[1]Chu C. L. and Fan S. H., “A novel long-travel piezoelectric-driven linear nanopositioning stage,” Precis. Eng., Vol. 30, 2006, pp. 85-95.
[2]“ZMI 4000 Series Measurement Board Operation Manual (OMP-0460L),” Zygo Corporation, 2004.
[3]Bobroff N., “Recent advances in displacement measuring interferometry,” Meas. Sci. Technol., Vol. 4, 1993, pp. 907-926.
[4]Dobosz M., “Application of a divergent laser beam in a grating interferometer for high-resolution displacement measurements,” Opt. Eng., Vol. 33, No. 3, 1994, pp. 897-901.
[5]Lin J. D., Kuo H. B., “Development of a new optical scale system by the diffractive phase interference method,” Meas. Sci. Technol., Vol. 6, 1995, pp. 293-296.
[6]Heilmann R. K., Chen C. G., Konkola P. T., Schattenburg M. L., “Dimensional metrology for nanometre-scale science and engineering: towards sub-nanometre accurate encoders,” Nanotechnology, Vol. 15, 2004, pp. S504-S511.
[7]Fan K. C., Liu Y. S., Chen Y. J., Cheng F., “A linear diffraction grating interferometer with high accuracy,” Proc. of SPIE, Vol. 6280, No. 628008, 2006, pp. 1-6.
[8]Sawada R., Higurashi E., Ito T., Ohguchi O., Tsubamoto M., “Monolithic-integrated microlaser encoder,” Appl. Opt., Vol. 38, No. 33, 1999, pp. 6866-6872.
[9]Higurashi E., Sawada R., “Micro-encoder based on higher-order diffracted light interference,” J. Micromech. Microeng., Vol. 15, 2005, pp. 1459-1465.
[10]Dobosz M., “New style probe with interferometric transducer for surface roughness and form profiling,” Opt. Eng., Vol. 33, No. 3, 1994, pp. 902-907.
[11]蘇宗德,超精密繞射干涉接觸式探頭及系統之研製,國立台灣大學機械工程學研究所碩士論文,1999。[12]BS78 Laserscale™, SONY Precision Technology Inc.
[13]Fan K. C., Su C. D., Mou J. I., “Error analysis for a diffraction grating interferometric stylus probing system,” Meas. Sci. Technol., Vol. 12, 2001, pp. 482-490.
[14]Heydemann P. L. M., “Determination and correction of quadrature correction of fringe measurement errors in interferometers,” Appl. Opt., Vol. 20, No. 19, 1981, pp. 3382-3384.
[15]Yacoot A., Cross N., “Measurement of picometre non-linearity in an optical grating encoder using x-ray interferometry,” Meas. Sci. Technol., Vol. 14, 2003, pp. 148-152.
[16]Huang Y., Menq C. H., “Design and development of a large range linear encoder with subnanometer resolution,” Rev. Sci. Instrum., Vol. 77, No. 105104, 2006, pp. 1-11.
[17]Aketagawa M., Takada K., Rerkkumsup P., Togawa Y., Honda H., “Real-time atomic encoder using scanning tunneling microscope and regular crystalline surface,”Meas. Sci. Technol., Vol. 17, 2006, pp. 513-518.
[18]Benschop J., Rosmalen G. V., “Confocal compact scanning optical microscope based on compact disc technology,” Applied Optics, Vol. 30, No. 10, 1991, pp. 1179-1184.
[19]Quercioli F., Mannoni A., Tiribilli B., “Correlation optical velocimetry with a compact disk pickup,” Applied Optics, Vol. 36, No. 25, 1997, pp. 6372-6375.
[20]Zhang J. H., Cai L. L., “An autofocusing measurement system with a piezoelectric translator,” IEEE/ASME Transactions on Mechatronics, Vol. 2, No. 3, 1997, pp. 213-216.
[21]Fan K. C., Chu C. L., Mou J. I., “Development of a low-cost autofocusing probe for profile measurement,” Measurement Science and Technology, Vol. 12, 2001, pp. 2137-2146.
[22]Chu C. L., Fan K. C., Chen Y. J., “A compensation method for the hysteresis error of DVD VCM,” Measurement Science and Technology, Vol. 15, 2004, pp. 734-740.
[23]Sony semiconductor product list 2003, Sony Co., Photo Device KHM-310AAA 2003.
[24]藍啟峰,以FPGA 發展電子細分割及其於光柵干涉儀之應用,國立台灣大學機械工程研究所碩士論文,2001。
[25]傅毓芬,實用性相位信號編碼與解碼技術的研究,師大書苑,1997。
[26]蔣向前,曲面表面形貌檢測理論與方法的研究,華中理工大學博士論文, 1995。
[27]Li T., Fang Z., Wang M., “Small displacement measurement by using feed-back laser interferometer and computer subdivision,” Acta Metallurgica Sinica, Vol. 16, No. 3, 1995, pp. 196-199.
[28]Cui J., Li H., Chen Q., “New digital subdividing and rester-sensing technique for Moire fringe of grating,” Optical Technique, Vol. 26, No. 4, 2000, pp. 194-296.
[29]林勤喻,超精密雷射聚焦探頭之研製,國立台灣大學機械工程學研究所碩士論文,1998。[30]Firester A. H., Heller M. E., Sheng P., “Knife-edge scanning measurements of subwavelength focused light beams,” Appl. Opt., Vol. 16 , 1977, pp. 1971-4.