[1]S. G. Mallat, “A Theory for Multiresolution Signal Decomposition:The Wavelet Representation,” IEEE Trans. on Pattern Analysis and Machine Intelligence, Vo1. 11, No. 7, pp. 674-693, 1989.
[2]D. Androutsos, K. N. Plataniotis and A. N. Venetsanopoulos, “Extraction of detailed image regions for content-based imsge retrieval,” Acoustics, Speech and Signal Processing, Vol. 6, pp. 3713-3716, 1998.
[3]A. V. Nevel, “Texture classification using wavelet frame decomposit- ions,” Signal System and Computers, Vol. 1, pp. 311-314, 1997.
[4]N. D. Kim, L. Booth, V. Amin, J. Lim and S. Udpa,“Ultrasonic image processing for tendon injury evaluation,” Proceedings of the IEEE-SP International Symposium on Time-Frequency and Time-Scale Analysis, pp. 241-244, 1998.
[5]C. S. Lee, C. H. Choi, J. Y. Choi and S. H. Choi, “Surface defect inspection of cold rolled strips with features based on adaptive wavelet packets,” IEICE Transactions on Information and Systems , Vol. E80-D, No.5, pp. 594-604, 1997.
[6]A. L. Ahmet, A. Ertuzun and A. Ercil, “Texture defect detection using subb and domain co-occurrence matrices,” Image Analysis and Interpretation, Vol. 1, pp. 205-210, 1998.
[7]H. Sari-Sarraf, and S. J. James, “Robust defect segmentation in woven fsbrics,” Proceedings of the 1998 IEEE Computer Society Conference on Computer Vision and Pattern Recognition, pp. 938-944, 1998.
[8]蔣政輝,「應用小波轉換於自動表面瑕疵檢測與圖形比對的應用」,元智大學,碩士論文,民國89年。[9]蕭缽,「應用小波轉換於表面瑕疵檢測」,元智大學,碩士論文,民國88年。
[10]O. Laligant, F. Truchetet and E. Fauvet, “Wavelets transform in artificial vision inspection of threading,” Industrial Electronics, Control, and Instrumentation, Proceedings of the IECON, Vol. 1, pp. 513-518, 1993.
[11]K. Hwang, S. Mandayam, S. S. Udpa and W. Lord, “Application of wacwlwt basis function neural networks for NDE,” Midwest Symposium on Circuits & Systems. Part 3 (of 3), Vol. 3, pp. 1420-1423, 1996.
[12]Hawthorne. J., “Electro-optics technology test flat-panel displays,”
Automated Testing, May, pp. 271-276, 2000.
[13]Kido. T., “In-process inspection technique for active-matrix LCD panels,” International Test Conference, pp. 795-799, 1992.
[14]Kido. T., “In-process functional inspection technique for TFT-LCD array,” Journal of SID, Vol. 1, No. 4, pp. 429-435, 1993.
[15]Kido. T., “Optical charge-sensing method for testing and characterizing thin-film transistor array,” IEEE Journal of Selected Topics in Quantum Electronics, Vol. 1, No. 4, pp. 993-1001, 1995.
[16]Nakashima K., “Hybrid inspection system for LCD color filter panels,” Tenth International Conference on Instrumentation and Measurement Technology, Hamamatsu, pp. 689-692, 1994.
[17]Shimizu, M, A. Ishii, T. Nishimura, “Detection of foreign material included in LCD panels,” 26th Annual Conference of the IEEE: Industrial Electronica Society, Vol. 2, pp. 22-28, 2000.
[18]Zhu, X, W. K. Choi and S. T. Wu, “A simple method for measuring the cell gap of a Reflective twisted nematic LCD,” IEEE Transations on Electron Devices, Vol. 11, pp. 2086-2093, 2002.
[19]Chen P., S. H. Chen and F. C. Su, “An effective method for evaluating the image-sticking effect of TFT-LCDs by interpretative modeling of optical measurement,” Liquid Crystals, Vol. 27, No. 7, pp. 965-975, 2000.
[20]Kim, J. H., S. Ahn., J. W. Jeon, and J. E. Byun, “A high-speed high-resolution vision system for the inspection of TFT LCD, ” IEEE Inyernational Symposium on Industrial Electronics, Vol. 1, pp. 12-16.
[21]陳志忠,「液晶顯示器的像素點缺陷與亮度均一性之自動化檢測」,中原大學,碩士論文,民國90年。[22]錢志豪,「建構液晶顯示器(LCD)色彩偏差瑕疵之自動化視覺檢測系統之探討」,朝陽科技大學,碩士論文,民國91年。[23]曾彥馨,「應用機器視覺於TFT面板之表面瑕疵檢測與分類」,元智大學,碩士論文,民國92年。[24]洪崇祐,「應用一維傅立葉分析於TFT-LCD液晶顯示面板之瑕疵檢測」,元智大學,碩士論文,民國93年。[25]Tsai, D. M. and C. Y. Hsieh, “Automated surface inspection for directional textures,” Image and Vision Computing, Vol. 18, pp. 49-62, 1999.
[26]Chan, Y. C., K. C. Huang and X. Dai, “Nondestructive defect detection in multiplayer ceramic capacitors using an improved digital speckle correlation method with wavelet packet noise reduction processing,” IEEE Trans. Packaging and Manufacturing Technology, Vol. 46, pp. 80-87, 2000.
[27]Erturk, S. and T. J. Dennis, “Image sequence stabilization based on DFT filtering,” IEE Proc.-Vis. Image Signal Process, Vol. 147, pp. 95-102, 2000.
[28]Park, C. H. and H. Park, “Fingerprint classification using fast fourier transform and nonlinear discriminant analysis,” Pattern Recognition, Vol. 38, pp. 495-503, 2005.
[29]Q. Zheng, R. Chellappa, “A computational vision approach to image registration,” IAPR International Conference on Pattern Recognition, Vol. 1, pp. 193-197, 1992.
[30]Wang, J. and A. K. Asundi, “A computer vision for wineglass defect inspection via Gabor-filter-based texture,” Information Sciences, Vol. 127, pp. 157-171, 2000.
[31]Chan, C. H. and K. H. Pang, “Fabric defect detection by Fourier analysis,” IEEE Trans. on Industry Application, Vol. 36, pp. 1267-1276, 2000.
[32]Amet, A. L., A. Ertuzun and A. Ercil,“Texture defect detection using subband domain co-occurrence,”Proceedings of the IEEE Southwest Symposium on Image Anaalysis and Interpretation, pp. 205-210. 1998.
[33]Chan, C. H. and K. H. Pang, “abric defect detection by Fourier analysis,”IEEE Trans. on Industry Application, Vol. 36, pp. 1267-1276, 2000.
[34]A. Bruce and H. Y. Gao, Applied Wavelet Analysis with S-PLUD, New York; Springer-Verlag, 1996.
[35]T. C. Hsung, P. K. Lun, and W. C. Siu, “A deblocking technique for lock-transform compressed image using wavelet transform modulus maxima,” IEEE Transactions on Image Processing, Vol. 7, No. 10, pp. 1488-1496, 1998.
[36]B. B. Chai, J. Vass, and X. Zhuang, “Significance-linked connected component analysis for wavelet image coding,” IEEE Transactions on Image Processing, Vol. 8, No. 6, pp. 774-784, 1999.
[37]T. C. Hsung, C. L. Chan, P. K. Lun, and D. Feng, “Embedded singularity detection zerotree wavelet coding,” International Conference on Image Processing Proceeding, Vol. 2, pp. 274-278, 1999.
[38]D. Wajcer, D. Stanhill, and Y. Y. Zeevi, “Two dimensional multiwavelets with vanishing moments for image coding,” Mediterranean Electiotechnical Conference, Vol. 1, pp. 72-76, 1998.
[39]S. D. Servetto, K. Ramchandran, and M. T. Orchard, “Image coding based on morphology representation of wavelet data,” IEEE Transactions on Image Processing, Vol. 8, No. p, pp. 1161-1174, 1999.
[40]A. Liew and D. T. Neuyen, “Uniqueness issue of wavelet transform modulus maxima repreaentation and a least squares reconstruction algorithm,” Electron, Vol. 20, pp. 1735-1736, 1995.
[41]S. G. Mallat, “A Theory for Multiresolution Signal Decomposition︰The Wavelet Representation,” IEEE Trans. on Pattern Analysis and Machine Intelligence, Vol. 11, No.7, pp. 674-693, 1989.
[42]Matlab, Wavelet Toolbox User’s Guide, Mathworks Inc, 2004.
[43]郭晶,孫傳娟,小波分析理論與MATLAB7實現,電子工業出版社,北京,民國94年。
[44]缪紹綱,數位影像處理-活用Matlab,全華科技圖書股份有限公司,4-42~4-53頁,台北,民國94年。
[45]楊建國,小波分析及其工程應用,機械工業出版社,北京,2005.6.
[46]S. Mallat, “Multifrequency channel decompositions of image and wavelet models,”Acoustic Speech and Signal Processing, Vol. 37, pp.
2091-2110, 1989.