|
[1] K. Verhaege, P. Roussel, G. Groseneken, H. Maes, H. Gieser, C. Russ, P. Egger, X.Guggenmos and F. Kuper, “Analysis of HBM Testers and Specifications using a 4thOrder Lumped Element Model,” In EOS/ESD Symposium Proceedings 1993, pages 129-137, 1993. [2] M. Chaine, K. Verhaege, L Avery, M. Kelly, H. Gieser, K. Bock, L.G. Henry, TMeuse, T. Brodbeck and J. Barth, “Investigation into Socketed CDM (SDM) Tester Parasitics,” In EOS/ESD Symposium Proceedings 1998, pages 301-306, 1998. [3] Influence of Tester, Test Method, and Device Type on CDM ESD Testing Koen Verhaege, Guido V. Groeseneken, Member, ZEEE,Herman E. Maes, Senior Member, ZEEE, Peter Egger, and Horst Gieser [4] 勝華科技,”靜電防治教育訓練教材” 2003 [5] 靜電放電之測試與防制 工業技術研究院系統晶片技術中心 [6] 勝華科技,“ESD - 靜電原理與靜電消除器原理”2004[7] 勝華科 技,”a-TFT MOS & ESD 工作原理簡介”2005 [8] 勝華科技 ,”LCD Layout 設計規範V1.0—2005,03,10 [9] 勝華科技,” ESD測試平台測試規範2005,03 [10] 勝華科技,”ESD FOR LCM測試規範2006,01 [11] 二澤正行, “靜電管理入門,全華科技圖書股份有限公司,2005,10 [12] 冉存仁,傅武雄, 『液晶顯示器製程現場靜電問題評估與防制成效』,第二屆台灣靜電放電防護技術研討會 [13]曾亭嘉、劉展睿、黃昱仁, 『靜電偵測於平面顯示器TFT 製程之研 究』,2005,04 [14]邱冠銘, Simulation and Measurement of ESD Test for Electronic Devices,2003,06 [15]John R.Barnes,”電子設備中電路板佈局, 佈線和黏著的靜電釋放設計規則”,電子工程專輯,2002,06 [16] ESD保護對高密度、小型化和具有複雜功能的電子設備”,電子工程 專輯,2006,01 [17] 陳榮達,” 電子產品ESD認證測試及防制技術”, 電子工程專 輯,2003,08 [18] MIL-STD-883C method 3015.7, "Military Standard Test Methods and Proc. For Microelectronics", Dept. of Defense, Washington, D. C., U.S.A., 1989. [19]C. H. Dfaz, T. E. Kopley, and P. J. Marcoux, "Building-in ESD/EOS reliability for Sub-Halfmicron CMOS Processes," IEEE Transactions on Electron Devices, Vol. 43, No. 6, pp. 991-999, June 1996. [20]EOS/ESD Standard for ESD Sensitivity Testing, EOS/ESD Association, NY., 1993.
|