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研究生:侯昇平
研究生(外文):Sheng-Ping Hou
論文名稱:新世代高密度藍光碟片記錄點檢測研究
論文名稱(外文):Study of recording bits of new generation high density blue-ray disks
指導教授:謝章興陳思翰陳思翰引用關係
指導教授(外文):J. H. HsiehSy-Hann Chen
學位類別:碩士
校院名稱:明志科技大學
系所名稱:工程技術研究所
學門:工程學門
學類:綜合工程學類
論文種類:學術論文
論文出版年:2006
畢業學年度:94
語文別:中文
論文頁數:51
中文關鍵詞:光碟片藍光掃描表面電位顯微儀導電性原子力顯微儀
外文關鍵詞:optical diskblur-raySSPMC-AFM
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本研究以快速準確的方式檢測光儲存相變化記錄點,檢測的樣品包含DVD+RW及新世代藍光碟片(HD-DVD、blu-ray disc),使用掃描式電子顯微鏡、導電性原子力顯微儀及掃描表面電位顯微儀等設備進行檢測,結果顯示導電性原子力顯微儀具較高的解析度,而掃瞄表面電位顯微儀可以作定量分析,並利用這兩種方法檢測不同寫入及擦拭參數下記錄點的變化情形。
DVD+RW記錄點因為過高的寫入功率(15mW~20mW)產生側邊不完整及中心區域結晶化,在適當的寫入功率下則無上述情形產生,其記錄點尺寸僅與雷射功率強度有關。HD-DVD採用兩種不同的膜層結構,在相同寫入策略下會因為膜層結構的差異造成記錄點長度由150nm下降至62nm。
討論擦拭動作對記錄點之影響方面,15mW雷射功率在DVD+RW所寫下的記錄點,在8mW雷射功率擦拭時,記錄點可以完全被擦拭且其記錄層的結晶度高於未寫入的碟片;在4~6mW擦拭時記錄點的殘留痕跡與未寫入區域功函數差值約4.5mV;2mW擦拭功率則無法擦拭掉記錄點。
使用導電性原子力顯微儀及掃描表面電位顯微儀,可以為光儲存相變化記錄媒體之寫入擦拭策略和製程參數,提供一個具有高度參考價值的撿測衣據,對於未來高密度光儲存相變化記憶的發展有很大的幫助。
In this study, a rapid and precise method was adopted to measure the recording bits of some optical storage that apply phase-change theory. The studies were carried out on DVD+RW and new-generation blue-ray disks (HD-DVD and blu-ray disc). To carry out the experiment, scanning electron microscopy (SEM)、conductive atomic force microscopy (C-AFM) and scanning surface potential microscopy (SSPM) were used. The results show that C-AFM has the highest resolution, while SSPM has the best quantitative analyzing capability. Both C-AFM and SSPM were used to examine the reliability and performance of optical recording with respect to process parameters.
When high power laser (15mW~20mW) was used to write on DVD+RW disk, the sides of the recording bits were affected and the center region showed the sign of crystallization. If lower laser power was used, the size of recording bit would only depend on laser power. However, if laser power was used on a double-layered HD-DVD, which had different layer thickness and structure, the recording bit length changed from 150 nm down to 62 nm.
For erasing study, various erasing power were applied on the recording bit written with 15 mW. It is found that being erased with 8mW, the bits can be completely erased, and the recording region had a higher degree of crystallinity than the unrecorded region. When 4~6 mW were used to erase the recording bits, the difference in work function between the erased region and the unrecorded region was around 4.5 mV. 2mW laser power can not erase recording bit because the power is too low.
The C-AFM and SSPM used in the present study can be very helpful in developing the best strategy for writing and erasing, adjusting composition of phase-change recording material, and adjusting layer thickness and structure.
第一章 前言…………………………………………………………………...1
1.1 序論…….………………………………………………………………….1
1.2光儲存系統的發展……………………..…………………………………..2
1.3光儲存容量的提升…………………………………………………4
1.4 記錄材料及記錄點特性………………………………………….9
1.5 研究動機………………………………………………………...……….12
第二章、實驗設備與研究方法……………………………………….………15
2.1掃描探針顯微術介紹………………………………………..…..15
2.2樣品製備……………………………………………..……………24
第三章 實驗結果與討論…………………………………….………………25
3.1比較C-AFM及SSPM 對於記錄點研究的差異………………25
3.1.1相變化材料因素………………………………………………..29
3.1.2量測機制因素……………………………………………….….29
3.2表面位能顯微術研究擦拭功率對DVD+RW的影響…………32
3.3 不同寫入功率對DVD+RW記錄點的影響……………………………40
3.4 記錄點檢測技術應用於HD-DVD碟片膜層結構開發…………………45
第四章 結論………………………………………………………………….50
1. M. Born, E. Wolf. Principles of Optics, Oxford: Pergamon,81(1959).
2. write book of blu-ray disc format 2004
3. Dayu Chen, dianyong Chen, Bei Wang Proc. of SPIE Vol.5966 59661R(2005)
4. Y. kawazu, H. Kudo, S. onari and T. Arai: Jpn. J. Appl. Phys. 29, 2698 (1990)
5. J.-B. Lee, C.-J. Lee and D.-K. Choi: Jpn. J. Appl. Phys. 40,6117 (2001)
6. Y.-C. Her and C.-L. Wu: Jpn. J. Appl. Phys. 43, 1013 (2004)
7. A. E. T. Kuiper, R. J. M. Vullers, D. Pasquariello, and E. P. Naburgh: Appl. Phys. Lett. 86, 221921 (2005)
8. S. R. Ovshinsky: Phys. Rev. Lett. 21, 1450 (1068)
9. J. Feinleib, J. deNeufvills, S. C. Moss and S. R. Ovshinsky: Appl. Phys Lett. 18, 254 (1971)
10. Noritake Oomachi, Sumio Ashid, Naomasa Nakamura, Keiichiro Yusu and Katsutaro Ichihara: Jpn. J. Appl. Phys. 41,1695(2002)
11.Herman J. et al.Jpn. J. Appl. Phys. 40,1952(2001)
12. Erwin R. Meinders and Martijn H. R. Lankhorst : Jpn. J. Appl. Phys. 42,809(2003)
13. H. Kleine, F. Matin, M. Kapeller, B. Cord, and H. Ebinger : Adv. in Solid State Phys. 43, 849 (2003)
14. L.van Pieterson et al. J. Appl. Phys. 97,083520(2005)
15. Tuung Luoh, Jong-shing Bow, Alex Peng, Song-Ywu Tsai and Mei-Rurng Tseng: Jpn. J. Appl. Phys. 38,1698(1999)
16. G. Binning, C. F. Quate, Ch. Gerber, Phys. Rev. Lett, 56, 930 (1986).
17 J.W. Hong. Rev. Sci. Instr. 70,1735 (1999).
18. M. Nonnenmacher, M. P. O'Boyle, and H. K. Wickramasinghe, Appl. Phys. Lett, 58, 2921(1991).
19. C. M. Mate, G. M. McClelland, R. Erlandsson, and S. Chiang, Phys. Revi. Lett., 59, 1942 (1987).
20. 林正偉 碩士論文 “掃描探針顯微技術在光儲存記錄點上之研究” (2003)
21. 劉宏威 碩士論文 “相變化記錄層與奈米近場光學多層膜結構之光熱反應研究”(2005)
22. N. Yamada, M. Otaoba, K. Kawahara, N. Miyagawa, H. Ohta, N. Akahira and T. Matsunaga, Jpn. J. Appl. Phys. 37, 2104 (1998)
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