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研究生:林家佑
研究生(外文):Chia-Yo Lin
論文名稱:具影像觀察功能之微奈米級三次元接觸式量測探頭分析與研製
論文名稱(外文):The Analysis and Fabrications of a Contact Type Measuring Probe for Micro/Nano CMM with an Observing Unit
指導教授:范光照范光照引用關係
學位類別:碩士
校院名稱:國立臺灣大學
系所名稱:機械工程學研究所
學門:工程學門
學類:機械工程學類
論文種類:學術論文
論文出版年:2008
畢業學年度:96
語文別:中文
論文頁數:147
中文關鍵詞:三次元接觸式量測探頭DVD光學讀取頭位移量測角度量測光纖探球接觸力量測二階因子實驗
外文關鍵詞:CMM contact type probeDVD pick up headdistance measuringangle measuringfiber tip ballfactorial experiment designcontact force measuring
相關次數:
  • 被引用被引用:3
  • 點閱點閱:363
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  • 收藏至我的研究室書目清單書目收藏:0
現今的工程製造量測技術,對於量測微小尺寸工件往往受限於量測探頭的性能而無法達到應有的精度水準。各國研究機構為了解決此問題,多使用價格昂貴的感測設備與製造技術。
在接觸式探頭方面,將原有的光纖探球製造程序改良,減少製造時間、提升探球尺寸的穩定性。利用懸臂桿結構作為力產生元件,由分析運算及模擬檢驗其水平方向的等剛性,並由此模型找出適合的觸發方式。在感測器方面,將已商業化的DVD光學讀取頭加以改良,提升光源穩定性。並於探頭內部置入一影像感測系統,觀察探球與工件間距,提升量測的準確度並節省量測時間。最後經由設計與組裝完成一輕量化、接觸力小之微小化接觸式量測探頭。
In the modern metrological technology, coordinate measuring machings (CMM) can’t satisfy certain precision and accuracy in micro/nano scale due to the performance of the probing systems. The probing system is the limiting factor in the downscaled CMM. Many research institutes develop the probe system with expensive instrucments as sensors and complex manufacturing processes.
To reduce the cost and fulfill these requirements, this study considers three main issues related to the development of the touch probe system: the fabrication of an appropriate touch probe with micro scale dimension and small mass; the cantilever beams structure with isotropic stiffness in the horizontal plane; and, DVD pick up heads as a high sensitivity sensors in distance and angle measuring.
Using the clean feature of an economical fiber fusion splice system, a silica fiber probe fused spherical tip with a diameter of about 270-450 µm is made. The average of the roundness of the tip balls is 0.84 µm and the average of the offset between the axle of the fiber and the center of the tip ball is 1.03 µm. The procedure is simplified and it takes less time to make a fiber tip ball with a modified fixture. 2-level factorial experiment design is applied to identify the significant factors and the optimal conditions for fabrication of a tip ball with a desired diameter.
2 tpyes of cantilever beam structures, 3-beams and 4-beams, is introduced. Connecting with the sensing plate, cantilever beam is bent when a force, caused by the interaction between the tip ball and workpiece and transmitted with the stem, is applied on the tip ball. The displacement is calculated and simulated with the bending formulas and the finite element module of CATIA respectively. Those show that the 2 tpyes are both isotropic stiffness in the XY plane. The process of the signal of DVD pick up heads, which are utilized as high sensitivity and high resolution sensors to measuring the displacement and angle of the sensing plate, is also discussed base on the model.
With these components a touch trigger probe system is developed.

Index Terms —CMM probe system, DVD pick up head, distance measuring, angle measuring, fiber tip ball
誌謝 i
中文摘要 ii
ABSTRACT iii
目錄 iv
圖目錄 vii
表目錄 xii
第一章 緒論 1
1.1 研究動機與目的 1
1.1.1 三次元座標量測儀與探頭系統 2
1.1.2 研究目標 4
1.2 文獻回顧 5
1.2.1 傳統接觸式觸發探頭 5
1.2.2 次微米、奈米探頭系統 6
1.3 研究方法與內容概要 20
第二章 DVD光學讀取頭的感測原理與應用 22
2.1 DVD光學讀取頭相關文獻回顧 22
2.2 DVD讀取頭之結構與元件功能 24
2.2.1 雷射二極體 26
2.2.2 四象限光感測器 33
2.3 DVD讀取頭之光學原理與量測應用 35
2.3.1 光學讀取頭聚焦原理 35
2.3.2 光學透鏡分析 38
2.3.3 DVD讀取頭之量測應用 41
2.3.4 DVD光學讀取頭量測性能校正 42
第三章 接觸式光纖探球製作 47
3.1 探球製作與光纖熔融相關文獻回顧 47
3.1.1 微探球之製作 48
3.1.2 微球體與微透鏡製作 49
3.1.3 光纖熔接 50
3.2 製作原理與概念之介紹 52
3.2.1 表面張力 52
3.2.2 表面張力之基本公式 53
3.3 探球燒製設備 54
3.3.1 光纖熔接機 54
3.3.2 光纖載具 56
3.3.3 光纖戴具控制器 58
3.4 光纖探球燒製實驗設計 62
3.4.1 問題的認知及陳述 63
3.4.2 因子、水準及範圍的選擇 63
3.4.3 反應變數選擇與測量 66
3.4.4 光纖探球燒製實驗步驟 68
3.5 光纖探球燒製實驗之結果與分析 69
3.5.1 初次實驗之結果與分析 69
3.5.2 最佳化參數測試 80
3.6 光纖探球燒製總結 82
第四章 位移結構設計分析與組裝 84
4.1 懸臂桿應力應變理論分析 84
4.1.1 懸臂桿軸向受力 85
4.1.2 懸臂桿之扭曲分析 85
4.1.3 懸臂桿之彎曲分析 87
4.1.4 懸臂桿微小變形量綜合分析 91
4.2 感應懸浮片結構分析 97
4.2.1 三桿式感應懸浮片 98
4.2.2 四桿式感應懸浮片 100
4.3 感應懸浮片之有限元素分析與模擬 103
4.3.1 分析之相關參數設定 104
4.3.2 模擬結果 105
4.4 感應懸浮片之組裝 113
4.5 懸浮片與觸發訊號 116
4.5.1 全位移感測器組合與觸發訊號 117
4.5.2 角度與位移感測器組合與觸發訊號 121
4.6 懸浮片結構分析總結 124
第五章 接觸式探頭性能實驗 125
5.1 探頭系統組裝 125
5.2 探頭系統預行程量測 127
5.2.1 預行程量測結果 130
5.3 探頭系統接觸力量測 132
5.3.1 接觸力量測計 133
5.3.2 接觸力量測結果 135
5.4 誤差討論 135
第六章 結論與未來展望 136
6.1 結論 136
6.2 未來展望 136
參考文獻 139
[1]Busch, T., Harlow, , R., Thomson, R L., 1998, Fundamentals of Dimensional Metrology, Delmar Publishers.
[2]Hansen HN, Carneiro K, Hitjema H and De chiffre L. Dimensional micro and nano metrology. CIRP Ann-Manuf. Technol. 2006; 55(2): 721-43.
[3]Weckenmann A, Peggs G and Hoffmann J. Probing systems for dimensional micro- and nano-metrology. Meas. Sci. Technol. 2006(3): 504-9.
[4]K. Takamasu, S. Ozawa, T. Asano, A. Suzuki, R., “Basic Concepts of Nano-CMM (Coordinate Measuring Machine with Nanometer Resolution),” Japan-China Bilateral Symp. on Advanced Manufacturing Eng., pp.155-158, 1996
[5]Schwenke H, H¨ artig F, Wendit K and W¨ aldele F 2001 Future challenges in co-ordinate metrology: addressing metrological problems for very small and very large parts IDW Conf. (Knoxville, TN)pp 1–12
[6]C. Butler, An investigation into the performance of probeson coordinate measuring machines, Ind. Metrol. 2 (1)(1991) 59–70.
[7]P.A Cauchick-Miguel, T.G. King, Factors which inuence CMM touch trigger probe performance, Int. J. Mach. Tools Manuf. 38 (4) (1998) 363–374.
[8]F. Chan et al., Some performance characteristics of a multi-axis touch trigger probe, Meas. Sci. Technol. 8 (1997) 837–848.
[9]J.V. Krejci, CMM measurement enhancement using probe compensation algorithms. SME Technical Paper MS90-09, Society of Manufacturing Engineers, 1990.
[10]J.R. Mayer, A. Ghazzar, O. Rossy, 3D characterization, modeling and compensation of the pre-travel of a kinematic touch trigger probe, Measurement 19 (2) (1996) 83–94.
[11]P. Miguel Cauchick et al., A review on methods for probe performance verication. Measurement 23 (1) (1998) 15– 33.
[12]L. Nawara, J. Sadek, Investigation of measuring heads errors inuence on the measuring accuracy of multi-coordinate machine, in: 7th Int. Conf. on Automated Inspection and Product Control Birmingham, England 1985.
[13]C. Reid, Performance characteristics of touch trigger probes. CMM News, NPL (1), Teddington, Autumn 1992.
[14]P. Roland, Johnson, et al., Dynamic error characteristics of touch trigger probes tted to coordinate measuring machines, IEEE Trans. Instrum. Meas. 47 (5) (1998) 1168–1172.
[15]Metrological feasibilities of CMM touch trigger probes part I
[16]Weckenmann, A., Peggs G. & Hoffmann J. (2006) Probing systems for dimensional micro- and nano-metrology. Measurement Science and Technology, 17, 504-509
[17]Styli and accessories, Renishaw, http://www.renishaw.com as it is in 06/2008
[18]U. Brandt, T. Kleine Besten, H. Schwenke, “Development of a Special CMM for Dimensional Metrology on Microsystem Components,” Proc. of the 2000 Annual Meeting of the ASPE, Scottsdale USA, pp. 361-364, Oct, 2000.
[19]H. Schwenke, et. al, “Opto-Tactile Sensor for 2D and 3D Measurement of Small Structures on Coordinate Measuring Machines,” Annals of the CIRP, Vol. 50, No. 1, pp. 361-364, 2001.
[20]H. Schwenke, et. al, “Future Challenges in Coordinate Metrology: Addressing Metrological Problems for Very Small and Very Large Parts,” Proc. of IDW Workshop, Knoxville, pp. 2-12, May, 2001
[21]T. Oiwa, H. Nishitani, “Three-dimensional touch probe using three fiber optical displacement sensors,” Meas. Sci. Technology, Vol. 15, pp. 84-90, 2004.
[22]T. Oiwa, T. Tanaka, “Miniaturized three-dimensional touch trigger probe using optical fibre bundle,” Meas. Sci. Technol, Vol. 16, pp. 1574-1581, 2005.
[23]Masuzawa T., Hamasaki, Y., Fujino, T., 1993, Vibroscanning method for nondestructive measurement of small holes, Annals of CIRP, 42, p. 589-592.
[24]Kim, B., Masuzawa, T., Bourina, T., 1999, The vibroscanning method for the measurement of micro-hole profiles, Measurement, 10, p. 697-705.
[25]Masuzawa, T., Kim, B.J., Bergaud, C. and Fujino, M., 1997, Twin-probe vibro-scanning method for dimensional measurement of microholes, Ann. CIRP, 46/1, p. 437-440.
[26]Takamasu, K., Chih-Che, K., Suzuki, A., Hiraki, M., Furutani, R., Ozono, S., 1997, Development of pneumatic ball probe for measuring small hole, Proc. Int. Conf. On Precision Engineering, ICPE’97 Taipei, Taiwan, 2, p. 767-771.
[27]R. Leach, et. al, “Advances in Traceable Nanometrology at the National Physical Laboratory,” Nanotechnology, Vol. 12, pp. R1-R6, 2001.
[28]G. N. Peggs, A. J. Lewis, S. Oldfield, “Design for a Compact High-Accuracy CMM,” Annals of the CIRP, Vol. 48, No. 1, pp. 417-420, 1999.
[29]A Weckenmann, G Peggs, J Hoffmann, “Probing Systems for Dimensional Micro and Nano Metrology,” Proc. of the 7th ISMTII, Huddersfield UK, 2005.
[30]F. Meli, M. Fracheboud, S. Bottinelli, M. Bieri, R. Thalmann, J-M. Breguet, R. Clavel, “High precision, low force 3D touch probe for measurements on small objects,” European Int. Topical Conf., Aachen, Germany, Extended abstract, 2003.
[31]B. Muralikrishnan, J. A. Stone, J. R. Stoup, “Fiber deflection probe for small hole metrology,” Precision Engineering, 2005.
[32]M. M. P. A. Vermenulen, et. al, “Design of a High-Precision 3D-Coordinate Measuring Machine,” Annals of the CIRP, Vol. 47, No. 1, pp. 447-450, 1998.
[33]W. O. Pril, et. al, “Development of 2D Probing System with Nanometer Resolution,” Proc. of 16th ASPE, pp. 438-442, 1997.
[34]H. Haitjema, et. al, “Development of a Silicon-Based Nanoprobe System for 3-D Measurements,” Annals of the CIRP, Vol. 50, No. 1, pp. 365-368, 2001.
[35]W. P. van Vliet, P. H. Schellekens, “Accuracy limitations of fast mechanical probing,” Annals of the CIRP, Vol. 45, No. 1, pp. 483-487, 1996.
[36]Lu. R., “Design of a nanometer capacitive probe,” Mechatronics design report, Eindhoven University, Stan Ackermans Institute, 1999.
[37]Wim P. van Vliet, Peter H. J. Schellekens, “Development of a fast mechanical probe for coordinate measuring machines,” Precision Engineering, Vol. 22, pp. 141-152, 1998.
[38]K. Takamasu, M. Fujiwara, H. Naoi, S. Ozono, “Friction Drive System for Nano-CMM,” Proc. Mechatronics 2000, pp. 565-568, 2000.
[39]K. Enami, C. C. Kuo, T. Nogami, M. Hiraki, K. Takamasu, S. Ozono, “Development of nano-Probe System Using Optical Sensing,” IMEKO-XV World Congress, pp. 189-192, 1999.
[40]K. Enami, M. Hiraki, K. Takamasu, “Nano-Probe Using Optical Sensing,” IMEKO-XVI World Congress, pp. 345-348, 2000
[41]Y. Takaya, S. Takahashi, T. Miyoshi, K. Saito, “Development of The Nano-CMM Probe based on Laser Trapping Technology,” Annals of the CIRP, Vol. 48, No. 1, pp. 421-424, 1999.
[42]Y. Takaya, H. Shimizu, S. Takahashi, T. Miyoshi, “Fundamental study on the new probe technique for the nano-CMM based on the laser trapping and Mirau interferometer,” Measurement, Vol. 25, pp. 9-18, 1999.
[43]Chu, C.-L. and C.-Y. Chiu, Development of a low-cost nanoscale touch trigger probe based on two commercial DVD pick-up heads. Measurement Science and Technology, 2007. 18(7): p. 1831-1842.
[44]Ji, H., et al. A high sensitivity optical touch trigger probe for down scaled 3D CMMs. 2006. Xinjiang, China: International Society for Optical Engineering, Bellingham WA, WA 98227-0010, United States.
[45]Ji, H., et al. Concept design of a novel tactile probe tip for down scaled 3D CMMs. 2006. Brisbane, Australia: International Society for Optical Engineering, Bellingham WA, WA 98227-0010, United States.
[46]Ji, H., et al. Calibration of wavelength shift for a fibre bragg grating using a single mode laser source. 2007. Adelaide, Australia: SPIE -International Society for Optical Engineering, Bellingham WA, WA 98227-0010, United States.
[47]D. R. Halfpenny, D. M. Kane, “Electric-arc cleaning of optical-fiber endfaces,” Journal of Applied Optics, Vol. 35, No. 22, pp. 4516-4517, 1996. United States.
[48]Armstrong, T.R. and M.P. Fitzgerald, “An Autocollimator Based on the Laser Head of a Compact Disc Player”, Measurement Science & Technology, 1992. 3(11): p. 1072-1076.
[49]Rowsell, T.D., “Remote measurement of small displacements using a CD pickup head”. Medical Engineering & Physics, 1995. 17(6): p. 459-461.
[50]Ehrmann, K., A. Ho, and K. Schindhelm, “3D optical profilometer using a compact disc reading head”. Measurement Science & Technology, 1998. 9(8): p. 1259-1265.
[51]Quercioli, F., et al., ”Monitoring of an atomic force microscope cantilever with a compact disk pickup.” Review of Scientific Instruments, 1999. 70(9): p. 3620-3624.
[52]Fan, K.C., C.Y. Lin, and L.H. Shyu, “Development of a low-cost focusing probe for profile measurement”. Measurement Science and Technology, 2000. 11(1): p. 1-7.
[53]Scuor, N., et al., “Dynamic characterization of MEMS cantilevers in liquid environment using a low-cost optical system.” Measurement Science and Technology, 2006. 17(1): p. 173-180.
[54]Quercioli, F., A. Mannoni, and B. Tiribilli, ”Correlation optical velocimetry with a compact disk pickup. Applied Optics,” 1997. 36(25): p. 6372.
[55]Zhang, J.-h. and L. Cai, “Autofocusing measurement system with a piezoelectric translator. IEEE/ASME Transactions on Mechatronics,” 1997. 2(3): p. 213-216.
[56]Fan, K.-C., et al., “Development of a high-precision straightness measuring system with DVD pick-up head.” Measurement Science and Technology, 2003. 14(1): p. 47-54.
[57]Benschop, J. and G. Vanrosmalen, “Confocal compact scanning optical microscope based on compact disc technology.” Applied Optics, 1991. 30(10): p. 1179-1184
[58]Chu, C.-L. and C.-H. Lin, “Development of an optical accelerometer with a DVD pick-up head.” Measurement Science and Technology, 2005. 16(12): p. 2498-2502.
[59]Chu, C.-L., C.-H. Lin, and K.-C. Fan. “Development of a two-dimensional optical accelerometer using a DVD pick-up head.” 2006. Xinjiang, China: International Society for Optical Engineering, Bellingham WA, WA 98227-0010, United States.
[60]林孟滸,” A Tapping-Mode Atomic Force Microscope Utilizing Optical Pickup System,” Master thesis, National Taiwan University, 2006.
[61]Chou, Shin-Yi,” Design and Development of a Micro Deformation Measurement System integrated with Atomic Force Microscope and Optical Principles and Performance Analysis,” Master thesis, National Taiwan University, 2006.
[62]SONY,”KHM-310技術資料”
[63]鄭克勇,半導體雷射及應用。光電科技資料叢書之二十四,1993。
[64]蔡孟倫,”Design and Analysis of 650 nm AlGaInP Laser Diodes for DVD Application”, National Changhua University of Education, 2004.
[65]Kocher, D.G., “Automated Foucault test for focus sensing.” Applied Optics, 1983. 22(12): p. 1887-1892.
[66]朱朝居,光電讀寫頭之光學系統模擬與測試(上下),光電資訊,第9期,1991。
[67]Saito, Y., W. Gao, and S. Kiyono. “A micro-angle sensor based on laser autocollimation.” 2005. Sappora, Japan: International Society for Optical Engineering, Bellingham WA, WA 98227-0010, United States.
[68]H. Schwenke, et. al, “Opto-Tactile Sensor for 2D and 3D Measurement of Small Structures on Coordinate Measuring Machines,” Annals of the CIRP, Vol. 50, No. 1, pp. 361-364, 2001
[69]SHEU, D.-Y. Micro-spherical probes machining by EDM. Journal of Micromechanics and Microeng., 2005;15(1): 185-189.
[70]SHEU, D.-Y. Multi-spherical probe machining by EDM: Combining WEDG technology with one-pulse electro-discharge. Journal of Materials Processing Technology, (2004) 149, 597-603.
[71]Bica, I., On the mechanisms of iron microspheres formation in argon plasma jet. Journal of Magnetism and Magnetic Materials, 2003. 257(1): p. 119-125
[72]Bica, I., Obtaining of micro-spheres in plasma: theoretical model. Materials Science and Engineering B, 2000. 77(3): p. 293-296.
[73]Bica, I., Formation of glass microspheres with rotating electrical arc. Materials Science and Engineering B, 2000. 77(2): p. 210-212.
[74]Bica, I., Iron micro-spheres generation in argon plasma jet. Materials Science and Engineering B, 2002. 88(1): p. 107-109.
[75]Veiko, V.P., et al. New method of fiber optic tool fabrication based on laser technologies. in Laser Applications Engineering (LAE-96). 1997. St. Petersburg-Pushkin, Russia: SPIE
[76]Veiko, V.P., et al. Innovative laser technologies for fiber tools fabrication. in Biomedical Optoelectronic Instrumentation. 1995. San Jose, CA, USA: SPIE.
[77]Paek, U.C. and A.L. Weaver, Formation of a spherical lens at optical fiber ends with a CO2 laser. Applied Optics, 1975. 14(2): p. 294-298
[78]Vaidya, A. and J.A. Harrington, Sculpted optical silica fiber tips for use in Nd:YAG contact tip laser surgery: part 1--fabrication techniques. Optical Engineering, 1992. 31(7): p. 1404-1409.
[79]P Y Hung,” The Study and Fabrication of Trigger Probe for Micro/Nano CM,” Master thesis, National Taiwan University, 2006.
[80]Kohanzadeh, Y., Hot splices of optical waveguide fibers. Applied Optics, 1976. 15(3): p. 793-795.
[81]Bisbee, D.L., Splicing silica fibers with an electric arc. Applied Optics, 1976. 15(3): p. 796-798
[82]I. Hatakeyama, H. Tsuchiya, “Fusion splices for optical fibers by discharge heating,” Journal of Applied Optics, Vol. 17, No. 12, pp. 1959-1964, 1978.
[83]Kato, Y., S. Seikai, and M. Tateda, Arc-fusion splicing of single-mode fibers-1. Optimum splice conditions.. Applied Optics, 1982. 21(7): p. 1332-1336.
[84]Kato, Y., S. Seikai, and M. Tateda, Arc-fusion splicing of single-mode fibers- 2. A practical splicing machine. Applied Optics, 1982. 21(11): p. 1916-1921.
[85]Kato, Y., et al., Arc-fusion splicing of single-mode fibers - 3: A highly efficient splicing technique. Applied Optics, 1984. 23(15): p. 2654-2659.
[86]Hudson JB. Surface Science: an Introduction. Stoneham: Butterworth-Heinemann; 1992.
[87]Burdon RS. Surface tension and the spreading of liquids. London: Bentley House: Cambridge University Press; 1940.
[88]Hertland S. Surface and interfacial tension: measurement, theory, and applications. New York; Basel: Marcel Dekker; 2004.
[89]http://www.furukawa.co.jp/index.htm, 2008.
[90]Hatakeyama, I. H. Tsuchiya, “Fusion splices for optical fibers by discharge heating,” Journal of Applied Optics, Vol. 17, No. 12, pp. 1959-1964, 1978.
[91]M. Tachikura, “Fusion mass-splicing for optical fibbers using electric discharges between two pairs of electrodes”, Journal of Applied Optics, Vol. 23, No. 3, pp. 492-498, 1984.
[92]http://www.furukawa.co.jp/english/what/s199_030303_e.htm, 2008.
[93]VIAS, “Stepper motors,”http://www.vias.org/feee/c13_motors_06.html, 2008.
[94]今華電子, “DC5V 0.2A 1.8精度步進馬達(14PM-M011-G1ST),” http://www.jin-hua.com.tw/webdesign/product.asp?gid=2194&id=11530
[95]劉勝德,” 成型砂輪非接觸影像量測系統,” 國立臺灣大學機械工程學研究所碩士論文, 民國八十七年七月
[96]Douglas C. Montgomery , Design and Analysis of Experiments 6th. -Wesley, 2000
[97]Plackett, R.L. and Burman, J.P., The design of optimum multifactorial experiments, Biometrika, 33(1946), 303-325.
[98]Williamson, R.L. and M.J. Miles, Melt-drawn scanning near-field optical microscopy probe profiles. Journal of Applied Physics, 1996. 80(9): p. 4804.
[99]Meli, F. and A. Kung, AFM investigation on surface damage caused by mechanical probing with small ruby spheres. Measurement Science and Technology, 2007. 18(2): p. 496-502.
[100]Kim, H., S. Cho, and S. Kang, Effect of thermal deformations of an optical pick-up base on the optical properties of DVD optical system. Microsystem Technologies, 2005. 11(8-10): p. 1065-1070.
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