電子產品多樣化，造成了複雜的電磁雜訊環境。為使電子產品功能穩定，電磁相容 (Electromagnetic Compatibility, EMC)研究逐漸受到重視。隨著電路日益複雜，以往電磁相容解決辦法效果有限，重點也逐漸進展至IC內部。在IC時即須評估並處理電磁相容的問題，並在設計階段加以預測IC電磁干擾(Electromagnetic Interference, EMI)。本文首先根據實驗室已建立之流程與方法，量測不同程式碼下微控器的電磁相容行為，進一步的建立程式碼EMI模型，預計提出微控器之管線 (Pipeline) 行為模型，以真實預估不同程式指令的EMI行為。透過此模型，經由指令集模擬器 (Instruction Set Simulation, ISS) 產生不同指令排列組合程式的模型，並藉由量測結果分析指令排序來降低EMI，輔助處理EMI對策。

Nowadays, massively used electronic devices causes with each other are getting more and more serious. These devices, such as pacemakers, electric wheelchairs and other medical equipments can be disturbed by mobile phone, car radios, and radio stations, among others. These interferences will increase the probability of system malfunction, halt, crash, or even the damage to human body or life. Recent studies on the integrate circuit electromagnetic compatibility (IC-EMC) try to build suitable models for EMC behavior estimation before production and fabrication. Our lab has proposed an IC-EMC model to estimate the software impact of the conducted EMI behavior. The proposed model is called “instruction current model” (ICM). This model is based on ICEM and includes an modified instruction set simulator (ISS). This model can estimate different program EMI behaviors. The modified ISS can estimate micro-controller’s current behavior and ICEM can estimate the system EMI behavior.

一、 緒論 1
1.1 研究動機 1
1.2 文獻回顧 1
1.3 論文架構 2
二、 背景知識介紹 3
2.1 積體電路電磁相容量測規範 5
2.1.1 IEC 61967-1 5
2.1.2 IEC 61967-4 6
2.2 積體電路電磁相容模型 7
2.3 指令電流源模型 9
2.4 指令集模擬器 11
三、 系統架構及研究方法 12
3.1 硬體電路量測 12
3.1.1 量測規範分析：IEC61967-4 13
3.1.2 PIC12F629介紹 13
3.1.3 電路板設計 15
3.1.4 資料取得方式 17
3.1.5 電流源資料簡化方法 21
3.1.6 資料簡化後之驗證 25
3.1.7 量測設備描述 26
3.2 指令集模擬器改良 28
3.2.1 指令電流源模型 28
3.2.2 指令集模擬器結構改良設計 31
3.2.3 管線與指令集模擬器 31
3.2.4 指令電流源資料庫與指令集模擬器 36
3.3 模擬器架構 37
3.3.1 微控器運作流程 37
3.3.2 指令集模擬器程式架構 38
3.3.3 程式細部架構說明 41
3.4 模擬流程與量測系統 47
3.4.1 PIC機械碼產生方法 49
3.4.2 IC-EMC Tool & 快速傅利葉轉換(FFT) 50
四、 實驗結果 53
4.1 單一脈波與指令集模擬器模擬 53
4.2 無管線化指令集模擬器模擬結果 54
4.3 管線指令集模擬器模擬結果 55
4.4 管線化與無管線化之模擬 56
4.5 模擬與量測之數值分析 57
五、 結論 60
六、 參考文獻 61

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