 1998, P96-105. 10.Drucker, Peter F., “The Discipline of Innovation,” Harvard Business Review, May-June 1985, P67-72. 11.Gruber, Harald, “The Learning Curve in The Production of Semiconductor Memory Chips,” Applied Economics, 1992, Vol. 24, P885-894. 12.Gruber, Harald, “The Yield Factor and The Learning Curve in Semiconductor Production,” Applied Economics, 1994, Col. 26, P837-843. 13.Hatch, Nile W., “Process Innovation and learning by Doing in Semiconductor Manufacturing,” Management Science, November 1998, P1461-1477. 14.Hauser, Markus, “Organizational Culture and Innovativeness of Firms – an Intergrative View,” Technology Management, Vol. 16, Nos. 1/2/3, 1998, P239-255. 15.Inglehart, Roland and Baker, Wayne E, “Modernization’s challenge to traditional values: Who’s afraid of Ronald McDonald? ” The Futurist; Washionton, Mar/Apr 2001, Vol: 35, Is: 2, p 16-21. 16.Jarvis R, Retersdorf M; Can technology keep pace with high aspect-ratio inspection?; Solid State Technology, November 2003 17.Johnson, Gerry, “Strategy Through a Culture Lens,” Management Learning, 2000, P403-426. 18.Kittler, R., "Challenges for Use of Statistical Software in the Semiconductor Industry," Proc. Joint Statistical Meetings, August 2000. 19.Leachman, R.C. and Berglund, C.N., "Systematic Mechanisms Limited Yield (SMLY) Assessment Study," SEMATECH Document #03034382A-ENG, March 31, 2003. 20.Lee, Fourmun, “Yield Management: Present and Future,” Semiconductor International, March 2000, P85-94. 21.Lin, Wei-shong, Competitive Strategy, Spring-Morn Co, Taipei, Taiwan, 2002. 22.Machor, Jeffrcy T, “Reversal of Fortune? The Recovery of U.S. Semiconductor Industry,” California Management Review, Vol. 41, IS. 1, P 107-136. 23.Mayo, “The Human Problems of an industrial Civilization,” 1933. 24.McDermott, Christopher M., “Organizational Culture and Advanced Manufacturing Technology Implementation,” Journal of Operations Management, 1999, P 521-533. 25.Moore, Gordon, Electronic Materials Symposium Santa Clara, CA, March 1998. 26.Next Generation Manufacturing: A Framework for Action,. Agility Forum, Bethlehem, PA, 1997. 27.Nonaka, “Creation Organizational Order Out of Chaos: Self-Renewal in Japanese Firms,” California Management Review, Spring 1998, P57-73. 28.Nonaka, “Knowledge-Creating Compnay,” Harvard Business Review, November-December 1991, P96-105. 29.Nonaka, “Redundant, Overlaping Organization: A Japanese Approach to Managing the Innovation Process,” California Management Review, spring 1990, P27-38. 30.Nonaka, “Redundant, Overlapping Organization: A Japanese Approach to Managing the Innovation Process,” California Management Review, Spring 1990, P57-73. 31.Nonaka, “The New Product Development Game,” Harvard Business Review, January-February 1986, P137-146. 32.Nonaka, “Toward a Self Organization Paradigm: Managing the Creation of Information,” Working Paper, Institute of Business Research, Hitotsubashi University, August 1985. 33.Nonaka, “Toward Middle-Up-Down Management:Accelerating Information Creation,” Sloan Management Review, Spring 1988, P9-18. 34.Nonoka, “Destruction and Creation of Organizational order: A Suggested Paradigm for Self-Organization,” Organizational Science, 20/1 (1986),[in Japanese]. 35.Pisano, Gary P., “Managing Hi-Tech industry,” Harvard Business Review, September-October 1995, P96-105. 36.Quinn, James Brian, “Managing Innovation: Controlled Chaos,” Harvard Business Review, May-June, P 73-84. 37.Schein, “Innovative Cultures and Organizations,” 1990. 38.Scher, G.M., "Wafer Tracking Comes of Age," Semiconductor International, May 1991, p. 126. 39.Simon, H. A., ”Administrative Behavior,” 1945. 40.Taylor, Andrew, “Technology as knowledge - Toward a New Perspective on knowledge Management in Electronics,” Technology Management, 1996, P296-314. 41.The International Technology Roadmap for Semiconductors - 2003 Edition (San Jose: SIA, 2003) 42.Tobin KW, Karnowski TP, Lakhani F; Technology Considerations for Future Semiconductor Data Management Systems; Semiconductor FABTECH, 12th Edition, first 2000 issue. 43.Tushman, Michael L, “Ambidextrous Organizations: Management Evolutionary and Revolutionary Change,” California Management Review, Summer 1996, P8-23. 44.Walker H, Balachandran H, Lakhani F, Stanojevic Z, Jandhyala S, Saxena J, Butler K; Computer-Aided Fault to Defect Mapping (CAFDM) for Defect Diagnosis;IEEE International Test Conference, October 2000.
|