(3.92.96.236) 您好!臺灣時間:2021/05/07 16:03
字體大小: 字級放大   字級縮小   預設字形  
回查詢結果

詳目顯示:::

: 
twitterline
研究生:王博玄
研究生(外文):Po-Hsuan Wang
論文名稱:多波長穆勒矩陣偏振儀於液晶盒參數之量測
論文名稱(外文):Muti-Wavelength Mueller Matrix Polarimeter for Measuring Liquid Crystal Cell Parameters
指導教授:盧聖華盧聖華引用關係
指導教授(外文):Sheng-Hua Lu
學位類別:碩士
校院名稱:逢甲大學
系所名稱:光電研究所
學門:工程學門
學類:電資工程學類
論文種類:學術論文
論文出版年:2009
畢業學年度:97
語文別:中文
論文頁數:62
中文關鍵詞:穆勒矩陣偏振術液晶顯示器多波長預傾角扭轉角液晶盒間隙值
外文關鍵詞:Twisted anglePretilt angleMueller matrix polarimetryLiquid crystal displayCell gapMuti-wavelength
相關次數:
  • 被引用被引用:4
  • 點閱點閱:296
  • 評分評分:系統版面圖檔系統版面圖檔系統版面圖檔系統版面圖檔系統版面圖檔
  • 下載下載:40
  • 收藏至我的研究室書目清單書目收藏:0
液晶盒厚度、扭轉角和預傾角等參數,對液晶顯示器的亮度、對比度及反應時間有很大的影響。實際的液晶顯示器產品不會完全符合設計值,所以必須有準確的參數量測技術來確認產品品質。由於液晶盒中,只有液晶層具有雙折特性,因此可使用偏振術量測液晶盒參數。本研究提出以多波長穆勒矩陣偏振儀量測液晶盒的特性穆勒矩陣,進而推算液晶盒的各項參數。因為使用多波長進行量測,可增加相位延遲量測範圍及測得更多的液晶盒參數。除此之外,此偏振儀可藉由自校程序避免可能的系統誤差。本研究以此方法量測三種不同型式的液晶盒,探討其量測結果,並比較與其它方法的量測偏差。
The parameters of liquid crystal displays (LCDs), such as cell gap, twisted angle, and pretilt angle, greatly affect the brightness, contrast, and respond time of LCDs. These parameters could be accurately determined by polarimetry because LC layer is the only birefringent film in a LCD. This study proposes a muti-wavelength Mueller matrix polarimeter, using the dual-rotating-retarder technique, for measuring the LCD parameters. The proposed method provides several benefits over other polarimetric and interferometric methods: the unambiguous range of phase retardation is extended, more cell parameters are derived from the recorded intensity variation, and the systematic error can be removed by a self-calibration step. Three different types of LC cells were investigated and the results are presented in this study.
目錄
誌謝 2
Abstract 3
摘要 4
表目錄 7
第一章 緒論 8
1.1 研究動機 8
1.2 研究背景與文獻探討 8
1.3 研究方法 11
第二章 多波長穆勒矩陣偏振術 13
2.1 雙旋轉相位延遲片式偏振儀 13
2.2 系統誤差移除 17
第三章 液晶盒光學特性及其穆勒矩陣表示式 21
3.1 液晶雙折特性 21
3.2 反序配向型液晶盒 22
3.3 垂直配向型液晶盒 25
3.4 扭曲向列型液晶盒 27
第四章 液晶盒參數分析計算理論 30
4.1 反序配向型液晶盒 30
4.2 垂直配向型液晶盒 35
4.3 扭轉向列型液晶盒 37
第五章 實驗與結果 39
5.1 實驗架構 39
5.2 自動化控制量測暨計算程式設計說明 41
5.1.1 控制暨讀取 42
5.1.2 計算穆勒矩陣與液晶盒參數 44
5.3 資料庫比對法 46
5.4 系統自我校正 50
5.5 液晶盒量測結果 53
5.5.1 反序配向型 53
5.5.2 垂直配向型 54
5.5.3 扭轉向列型 57
5.6 數據結果討論 58
第六章 結論與未來展望 59
參考文獻 60
參考文獻

1.張境晃, “利用低同調干涉儀量測液晶盒的斷層結構,” 台灣光電科技研討會, PE-SA1-035, 2005.
2.P. A. Flournory, R. W. McClure, and G. Wyntjes, “White light interferometric thickness gauge,” Appl. Opt. 11, 1907-1912, 1972.
3.蔡世國, “利用掃描白光干涉儀量測液晶盒間隙,” 逢甲大學, 台灣, 11-12, 2007.
4.K. H. Yang, H. Takano, “Measurements of twisted nematic cell gap cell gap by spectral and split-beam interferometric methods,” J. Appl. Phys. 67, 5-9, 1990.
5.F.Bruyneel, H. De Smet, J.Vanfleteren, and A. Van Calster, “Method for measuring the cell gap in liquid crystal displays,” Opt. Eng. 40, 259-267, 2001.
6.顧鴻壽, 光電液晶平面顯示器-技術基礎及應用, 新文京開發出版社, 424-426, 1995.
7.S. T. Tang and H. S. Kwok, “Transmissive liquid crystal cell parameters measurement by spectroscopic ellipsometry,” J. Appl. Phys. 89, 80-85, 2001.
8.J. S. Gwag, S. H. Lee, K. Y. Han, J. C. Kim and T. H. Yoon, “ Novel cell gap measurement method for a liquid crystal cell,” Jpn. J. Appl. Phys. 41, 79-82, 2002.
9.J. S. Gwag, K. H. Park, G. D. Lee, T. H. Yoon and J.C. Kim, “Simple cell gap measurement method for twisted-nematic liquid crystal cells,” Jpn. J. Appl. Phys. 43, 30-32, 2004.
10.H. L. Ong, “Cell thickness and surface pretilt angle measurements of a planar liquid crystal cell with obliquely incident light,” J. Appl. Phys.71 , 140-144, 1992.
11.J. S. Gwag, S. H. Lee, K. H. Park, W. S. Park, K.Y. Han, C. G. Jhun, T.H Yoon, J. C. Kim, D.M Song, D.M. Shin, “Simple method for measuring the high pretilt angle of nematicliquid crystals,” J. Appl. Phys. 93, 4936-4938, 2003.
12.http://www.alct.ca/
13.R. M. A. Azzam, “Photopolarimetric measurement of the Mueller matrix by Fourier analysis of a single detected signal,” Opt. Lett. 2, 148-150, 1978.
14.X. Zhu, W. K. Choi, and S. T. Wu, “A Simple Method for Measuring the Cell Gap of a Reflective Twisted Nematic LCD,” IEEE Trans. on Ele. Devices 49, 1863-1867, 2002.
15.K. Mrenori, G. Yoshiaki and S. Susumu, “A Two-Dimensional Pretilt Angle Distribution Measurement of Twisted Nematic Liquid Crystal Cells Using Stokes Parameters at Plural Wavelengths,” Jan. J. Appl. Phy. 43, 709-714 2004.
16.J. Lianhua, T. Kuniharu, O. Yukitoshi and U. Norihiro, “Multi-Wavelength Mueller Matrix Polarimeter,” Opt. Rev. 12, 281-286, 2005.
17.H. C. Wei, C. C. Tsai, L. P. Yu, T. E. Lin, C. J. Yu, M. H Liu, and C. Chou “Two-dimensional cell parameters of twisted nematic liquid crystal with an amplitude-sensitive heterodyne ellipsometer,” Appl. Opt . 48, 1628-1634, 2009.
18.R. A. Chipman, Polarimetry, in Handbook of Optics, 2nd ed. McGrow-Hill, New York, 2 Ch. 22. 1995.
19.D. B. Chenault, J. L. Pezzaniti, R. A. Chipman, Mueller matrix algorithms, Proc. SPIE, 1746, 231-246, 1992.
20.G. R. Fowles, Introduction to Modern Optics, 2nd ed., New York Holt, Rinehart and Winston, 169-175, 1975.
21.Yariv and Yeh, Optical Waves in Crystals, John Wiley and Sons, 139-143, 2003.
22.S. T. Tang and H. S. Kwok, “Characteristic parameters of liquid crystal cells and their measurements,” J. Display Technology 2, 26-31, 2006.
23.S. T. Tang and H. S. Kwok, “Mueller calculus and perfect polarization conversion modes in liquid crystal displays,” J. Appl. Phys. 89, 5288-5294, 2001.
24.http://www.axometrics.com/
25.http://refractiveindex.info/
26.S. Y. Lu, and R. A. Chipmam “Interpretation of Mueller matrices based on polar decomposition,” J. Opt. soc. Ame. 13, 1996.
27.曾國詮, "穆勒矩陣偏振儀於液晶盒參數之量測," 逢甲大學, 台灣, 20-24, 2008.
QRCODE
 
 
 
 
 
                                                                                                                                                                                                                                                                                                                                                                                                               
第一頁 上一頁 下一頁 最後一頁 top
無相關期刊
 
系統版面圖檔 系統版面圖檔