臺灣博碩士論文加值系統

從1983年開始，PHILIPS與SONY兩家公司幾乎主宰了整個光學記錄的走向，但是隨著資訊量非線性的成長，使得最早的640MB CD、當前流行的4.7GB DVD、下一個世代的25GB(50GB) Blu-ray Disc三者的存儲容量不再符合需求。不過上述儲存方式所採用的記錄技術皆是在遠場光學的領域內，在遠場光學的繞射極限下，要持續提昇記錄密度的方法有三種；(1)縮小光源波長(2)提高透鏡的數值孔徑 （N.A.）(3)增加介質的折射率。在近場光學領域中，1998年10月，提出在記錄層上添加一層Sb，並在上面開一個小洞，以類似探針的作用讀出近場訊號，2000年更進一步的提出利用AgOx當作近場作用層，使得讀取訊號得以再一次匯聚導出。1998年本實驗室認為能使近場訊號導出的現象肇因於侷域性表面電漿，換句話說，這是一項運用近場光學的技術來增加記錄容量的方法。將上述的概念延伸，內文提出一個新式記錄方法─利用次波長孔洞破壞高穿透奈米結構，再利用奈米結構與光反應所產生的表面電漿具有的侷域性質，進而持續減小「有效記錄點大小」，提昇記錄密度，並且建立一套以奈米光學原理為主的光學記錄模型。
內文分為以下四個主題：
一、 利用時域有限差分法來模擬電磁與物質的交互作用與相關理論探討，且針對各類光源、介電係數模型、大型結構的平行化、及數值後處理的技術開發。
二、 利用多層薄膜的理論，計算在不同材料性質，不同幾何結構下所具有的光學特性：高穿透、高反射、高吸收。及各類材料選取的優劣分析，並討論新式方法的原理。
三、 利用模擬技術討論使用各種不同材料在記錄層與反射層時，新式記錄方式的特性、分析各類機制的影響、及設計出可增加特定近場光學訊號，並且使其能在遠場讀出的結構。
四、 找出最佳參數及追求最佳記錄的結構，並使用所探討的機制延續討論在奈米尺度下利用奈米結構對光的操控的可能性。

From 1983, two companies, PHILIPS and SONY, dominated almost the entire optical record - CD-ROM. People have developed many kinds of recording tools such as 640 MB CD, 4.7 GB DVD and 25 GB (50GB) of the Blu-ray Disc. However, information is getting non-linear growth and storage is not enough anymore. The original technology is based on the far-field optical but all of them are restricted by Rayleigh diffraction limit.

In order to break optical diffraction limit restrictions, people improve recording density in three ways: (1) shorten wavelength of light, (2)increase numerical aperture of the lens (N.A.) , and(3) increase the refractive index of medium. Therefore, this paper presents a new recording method – Use subwavelength hole to damage highly transparent nano-structure. Then, the impact of localized surface plasmon is within half wavelength of incident light. The equivalent size of recording point is narrowed and the requested space for recording point is smaller than before. I try to establish optical recording model with nano-optical principle.

There are four topics in this thesis:
I. Simulate the interaction between materials and light by using finite difference time-domain method. Then, introduce various light sources, the methods of parallel computation, and the models of the permittivity.
II. Calculate the optical properties of different materials and different geometric structures including penetrating, reflectivity and absorption rates by using multi-layer film theory. Then, compare the strengths and weakness of various types of materials. Besides, I describe the principle behind the new recording method.
III. Use three different kinds of material, amorphous Ge2Sb2Te5—amorphous Ge2Sb2Te5, amorphous Ge2Sb2Te5—Ag and crystallized Ge2Sb2Te5—Ag, in recording layer and reflective layer of the new recording methods. Then, analysis the characteristics under the above settings, impact of various mechanism including Fabry-Prot effect, localized surface plasmon, and effect of the cavity. Finally, I try to increase the signal in near field and design a readable structure in far field.
IV. Find the best parameters for different kinds of recording structure and discuss the manipulation of light by using modifications of nano-structure.

口試委員會審定書 i
誌謝 ii
中文摘要 iii
Abstract v
目錄 vii
圖目錄 x
表目錄 xiii
第1章 電磁波與物質作用的模型 1
1.1 光學量測的歷史 1
1.1.1 簡介 1
1.1.2 近場光學的發展 2
1.2 介電常數的模型 3
1.2.1 Lorentz Model 3
1.2.2 Drude Model 6
1.2.3 Lorentz-Drude Model 8
1.3 表面電漿共振(Surface Plasmon Resonance) 10
1.3.1 理論 10
1.3.2 產生SPR方法介紹 13
1.3.3 奈米結構所產生的表面電漿 14
第2章 時域有限差分法 16
2.1 FDTD在Maxwell 方程式上的使用 18
2.1.1 數學理論 18
2.1.2 第一部份：微分 18
2.1.3 第二部份：時空分割 20
2.1.4 第三部分：針對電磁波的時空分割 20
2.1.5 計算空間的配置 22
2.2 FDTD在Maxwell方程式穩定的條件 23
2.3 吸收層的設計和理論 25
2.3.1 理論 25
2.3.2 UPML的程式碼設計 29
2.4 光線的設置 30
2.4.1 一維光線的配置 30
2.4.2 光源的添置 31
2.4.3 非沿主軸的入射光 33
2.4.4 高斯光源的建置 34
2.5 FDTD在E場和D場中的轉換 35
2.5.1 Z transform 35
2.5.2 實際轉換流程 38
2.6 近場轉遠場(Near to Far Field) 40
2.7 平行化 41
2.7.1 簡介 41
2.7.2 FDTD的平行化 43
2.8 現有模擬技術的列表 44
第3章 新型光學記錄技術 46
3.1 記錄的歷史 46
3.2 現有的光學記錄技術 48
3.3 多層薄膜的計算 51
3.3.1 多層薄膜的理論計算 51
3.3.2 無記錄點的情況 55
3.4 新式光學記錄方式 57
3.4.1 新式光學記錄方式概念 57
3.4.2 模擬環境設定 59
3.4.3 記錄點大小、間距Ｖ.S.反射率變化 60
3.4.4 記錄點位移、間距Ｖ.S.反射率變化 62
3.4.5 記錄點的場圖比較 64
第4章 結論 66
第5章 參考文獻 70
第6章 附錄 73
6.1 73
6.2 73
6.3 UPML 73
6.4 Lorentz Model 74
6.5 Laplace equation 其解具有唯一性 75
第7章 特別感謝 76

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