|
[1] N. Yazdi and K. Najafi, “An interface IC for a capacitive micro-g accelerometer,” IEEE int Solid-State Circuits Conf. Digest of Technical Papers, pp. 132-133, 1999. [2] A. Selvakumar and K. Najafi, “A high-sensitivity z-axis capacitive silicon accelerometer with a torsional suspension,” J. of Microelectromechanical Systems, vol. 7, no. 2, pp. 192-200, June, 1998. [3] M. Lemkin, M. Ortiz, N. Wongkomet, B. Boser, J. Smith, “A 3-axis surface micromachined delta-sigma accelerometer,” IEEE Int. Solid-State Circuits Conf. Digest of Technical Papers, pp. 202-203, 1997. [4] G. Zhang, H. Xie, L.E. de Rosset, and G.K. Fedder, “A lateral capacitive CMOS accelerometer with structural curl compensation,” Tech. Digest 12th IEEE Int. Conf. Micro Electro Mechanical System (MEMS ’99), pp. 606-611, Orlando, FL, 1999. [5] H. Xie and G.K. Fedder, “A CMOS z-axis capacitive accelerometer with comb-finger sensing,” Tech. Digest 13th IEEE Int. Conf. Micro Electro Mechanical System (MEMS ’2000), Miyazaki, Japan, 2000. [6] C. Burrer, J. Esteve, E. Lora-Tamayo, “Resonant silicon accelerometers in bulk micromachining technology – an approach,” J. of Microelectromechanical Systems, vol. 5, no. 2, pp. 122-130, June, 1996. [7] C. Yeh and K. Najafi, “CMOS interface circuitry for a low-voltage micromachined tunneling accelerometer,” J. of Microelectromechanical Systems, vol. 7, no. 1, pp. 6-15, March, 1998. [8] Jengfeng Wu, Sensing and control electronics for low-mass low-capacitance MEMS accelerometers, Ph.D. Thesis, Dept of Electrical and Computer Engineering, Carnegie Mellon University, 2002.
[9] G.K. Fedder, Simulation of microelectromechanical systems, Ph.D. Thesis, University of California, Berkeley, 1994. [10] T. Smith et al., “A 15-bit electromechanical sigma-delta converter for acceleration measurements,” IEEE Int. Solid-State Circuits conf. Digest of Technical Papers, pp. 160-161, 1994. [11] Motorola, XMMAAS40G10D micromachined accelerometer data sheet, Phoenix, AZ, USA. [12] C.T.-C. Nguyen, L.P.B. Katehi, and G.M. Rebeiz, Proc. IEEE, vol. 86,no8,p1756-1768,Aug 1998
|