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研究生:陳正鴻
研究生(外文):CHEN CHENG HUNG
論文名稱:TFTPanel亮度品質偵測系統
論文名稱(外文):Brightness Quality Tracing System Testing TFT Panels
指導教授:唐經洲
學位類別:碩士
校院名稱:南台科技大學
系所名稱:電子工程系
學門:工程學門
學類:電資工程學類
論文種類:學術論文
論文出版年:2007
畢業學年度:95
語文別:中文
論文頁數:50
中文關鍵詞:液晶顯示器亮度品質測試訊號產生器
外文關鍵詞:LCDBrightness QualityTPG
相關次數:
  • 被引用被引用:0
  • 點閱點閱:195
  • 評分評分:
  • 下載下載:0
  • 收藏至我的研究室書目清單書目收藏:0
在TFT-LCD技術進步發展迅速的時代,產品的品質改進就越來越受到注意,基本上在液晶顯示,亮光的各種質量檢查,包括了均一性、響應時間、對比度、可視角度、亮度等等,然一般液晶顯示器也跟其他產品一樣,會隨時因為各種原因而出現故障,那如何快速知道產品好壞,一般都是藉由老化試驗,讓液晶螢幕進行超負荷的工作,使缺陷在短時間出現,然一般TFT-Panel 廠對於老化試驗僅在高溫爐中做長期熱量老化(LTTA)對於液晶螢幕亮度的瞬間變分析在老化試驗過程中常被忽略,總之 老化機器不提供監測顏色或亮光瞬間的功能,因此液晶面板失敗的機制無法被監測和回饋進而改進檢測過程。
本研究中,我們提出亮光追蹤系統為TFT-LCD Panel 測試,我們除了設計一個測樣本號產生器 (Test Pattern Generator, TPG) 來發展可以具體引起壓力測試的 Pattern,並使用高感度的感測元件去作電壓/電流/亮度偵測,利用微處理器的內建12位元高精準ADC 擷取亮度感測元件所產生的電壓值,最後將這些數位訊號利用RS232 界面傳輸將當前被抽樣資料,利用電腦將這些即時資料存放到一個資料列表中,以進一步分析。讓可靠度分析工程師能即時發現動態的缺陷,也可以利用歷史資料來做改進出產品品質的監控。
With the rapid development on the technology of TFT-LCD these years, the quality improvement of products is increasingly demanded. Basically, various inspection about brightness including uniformity, gray scale, gamma…etc, are carried out before shipment. However the transient analysis on the variation of brightness during the long term thermal aging (LTTA) process is ignored. Because the quality is always inspected by human eyes instead of machine. Besides, the aging machine does not provide the functionality of monitoring the color or brightness transient. Thus the failure mechanism can not be captured and feedback to improve the process for yield.
In this paper, we propose a brightness quality tracing system for TFT-LCD testing. A test pattern generator based on uC+CPLD is developed to generate specific test patterns. The luminance, voltage, and current data are sampled with respect to the test patterns. These real time data are stored and sent to a PC for further analysis. Either the operators or reliability analysis engineers can inspect the quality from the waveform on the GUI or database respectively.
目次
摘要
Abstract
致謝
目次
表目錄
1 序論
1.1 研究背景
1.2 文獻回顧
1.3 本文架構
2 TFT Panel的製程概觀
2.1 液晶螢幕的結構
2.2 液晶導通方式
3 TFT LCD瑕疵檢測方法
3.1 液晶螢幕瑕疵檢測
3.2 亮度均勻檢測
3.3 減少液晶螢幕閃爍
3.5 響應時間
4 系統架構與實現
4.1 系統架構
4.2 測試訊號產生器
4.3 感測系統
4.4 電腦介面
5 實驗結果與分析
5.1 實驗結果
6 結論及未來發展方向
6.1 結論
6.2 未來發展方向

2
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