臺灣博碩士論文加值系統

電子產品多樣化，造成了複雜的電磁雜訊環境。為使電子產品功能穩定，電磁相容 (Electromagnetic Compatibility, EMC)研究逐漸受到重視。隨著電路日益複雜，以往電磁相容解決辦法效果有限，重點也逐漸進展至IC內部。在IC時即須評估並處理電磁相容的問題，並在設計階段加以預測IC電磁干擾(Electromagnetic Interference, EMI)。本文首先根據實驗室已建立之流程與方法，量測不同程式碼下微控器的電磁相容行為，進一步的建立程式碼EMI模型，預計提出微控器之管線 (Pipeline) 行為模型，以真實預估不同程式指令的EMI行為。透過此模型，經由指令集模擬器 (Instruction Set Simulation, ISS) 產生不同指令排列組合程式的模型，並藉由量測結果分析指令排序來降低EMI，輔助處理EMI對策。

Nowadays, massively used electronic devices causes with each other are getting more and more serious. These devices, such as pacemakers, electric wheelchairs and other medical equipments can be disturbed by mobile phone, car radios, and radio stations, among others. These interferences will increase the probability of system malfunction, halt, crash, or even the damage to human body or life. Recent studies on the integrate circuit electromagnetic compatibility (IC-EMC) try to build suitable models for EMC behavior estimation before production and fabrication. Our lab has proposed an IC-EMC model to estimate the software impact of the conducted EMI behavior. The proposed model is called “instruction current model” (ICM). This model is based on ICEM and includes an modified instruction set simulator (ISS). This model can estimate different program EMI behaviors. The modified ISS can estimate micro-controller’s current behavior and ICEM can estimate the system EMI behavior.

一、 緒論 1
1.1 研究動機 1
1.2 文獻回顧 1
1.3 論文架構 2
二、 背景知識介紹 3
2.1 積體電路電磁相容量測規範 5
2.1.1 IEC 61967-1 5
2.1.2 IEC 61967-4 6
2.2 積體電路電磁相容模型 7
2.3 指令電流源模型 9
2.4 指令集模擬器 11
三、 系統架構及研究方法 12
3.1 硬體電路量測 12
3.1.1 量測規範分析：IEC61967-4 13
3.1.2 PIC12F629介紹 13
3.1.3 電路板設計 15
3.1.4 資料取得方式 17
3.1.5 電流源資料簡化方法 21
3.1.6 資料簡化後之驗證 25
3.1.7 量測設備描述 26
3.2 指令集模擬器改良 28
3.2.1 指令電流源模型 28
3.2.2 指令集模擬器結構改良設計 31
3.2.3 管線與指令集模擬器 31
3.2.4 指令電流源資料庫與指令集模擬器 36
3.3 模擬器架構 37
3.3.1 微控器運作流程 37
3.3.2 指令集模擬器程式架構 38
3.3.3 程式細部架構說明 41
3.4 模擬流程與量測系統 47
3.4.1 PIC機械碼產生方法 49
3.4.2 IC-EMC Tool & 快速傅利葉轉換(FFT) 50
四、 實驗結果 53
4.1 單一脈波與指令集模擬器模擬 53
4.2 無管線化指令集模擬器模擬結果 54
4.3 管線指令集模擬器模擬結果 55
4.4 管線化與無管線化之模擬 56
4.5 模擬與量測之數值分析 57
五、 結論 60
六、 參考文獻 61

[1]S. Y. Yuan, C. F. Yang, E. Sicard, C. K. Kuo, and S. S. Liao, "EMI Prediction Under Different Program Behavior," 2007 IEEE EMC Symposium,Honolulu, USA, July 2007.
[2]S. Y. Yuan, J. W. Luo, M. Y. Lin, S. S. Liao, "Microcontroller instruction set simulator for EMI prediction," International Workshop on EMC of IC, Torino, Italy, Nov 2007.
[3]David A. Weston, "Electromagnetic Compatibility," Marcel Dekker Inc, 2001.
[4]IEC 62132-1, "Integrated circuits - Measurement of electromagnetic immunity, 150 kHz to 1 GHz - Part 1: General conditions and definitions," International Electrotechnical Commission(IEC), 2006.
[5]IEC 62132-2, "Integrated circuits - Measurement of electromagnetic Immunity, 150 kHz to 1 GHz - Part 2: Measurement of Radiated Immunity - Tem-Cell and Wideband Tem-Cell Method," International Electrotechnical Commission(IEC) 47A/748/CD, 2006.
[6]IEC 62132-3, "Integrated circuits - Measurement of electromagnetic immunity, 150 kHz to 1 GHz - Part 3: Bulk Current Injection (BCI), 10 kHz to 1 GHz," International Electrotechnical Commission(IEC) 47A/670/CD, 2003.
[7]IEC 62132-4, "Integrated circuits - Measurement of electromagnetic immunity, 150 kHz to 1 GHz - Part 4: Direct RF power injection method," International Electrotechnical Commission(IEC), 2006.
[8]IEC 62132-5, "Integrated circuits - Measurement of electromagnetic immunity, 150 kHz to 1 GHz - Part 5: Workbench Faraday cage method," International Electrotechnical Commission(IEC), 2005.
[9]IEC 61967-1, "Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 1: General conditions and definitions," International Electrotechnical Commission(IEC), 2002.
[10]IEC 61967-2, "Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 2: Measurement of radiated emissions - TEM cell and wideband TEM cell method," International Electrotechnical Commission(IEC), 2005.
[11]IEC 61967-3, "Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 3: Measurement of radiated emissions - Surface scan method," International Electrotechnical Commission(IEC) 47A/674/CD, 2003.
[12]IEC 61967-4, "Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4: Measurement of conducted emissions - 1 Ω/150 Ω direct coupling method," International Electrotechnical Commission(IEC) 61967-4:2002 + A1, 2006.
[13]IEC 61967-5, "Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 5: Measurement of conducted emissions - Workbench Faraday Cage method," International Electrotechnical Commission(IEC), 2003.
[14]IEC 61967-6, "Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 6: Measurement of conducted emissions - Magnetic probe method," International Electrotechnical Commission(IEC) 47A/739/CDV, 2003.
[15]W. Khan-ngern, "Electromagnetic Compatibility Experimental Laboratory on Power Electronics," Proceeding of 2002 International Conference on Electromagnetic Compatibility, Bangkok, Thailand, pp.406-411, Jul 2002.
[16]W. Khan-ngern, "Power Electronic Laboratory on Electromagnetic Interference (EMI) studies," The Fifth International Conference on Power Electronics Drive and System (PEDS’03), Singapore, Nov 2003.
[17]L. Roy, N. Hojjat, O. Maurice, E. Sicard, "Radiation Immunity of RF Receiver Located on the Same PCB with a Microcontroller," International Symposium on Electromagnetic Compatibilit , Barcelona, Spain, pp.443-446, Sep 2006.
[18]C. Labussière, G. Bouisse, J. Tao, E. Sicard and C. Lochot, "Characterization and Modeling of The Supply Network From An Integrated Circuit Up To 12GHz," International Symposium on Electromagnetic Compatibility, Barcelona, Spain, pp.894-899, Sep 2006.
[19]E. Sicard and G. Peres, "A Novel Software Environment for Predicting the Parasitic Emission of Integrated Circuits," proceedings of EMC Compo 05, Munich, German, Nov 2005.
[20]E. Sicard, "Issues in Electromagnetic Compatibility of integrated circuits: Emission and Susceptibility," Invited Tutorial to ESREF 2005, Sep 2005.
[21]E. Sicard, A. Boyer and A. Tankielun, "On the Prediction of Near-field Microcontroller Emission," proceedings of the IEEE International Symposium on EMC, Chicago, USA, Aug 2005.
[22]E. Lamoureux, L. Saissi, C. Huet, E. Sicard, O. Maurice, "Proposal of a New Tool to Characterize Large ICs Immunity in High Frequencies," proceedings of the 2nd International Conference on Electromagnetic Near-Field Characterization & Imaging (ICONIC 2005), Barcelona, Spanish, pp.359-364, Jun 2005.
[23]S. Baffreau, F. Lafon, E. Sicard, F. De Daran, "Re-use of ICEM for immunity simulation," EMC for IC workshop, EMC Zurich 2005, Switzerland, Feb 2005.
[25]S. Y. Yuan, H. E. Chung, C. K. Chen, S. S. Liao, "Irregular and long time current waveform handling improvement for EMC simulation," EMC Europe 2008, Hamburg, German, Aug 2008.
[26]S. Y. Yuan, J. W. Luo, M. Y. Lin, and S. S. Liao, "Microcontroller Instruction Set Simulator for EMI Prediction," 2007 EMC Compo, Torino, Italy, pp.644-647, Nov 2007.
[27]PIC12F629 datasheet, http://ww1.microchip.com/downloads/en/DeviceDoc/41190E.pdf
[28]MPLAB IDE datasheet, http://ww1.microchip.com/downloads/cn/DeviceDoc/cn021943.pdf
[29]E. Sicard, A. Boyer, "IC-EMC v1.5 User''s Manual (Generation Hawaii)", INSA Editor, ISBN 978-2-87649-052-9, 160 pages, June 2007.
[30]頻譜分析儀Agilent N1996A, http://www.home.agilent.com/agilent/product.jspx?nid=-536902952.709577.00&cc=TW&lc=cht

[31]混合信號示波器Agilent 54621D, http://www.home.agilent.com/agilent/product.jspx?pn=54621D&NEWCCLC=TWcht
[32]羅嘉文, "應用於EMI之PIC電路建模技術," 逢甲大學通訊所碩士論文, 台灣台中, 6月 2006年.
[33]SID, http://sources.redhat.com/sid/
[34]吳一農, "PIC16F84單晶片微電腦入門實務," 全華科技圖書股份有限公司, 11月 1999年.
[35]榮欽科技, "精通C++入門與實作," 文魁資訊股份有限公司, 7月 2003年.
[35]吳權威, 王曉慧, "C/C++程式設計入門與應用," 網奕資訊科技股份有限公司, 7月 2005年.
[36]陳會安, "C/C++程式設計範例教本第二板," 學貫行銷股份有限公司, 5月 2006年.
[37]松橋工作室, "完美的演繹C&C++," 知城數位科技股份有限公司, 5月 2005年.