|
Chapter 1 [1] S. Nakamura, M. Senoh, S. Nagahama, N. Iwasa,T.Yamada, T. Matsushita, Y.Sugimoto, and H. Kiyoku: Jpn. J.Appl. Phys., 36, L1059 (1997). [2] H. Hirayama, Y. Enomoto, A. Kinoshita, A. Hirata, and Y. Aoyagi: Mater. Res. Soc.Symp. Proc. 595, W11.3 (1999). [3] H. Hirayama, Y. Enomoto, A. Kinoshita, A. Hirata, and Y. Aoyagi: Phys. Status Solidi A 180, 157 (2000). [4] Y. Narukawa, Y. Kawakami, M. Funato, S. Fujita, S. Fujita, and S. Nakamura: Appl. Phys. Lett., 70, 891 (1997). [5] S. Chichibu, T. Azuhata, T. Sota, and S. Nakamura: Appl. Phys. Lett., 70, 2822 (1997). [6] H. Hirayama, Y. Enomoto, A. Kinoshita, A. Hirata, and Y. Aoyagi: Proc. 10th Int. Conf. on Metalorganic Vapor Phase Epitaxy (ICMOVPE-X), Fr-A8, Sapporo, 2000–6 (2000). [7] H. Hirayama, A. Kinoshita, T. Yamanaka, A. Hirata, and Y. Aoyagi: Mater. Res. Soc. Symp. Proc. G2.8 (2001). [8] A. Kinoshita, H. Hirayama, M. Ainoya, A. Hirata, and Y. Aoyagi: Appl. Phys. Lett., 77, 175 (2000). [9] M.A. Khan, V. Adivarahan, J.P. Zhang, C. Chen, E. Kuokatis, A. Chitnis, M. Shatalov, J.W. Yang, and G. Simin, Jpn. J. Appl. Phys. 40, L1308 (2001). [10] J. Wu, W.W. Walukiewicz, K.M. Yu, J.W. Ager III, E.E. Haller, H. Lu, W.J. Schaffer, Y. Saito, and Y. Nanishi, Appl. Phys. Lett. 80, 3967 (2002). [11] http://www.phys.ksu.edu/area/GaNgroup [12] J. Li, K.B. Nam, J.Y. Lin, and H.X. Jiang, Appl. Phys. Lett. 79, 3245 (2001). [13]Semiconductors-Basic Data, 2nd revised edition, edited by Otfried Madelung, Springer, Berlin, 1996. [14] G. Coli, K.K. Bajaj, J. Li, J.Y. Lin, and H.X. Jiang, Appl. Phys. Lett. 78, 1829 (2001) and Appl. Phys. Lett. 80, 2907 (2002). [15] H.S. Kim, R.A. Mair, J. Li, J.Y. Lin, and H.X. Jiang, Appl. Phys. Lett. 76, 1252 (2000). [16] G.D. Chen, M. Smith, J.Y. Lin, H X. Jiang, M. Asif Khan, and C.J. Sun, Apppl. Phys. Lett. 67, 1653(1995). [17] M.D. Bremser, Gallium Nitride and Related Semiconductors, edited by J.H. Edgar, S. Strite, I. Akssaki, H. Amano, and C. Wetzel, p. 147. [18] K.B. Nam, J. Li, M.L. Nakarmi, J.Y. Lin, and H.X. Jiang, Appl. Phys. Lett. 81, 1038 (2002). [19] H. J. Chang , Ph.D. Thesis, National taiwan University, Taiwan, 2007 [20] H. Morkoc, S. Sstrite, G. B. Gao, M. E. Lin, B. Sverdlov, and M. Burns, J. Appl. Phys. 76, 1363(1994). [21] S. N. Mohammad, A. A. Salvador, and H. Morkoc, Proc. IEEE 83, 1306(1995). [22] J. Li, K. B. Nam, J. Y. Lin, and H. X. Jiang, Appl. Phys. Lett. 79, 3245 (2001) [23] S. Nakamura and G. Fasol, The Blue Laser Diode, Springer, New York, 1997. [24] R. A. Mair, J. Y. Lin, H. X. Jiang, E. D. Jones, A. A. Allerman, and S. it Kurtz, Appi. Phys. Left. 76, 188 2OOO). [25] J. Han, M. H. Crawford, R. J. Shul, J. J. Figiel, M. Bansa, L. Zhang, Y. K. Song, H. Thou, and A. V. Nurmikko,Appl. Phys. Lett. 73, 1688 (1998). [26] E. Munoz, E. Monroy, J.A.Garrido, I. Izpura, F.J. Sanchez, M.A. Sanchez-Garcia, E. Calleja, B.Beaumont, and P. Gibart, App!. Phys. Lett. 71, 870 (1997); [27] E. Monroy, E. Munoz, F.J. Sanchez, F. Calle, E. Calleja, B. Beaumont, P. Gibart, J.A. Munoz and F. Cusso, Semicond. Sd. Technol. 13, 1042 (1998); [28] D. Walker, E. Munroy, P. Kung, M. Hamilton, F.J. Sanchez, J. Diaz and M. Razeghi, Appl. Phys. Lett. 74, 762 (1999). [29] B.W. Lim, Q.C. Chen, J.Y. Yang, and M. AshifKhan, Appl. Phys. Lett. 68, 3761 (1996). [30] J.D. Brown, Z. Yu, J. Matthews, S. Harney, J. Boney, J.F. Schetzina, J.D. Benson, K.W. Dang, C. Terrill, T. Nohava, W. Yang and S. Krishnankutty, MRS Internet J. Nitride Semicond. Res. 4, 9 (1999). [31] A. Osinsky, S. Gangopadhyay, B.W. Lim, M.Z. Anwar, M.A. Khan, D.V. Kuksenkov and H. Temkin, Appl. Phys. Lett. 72, 742 (1998). [32] F. G. McIntosh, K. S. Boutros, J. C. Roberts, S. M. Bedair, E. L. Piner, and N. A. El-Masty, Appl. Phys. Lett. 68, 40 (1996). [33] C. H. Chen , Ph.D. Thesis, National taiwan University, Taiwan, 2003
Chapter 2 [1] R. A. Stradling and P. C. Klipstein, in Growth and Characterisation of Semiconductors (Hilger, 1990). [2] Department of Physics National Taiwan University, Optical and Electrical Properties of Type-II GaAsSb/GaAs Multiple Quantum Wells, Tzung Te Chen. [3] Department of Institute of Optoelectronic Sciences College of Science National Taiwan Ocean University, Optical properties of II-VI compound semiconductor quantum structures, T. U. Lu.. [4] T. Akasaka, S. Ando, T. Nishida, H. Saito, and N. Kobayashi, Appl. Phys. Lett. 79, 1414 (2001). [5] B. Monemar, Phys. Rev. B 8, 1051 (1973). [6] Ian Farnan, IB Mineral Sciences Module B: Transport Properties. [7] L. Rayleigh, G. G. Stokes, Proc. Royal Soc. London 75, 199 (1905). [8] A. Smekal, Naturwiss. 11, 873 (1923). [9] G. Herzberg, “Infrared and Raman spectra of Polyatomic Molecules”, Van Nostrand, New York (1945). [10] Sir C. V. Raman, K. S. Krishnan, Ind. J. Phys. 2, 387 (1928). [11] Sir C. V. Raman, K. S. Krishnan, Nature 121, 501 (1928). [12] G. S. Landsberg, L. I. Mandelstam, Naturwiss. 16, 557 (1928). [13] G. Placzek, in Handbuck der Radiologie, ed. E. Marx, Vol. 6, part2, p. 209, Akad emische Verlagsgesellschaft, Leipzig (1934). [14] Michael J. Pelletier, Ed., “Analytical Applications of Raman Spectroscopy”, Blackwell Science: Cambridge, MA, (1999). [15] Philip Kim, Teri W. Odom, Jin-Lin Huang, and Charles M. Lieber, Physical Review Letter , 82, 6, 1225-1228 (1999). [16] Bockrath M, Cobden DH, McEuen PL, et al. Science.275, 1922(1997). [17] Derek A. Long, “The Raman Effect: A Unified Treatment of the Theory of Raman Scattering by Molecules”, Wiley, England (2002). [18] R. Saito, G. Dresselhaus, and MS Dresselhaus., Physical Review B, 61, 2981(2000). [19] A. Jorio, A. G. Souza Filho, G. Dresselhaus, M. S. Dresselhaus, A. K. Swan, M. S. Unlu, B. B. Goldberg, M. A. Pimenta, J. H. Hafner, C. M. Lieber, and R. Saito , Physical Review B , 65, 155412(2002). [20] R. Saito, A. Jorio, J. H. Hafner, C. M. Lieber, M. Hunter, T. McClure, G.Dresselhaus, and M. S. Dresselhaus, Physical Review B , 64, 085312(2001). [21] http://en.wikipedia.org/wiki/Scanning_Electron _Microscope [22] Danilatos, G,D (1988). “Foundations of environmental scanning electron microscopy” (in English). Advances in Electronics and Electron Physics 71:109- 250. Retrieved on 11/05/2007. [23] Alan C. Nelson Scanning electron microscope for visualization of wet samples. [24] http://en.wikipedia.org/wiki/Energy-dispersive_X- ray_spectroscopy [25] S.N. Mohammad and H. Morkoc, Prog. Quantum Electron. 208, 361 (1996). [26] N. Nakamura, G. Fasol, The Blue Laser Diode, Springer Veriag, Beriin, 1997. [27] M.A. Khan, M.S. Shur, Q.C. Chen and J.N. Kuznia, Electron. Lett. 30, 2175 (1994). [28] S.C. Binari, W. Kruppa, H.B. Dietrich, G. Kelner, A.E. Wickenden and A.J. Freitas Jr., Solid State Electron. 41, 1549 (1997). [29] RB. Klein, J.A. Freitas Jr., S.C. Binari and A.E. Wickenden, Appl. Phys. Lett. 75, 4016 (1999). [30] J.Z. Li, J.Y. Lin, H.X. Jiang and M. Asif Khan, Appl. Phys. Lett. 72, 2868 (1998). [31] RM. Solomon and H. Morkoc, IEEE Trans. Electron Devices ED-31, 1051 (1984). [32] J.F. Rochette, P. Delescluse, M. Lavin, D. Delagebeaudeuf, J. Chevrier and N.T. Linh, Inst.Phys. Conf. Ser. 65, 385 (1982). [33] R. Fisher, T.J. Drummond, J. Klem, W. Kopp, T.S. Henderson, D. Perrachione and H. Morkoc, IEEE Trans. Electron Devices ED-31, 1028 (1984). [34] A. Kastalsky and R.A. Kiehl, IEEE Trans. Electron Devices ED-33, 414 (1986). [35] RM. Mooney, J. Appl. Phys. 67, Rl (1990). [36] M.I. Nathan, Solid State Electron. 29, 167 (1986). [37] H.J. Stormer, R. Dingle, A.C. Gossard, W.W. Wiegmann and M.D. Sttirge, Solid State Commun. 29, 705 (1974). [38] R.A. Linke, T. Thio, J.D. Chadi and G.E. Devlin, Appl. Phys. Lett. 65, 16 (1994). [39] R.L. MacDonald, R.A. Linke, J.D. Chadi, T. Thio, G.E. Devlin and R Becla, Optics Lett. 19, 2131 (1994). [40] D.E. Theodorou, H.J. Queisser and E. Bauser, Appl. Phys. Lett. 41, 628 (1982). [41] H.X. Jiang, A. Dissanayake and J.Y. Lin, Phys. Rev. B 45, 4520 (1992). [42] M. Smith, J.Y. Lin and H.X. Jiang, Phys. Rev. B 51, 4132 (1995). [43] M. Smith, J.Y. Lin and H.X. Jiang, Phys. Rev. B 54, 1471 (1996). [44] CH. Henry and D.V. Lang, Phys. Rev. B 15, 989 (1977). [45] D.V. Lang and R.A. Logan, Phys. Rev. Lett. 39, 635 (1977). [46] D.J. Chadi and K.J. Chang, Phys. Rev. Lett. 61, 873 (1988). [47] D.V. Lang. In: S. Pantelides (Ed.), Deep Centers in Semiconductors, 2nd ed., Gordon and Breach, New York, 1992, p. 591. [48] J.M. Langer. In: F. Beleznay, G. Ferenczi, J. Giber (Eds.), New Developments in Semiconductor Physics,Springer Verlag, Berlin, 1980, p. 123. [49] D. Redfield, R.H. Bube, Photoinduced Defects in Semiconductors, Cambridge University Press, Cambridge, 1996. [50] H.J. Queisser and D.E. Theodorou, Phys. Rev. Lett. 43, 401 (1979). [51] H.J. Queisser and D.E. Theodorou, Phys. Rev. B 33, 4027 (1986). [52] H.X. Jiang and J.Y. Lin, Phys. Rev. B 40, 10025 (1989). [53] H.X. Jiang and J.Y. Lin, Phys. Rev. Lett. 64, 2547 (1990).
Chapter 3 [1] Peter Kozodoy, Monica Hansen, S. P. DenBaars and U. K. Mishra, Appl. Phys. Lett.74, 3681 (1999). [2] T. Mukai, H. Narimatsu and S. Nakamura, J. Crystal Growth 189/190, 778 (1998). [3] A. Kinoshita, H. Hirayama, M. Ainoya, A. Hirata and Y. Aoyagi, to be submitted. [4] H. Hirayama and Y. Aoyagi, Mater. Res. Soc. Proc. 537, G3.74 (1999). [5] A. Kinoshita, H. Hirayama, A. Hirata and Y. Aoyagi, International Conference onSolid State Device and Materials (SSDM), C-4-2, Tokyo (1999). [6] S. Chichibu, D. A. Cohen, M. P. Mack, A. C. Abare, P. Kozodoy, M. Minsky, S.Fleischer, S. Keller, J. E. Bowers, U. K. Mishra, L. A. Coldren, D. R. Clarke and S. P.DenBaars, Appl. Phys. Lett. 73, 496 (1998). [7] P. Chen et al., Journal of Crystal Growth 273 (2004) 74–78 [8] T. Someya, K. Hoshino, J.C. Harris, K. Tachibana, Y.Arakawa, Appl. Phys. Lett. 77 (2000) 1336. [9] T. Nishida, H. Saito, N. Kobayashi, Appl. Phys. Lett. 79 (2001) 711. [10] M. Iwaya, S. Terao, T. Sano, T. Ukai, R. Nakamura, S. Kamiyama, H. Amano, I. Akasaki, Journal of Crystal Growth 237 (2002) 951.
[11] P. Ruterana, G.D. Jores, M. Laugt, F. Omnes, E. Bellet-Amalric, Appl. Phys. Lett. 78 (2001) 344. [12] P. Vennegues, H. Lahreche, Appl. Phys. Lett. 77 (2000) 4310 [13] P. Ruterana, G. Nouet, W. Van der Stricht, I. Moerman, L. Considine, Appl. Phys. Lett. 72 (1998) 1742. [14] D. Doppalapudi, S.N. Basu, K.F. Ludwig, T.D. Moustakas, Appl. Phys. Lett. 84 (1998) 1389. [15] L. Vegard, Z. Phys. 5, 17(1921)
[16] D. Doppalapudi, S.N. Basu, T.D. Moustakas, Appl. Phys. Lett. 85 (1999) 883. [17] M.K. Behbehani, E.L. Piner, S.X. Liu, N.A. El-Masry, S.M. Bedair, Appl. Phys. Lett. 75 (1999) 2202. [18] G. Eliseev, P. Perlin, J. Lee, and M. Osinski, Appl. Phys. Lett. 71, 569 (1997). [19] N. Nepal, J. Li, M. L. Nakarmi, J. Y. Lin, and H. X. Jianga, Appl. Phys. Lett. 88, 062103(2006). [20] H. X. Jiang, L. Q. Zu, and J. Y. Lin, Phys. Rev. B 42, 7284 _1990_.2M. S. Lee and K. K. Bajaj, J. Appl. Phys. 73, 1788 (1993). [21] M. S. Lee and K. K. Bajaj, J. Appl. Phys. 73, 1788 (1993). [22] G. Coli, K. K. Bajaj, J. Li, J. Y. Lin, and H. X. Jiang, Appl. Phys. Lett. 78, 1829 (2001) [23] G. Coli, K. K. Bajaj, J. Li, J. Y. Lin, and H. X. Jiang, Appl. Phys. Lett. 80, 2907 (2002) [24] A. Bell, S. Srinivasan, C. Plumlee, H. Omiya, F. A. Ponce, J. Christen, S. Tanaka, A. Fujioka, and Y. Nakagawa, J. Appl. Phys. 95, 4670 (2004). [25] B. K. Meyer, G. Steude, A. Goldner, A. Hofmann, H. Amano, and I. Akasaki, Phys. Status Solidi 216, 187 (1999). [26] K. S. Ramaiah, Y. K. Su, S. J. Chang, B. Kerr, H. P. Liu, and I. G. Chen, Appl. Phys. Lett. 84, 3307 (2004). [27] Yukio Narukawa, Yoichi Kawakami, Shigeo Fujita, and Shuji Nakamura, Phys. Rev. B 59,10283 (1999). [28] Annamraju Kasi Viswanath, J.I. Lee, S.T. Kim, Dongho Kim, J. Crys. Growth 260, 322 (2004).
Chapter 4 [1] M. Asif Khan, A. Bhattarai, J. N. Kuznia, and D. T. Olson, Appl. Phys. Lett. 63, 1214 (1993). [2] H. Morkoc, S. Strite, G. B. Gao, M. E. Lin, B. Sverdlov, and M.Burns, J. Appl. Phys. 76, 1363 (1994). [3] S. Nakamura, M. Senoh, S. Nagahama, N. Iwasa, T. Mstsusshita, h. Kiyoko, and Y. Sugimoto, Jpn. J. Appl. Phys. 35, L74 (1996). [4] C. H. Chen and Y. F. Chen, An Shih, S. C. Lee, and H. X. Jiang, Appl. Phys. Lett. 78, 3035 (2001). [5] D. R. Hang, C. H. Chen, Y. F. Chen, H. X. Jiang, J. Appl. Phys. 90, 1887 (2001). [6] Y. Narukawa, Y. Kawakami, M. Funato, S. Fujita, and S. Nakamura, Appl. Phys. Lett. 70, 981 (1997). [7] S. Chichibu, T. Azuhata, T. Sota, and S. Nakamura, Appl. Phys. Lett. 70, 2822(1997). [8] H. C. Yang , P. F. Kao, T. Y. Lin, Y. F. Chen, K.H. Chen, L. C. Chen, and Jen-Inn Chyi, Appl. Phys. Lett. 76, 3712 (2000). [9] M. E. Aumer, S. F. LeBoeut, S. M. Bedair, M. Smith, J. Y. Lin, and H. X. Jiang, Appl. Phys. Lett. 77, 821 (2000). [10] M. A. Khan, J. W. Yang, G. Smith, R. Gaska, M. S. Shur, G. Tamulaitis, A.Zukauskas, D. J. Smith, D. Chandrasekhar, and R. Bicknell-Tassiua, Appl. Phys. Lett. 76, 1161(2000) [11] T. N. Odera. J. I.i , J.Y. Lin, and H. X. Jiang, Appl. Phys. Lett. 77, 791(2000) [12] J. Li, K. B. Nam, K. H. Kim, J.Y. Lin, and H. X. Jiang, Appl. Phys. Lett. 78, 61(2001) [13] T. Matsuoka, J. Cryst. Growth 189/190, 19(1998) [14] I-hsiu Ho, and G. B. stringfellow, Appl. Phys. Lett. 69, 2701 (1996). [15] H. Siegle, G. Kaczmarczyk, L. Filippidis, A. P. Litvinchuk,, A. Hoffmann, and C. Thomsen, Phys. Rev. B55, 7000(1997) [16] Guanghong Wei, Jian. Zi, Kaiming Zhang, and Xide Xie, Appl. Phys. Lett. 82, 4693 (1997). [17] L. H. Robins, A. J. Paul, C. A. Parker, J. C. Roberts, S. M. Bedair, E. L. Piner, and N. A. E1- Masry, MRS Internet J. Nitride Semicond. Res. 4S1, G3.22 (1999). [18] J. Wagner, A. Ramarkrishnan, H. Obloh, and M. Maier, Appl. Phys. Lett. 74, 3863 (1999). [19] M. Yoshikawa, J. Wagner, H. Obloh, M. Kunzer, and M. Maier, J. Appl. Phys. 87, 2853 (2000). [20] D. Behr, R. Niebuhr, J. Wagner, H. Obloh, K.-H. Bachem, and U. Kaufmann, Appl. Phys. Lett. 70, 363 (1997). [21] F. Demangeot, J. Groenen, J. Frandom, M. A. Renucci , O. Briot, S. Clur, and R. L. Aulombard, Appl. Phys. Lett. 72, 2674 (1998). [22] S. M. Olsthoorn, F. A. J. M. Driessen, A. P. A. M.Eijkelenboom, and L. J. Giling, J. Appl. Phys. 73, 7798 (1993). [23] H. Nashiki, I. Suemune, H. Suzuki, T. Obinata, K. Vesugi, and J. Nakahara, Appl. Phys. Lett. 70, 2350 (1997). [24] P. G. Eliseev, P. Perlin, J. Lee, and M. Osinski, Appl. Phys. Lett. 71, 569 (1997). [25] S. T. Davey, E. G. Scott, B.Wakefield, and G. J.Davies, Semicond. Sci. Technol. 3, 365 (1988). [26] C. H. Chen, L. Y. Huang, Y. F. Chen, H. X. Jiang, and J. Y. Lin, Appl. Phys. Lett. 80, 1397 (2002). [27] J. Kakalions, R A. Street, and W. B. Jackson, Phys. Revt .Lett. 59, 1037 (1987). [28] Y. F. Chen, S. F. Huang, S. W. Chen, Phys. Rev. B 44,12748 (1991). [29] A. S. Dissanayake, J. Y. Lin, and H. X. Jiang, Phys. Rev. B48, 8145 (1993). [30] H. C. Yang, T. Y. Lin, and Y.F. Chen, Appl. Phys. Lett. 78, 338 (2001). [31] C. H. Chen , Ph.D. Thesis, National taiwan University, Taiwan, 2003
[32] G. Eliseev, P. Perlin, J. Lee, and M. Osinski, Appl. Phys. Lett. 71, 569 (1997). [33] R. Bhat, M. A. Koza, K. Kasha, S. J. Allen, W. P, Hong, S. A. Schwarz, G. K. Chang, and P. Lin, J. Cryst. Growth 108, 441 (1991). [34] L. Aina, M. Mattingly, A. Fathimulla, E. A. Martin, T. Loughran, and L. Stecker, J. Cryst. Growth 93, 911 (1988). [35] H. Kamei, K. Hashizume, M. Murata, N. Kuwata, K. Ono, and K. Yoshida, J. Cryst. Gqowth 93, 329 (1988). [36] W. P. Hong, A. Chin, N. Debbar, J. Hinckley, P. K. Bhattacharya, J. Singh, and R. C. Clarke, J. Vat. Sci. Technol. B 5, 800 (1987). [37] J. E. Oh, P. K. Bhattacharya, Y. C. Chen, 0. Aina, and M. Mattingly, J. Electron. Mater. 19, 435 (1990). [38] W. E. Quinn, M. C. Tamargo, M. J. S. P. Bras& R. E. Nahory, and H. H. Farrell, J. Vat. Sci. Technol. B 10, 978 (1992). [39] D. F. Welch, G. W. Wicks, L. F. Eastman, P. Parayanthal, and F. H. Pollak, Appl. Phys. Lett. 46, 169 (1985). [40] K. S. Ramaiah, Y. K. Su, S. J. Chang, B. Kerr, H. P. Liu, and I. G. Chen, Appl. Phys. Lett. 84, 3307 (2004). [41] Yukio Narukawa, Yoichi Kawakami, Shigeo Fujita, and Shuji Nakamura, Phys. Rev. B 59,10283 (1999). [42] Annamraju Kasi Viswanath, J.I. Lee, S.T. Kim, Dongho Kim, J. Crys. Growth 260, 322 (2004).
|