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[6]IEC 62132-3, "Integrated circuits - Measurement of electromagnetic immunity, 150 kHz to 1 GHz - Part 3: Bulk Current Injection (BCI), 10 kHz to 1 GHz," International Electrotechnical Commission(IEC) 47A/670/CD, 2003.
[7]IEC 62132-4, "Integrated circuits - Measurement of electromagnetic immunity, 150 kHz to 1 GHz - Part 4: Direct RF power injection method," International Electrotechnical Commission(IEC), 2006.
[8]IEC 62132-5, "Integrated circuits - Measurement of electromagnetic immunity, 150 kHz to 1 GHz - Part 5: Workbench Faraday cage method," International Electrotechnical Commission(IEC), 2005.
[9]IEC 61967-1, "Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 1: General conditions and definitions," International Electrotechnical Commission(IEC), 2002.
[10]IEC 61967-2, "Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 2: Measurement of radiated emissions - TEM cell and wideband TEM cell method," International Electrotechnical Commission(IEC), 2005.
[11]IEC 61967-3, "Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 3: Measurement of radiated emissions - Surface scan method," International Electrotechnical Commission(IEC) 47A/674/CD, 2003.
[12]IEC 61967-4, "Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4: Measurement of conducted emissions - 1 Ω/150 Ω direct coupling method," International Electrotechnical Commission(IEC) 61967-4:2002 + A1, 2006.
[13]IEC 61967-5, "Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 5: Measurement of conducted emissions - Workbench Faraday Cage method," International Electrotechnical Commission(IEC), 2003.
[14]IEC 61967-6, "Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method," International Electrotechnical Commission(IEC) 47A/739/CDV, 2003.
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[23]S. Baffreau, F. Lafon, E. Sicard, F. De Daran, "Re-use of ICEM for immunity simulation," EMC for IC workshop, EMC Zurich 2005, Switzerland, Feb 2005.
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