[1]A. Hadid, M. Pietikainen, and T. Ahonen, “A Discriminative Feature Space for Detecting and Recognizing Faces,” Proc. IEEE Computer Society Conference on Computer Vision and Pattern Recognition, vol. 2, pp.797-804, June 2004.
[2]T. Ahonen, A. Hadid, and M. Pietikainen, “Face Recognition with Local Binary Patterns,” Proc. 8th European Conference on Computer Vision, pp. 469-481, 2004.
[3]T. Ahonen, A. Hadid, and M. Pietikainen, “Face Description with Local Binary Patterns: Application to Face Recognition,” IEEE Trans. Pattern Analysis and Machine Intelligence, vol. 28, issue 12, 2037-2041, Dec. 2006.
[4]M. Laiho, O. Lahdenoja, and A. Paasio, “Dedicated Hardware for Parallel Extraction of Local Binary Pattern Feature Vectors,” 9th IEEE International Workshop on Cellular Neural Networks and Their Applications, pp.27-30, May 2005.
[5]O. Lahdenoja, J. Maunu, M. Laiho, and A. Paasio, “A Massively Parallel Algorithm for Local Binary Pattern Based Face Recognition,” Proc. IEEE International Symposium on Circuits and Systems, pp. 3730-3733, May. 2006
[6]M. Petrou and P. G. Sevilla, Image Processing Dealing with Texture, John Wiley & Sons, 2006.
[7]M. Sonka, V. Hlavac, and R. Boyle, Image Processing, Analysis, and Machine Vision, Cengage-Learning, 2008.
[8]C.H. Chen, L.F. Pau, P.S.P. Wang, The Handbook of Pattern Recognition and Computer Vision, World Scientific Publishing, 1998.
[9]R. Sutton and E. L. Hall, “Texture Measures for Automatic Classification of Pulmonary Disease,” IEEE Trans. Computers, vol. C-21, pp. 667-676, July 1972.
[10]H. Harms, U. Gunzer, and H. M. Aus, “Combined Local Color and Texture Analysis of Stained Cells,” Computer Vision, Graphics, and Image Processing, vol. 33, pp.364-376, Mar. 1986.
[11]賴鼎宇,“使用嵌入式Linux發展電腦視覺系統之研究”, 義守大學資訊工程研究所碩士論文,民國95年1月[12]P. Dewaele, P.V. Gool, and A. Oosterlinck, “Texture Inspection with Self-Adaptive Convolution Filters,” Proc. 9th International Conference on Pattern Recognition, vol.1, pp. 56-60, Nov. 1988.
[13]D. Chetverikov, “Detecting Defects in Texture,” Proc. 9th International Conference on Pattern Recognition, vol.1, pp. 61-63, Nov. 1988.
[14]R.W. Conners, C.W. McMillin, K. Lin, and R. E. Vasquez-Espinosa, “Identifying and Locating Surface Defects in Wood: Part of an Automated Lumber Processing System,” IEEE Trans. Pattern Analysis and Machine Intelligence, PAMI-5(6), pp. 573-583, 1983.
[15]R.M. Haralick, “Statistical and Structural Approaches to Texture,” Proc. IEEE, vol.67, issue 5, pp.786-804, May 1979.
[16]L. Kirvida and G. Johnson, “Automatic interpretation of ERTS data for forest management,” NASA Goddard Space Flight Center Symposium. on Significant Results, ERTS-1, Vol. 1, Sect. A and B, pp. 1075-1082, 1973
[17]T. Ojala, M. Pietikainen, and T. Maenpaa, “Multiresolution Gray-Scale and Rotation Invariant Texture Classification with Local Binary Patterns,” IEEE Trans. Pattern Analysis and Machine Intelligence, vol. 24, issue 7, pp. 971-987, July 2002.
[18]林清山,心理與教育統計學, pp.277-309,東華書局,1992
[19]Integrated Silicon Solution, Inc., “IS63LV1024 IS63LV1024L 128K x 8 High-speed CMOS SRAM ”, http://www.issi.com/index.html
[20]http://www.ee.oulu.fi/mvg/page/downloads
[21]Centers for Disease Control and Prevention, http://www.cdc.gov/
[22]F. Tajeripour, E. Kabir, and A. Sheikhi, “Fabric Detection Using Modified Local Binary Patterns,” EURASIP Journal Advances in Signal Processing, vol. 2008, Article ID 783898, 12 pages.