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[1] F. Hunsinger, S. Francois, and A. Jerraya, “Definition of a systematic method for the generation of software test programs allowing the functional verification of system on chip (soc),” in Proceedings of the Fourth International Workshop on Microprocessor Test and Verification Common Challenges and Solutions, 2003. [2] S. Ezer and S. Johnson, “Smart diagnostics for configurable procesor verification,” in ACM/IEEE Design Automation Conference, June 2005, pp. 13–17. [3] J. Bergeron, Writing Testbenches: Functional Verification of HDL Models. Kluwer Academic, January 2000. [4] Verification Advisor: The Specman Elite. Verisity Design. [5] VERA - Testbench Automation for Functional Verification. Synopsis. [6] TransEDA, “Vn-cover.” [7] A. Gluska, “Practical methods in coverage-oriented verification of the merom microprocessor,” in Proc. 43rd ACM/IEEE Design Automation Conference, 24–28 July 2006, pp. 332–337. [8] Geun-young, J. Ju-sung, P. Hyun-woo, J. Byung-woo, and Y. M. jin Lee, “Arm7 compatible 32-bit risc processor design and verification,” in Russian-Korean inernational Symposium,, July 2005, pp. 607–610. [9] A. A. Mir, S. Balakrishnan, and S. Tahar, “Modeling and verification of embedded systems using cadence smv,” in Electrical and Computer Engineering, 2000, pp. 179–183. [10] S. Vasudvan, V. Viswanath, and J. A. Abraham, “Efficient microprocessor verification using antecedent conditioned slicing,” in 20th International Conference on VLSI Design, 2007. [11] L. Bening and H. Foster, Principles Of Verifiable RTL Design Second Edition. Kluwer Acdemic, 2002. [12] C.-H. Lee, H.-M. Yang, S.-H. Kwak, and M.-K. Lee, “Efficient random vector verification method for an embedded 32bit risc core,” in Proceedings Of The Second IEEE Asia Pacific Conference on ASIC, 2000. [13] A. Chandra, V. Iyengar, D. Jameson, and R. Jawalekar, “Avpgena test generator for architecture verificaton,” in IEEE Transactions On Very Large Scale Integration Systems, June 1995. [14] A. Aharon, D. Goodman, M. Levinger, and Y. Lichtenstein, “Test program generation for functional verification of powerpc processors in ibm,” in ACM/IEEE Design Automation Conference, 1995. [15] L. Fournier, Y. Arbetman, and M. Levinger, “Functional verification methodology for microprocessors using the genesys test-program generator application to the x86 microprocessors family,” in Design Automation And Test In Europe, 1999. [16] A. Adir, E. Almog, and L. Fournier, “Genesys-pro: Innovations in test program generation for functional processor verification,” in IEEE Design & Test of Computers, 2004, pp. 84–93. [17] P. Grun, A. Halambi, A. Khare, V. Ganesh, N. Dutt, and A. Nicolau, “Expression: An adl for system level design exploration,” in Department Of Information And Computer Science University Of California, Irvine, Sept 1998. [18] P. Mishra and N. Dutt, “Functional coverage driven test generation for validation of pipelined processors,” in Proceedings Of The Design, Automation And Test In Europe, 2005. [19] H.-M. Koo, H.-M. Koo, P. Mishra, J. Bhadra, and M. Abadir, “Directed microarchitectural test generation for an industrial processor: A case study,” in Proc. Seventh International Workshop on Microprocessor Test and Verification MTV ’06, P. Mishra, Ed., 2006, pp. 33–36. [20] F. I. Haque, K. A. Khan, and J. Michelson, THE ART OF VERIFICATION WITH VERA. VERIFICATION CENTER, 2001. [21] ARM7TDMI Data Sheet, Advanced RISC Machines Ltd, 1995. [22] ARM, AMBA Specification (Rev 2.0) ARM IHI0011A, May 1999. [23] C.-C. Hu, “Design and implementation of an arm10-like microprocessor,” Master’s thesis, National Sun Yat-sen University, april 2008. [24] S. S. Wang, Logic Synthesis with Design Compiler Training Manual, july-2005.
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