臺灣博碩士論文加值系統

本篇論文主要探討到利用溫度循環試驗來判斷系統在正常狀態下的操作壽命。以往產品在研發或測試階段都需要花費不少時間去找出問題並加以改善，以提高產品的品質，為了提升產品品質與驗證產品的壽命，可靠度技術是一門不可或缺的手法。
在執行可靠度試驗是花費時間的，為了縮短測試時間能夠快速得到失效相關資料，加速性試驗是最佳的選擇；而溫度循環試驗是最常用來檢測電子元件或電子產品的環境實驗方式，藉由極值高溫與極值低溫間的差異能夠找出元件的熱應力缺陷，來剔除熱應力不良的元件，提升產品的可靠度。
低通濾波器是將高頻率訊號濾掉的電路，所以截止頻率對低通濾波器是最重要的功能，若因為元件的失效而導致截止頻率偏移出限定範圍則可決定此電路是失效的。溫度循環規範採用IEC國際電工協會所訂定溫度範圍與方法進行實驗，依據規範來進行量測。在設計初期利用元件計數法評估系統的失效率；接著進行溫度循環試驗，選定三組高應力水準進行溫度循環試驗以及利用正常環境條件下進行驗證；當產品產生失效時，可以藉由韋伯分析來評估產品的特徵壽命以及利用加速性實驗模型判斷加速因子，並且搭配溫度變換率的修正式來反推在正常條件下使用的壽命狀況狀況。

This study focuses on temperature cycling tests to identify the life of a system under a normal operation condition. In the past, the products’ research and development phase or testing phase required to spend a lot of time finding the problems and improving the quality of the products. In order to improve the products’ quality and perform life verification, reliability technology is necessary.
It is time-consuming to perform the reliability tests. Accelerated tests can significantly shorten the test time. Amongst different testing methods, the temperature cycling test is the most commonly used for electronic components and products. Through the accelerated thermal cycling test, thermal stress applying onto components can screen out defects in systems; hence, the quality engineer can adapt the procured data to improve the product quality.
Low-pass filter circuits are used to filter out high frequency undesired signal; therefore, if the cut-off frequency is out of a specified range, this circuit is a considered as having a failure mode. In this research, the temperature cycling test method follows the IEC standard (International Electrotechnique Commission). During the design phase, a “part count method” is used to assess the failure rate of this system, and then the temperature cycling tests are conducted. Three high stress levels are selected to perform the temperature cycling test and a verification test is conducted under a normal operation level.
With product life data under a specific failure mode, we can estimate the product life by Weibull analysis. Furthermore, using an improved accelerated model, accelerated factors are identified by incorporating with the temperature changing rate; hence the life of products under a normal operational condition can be estimated.

摘要 i
ABSTRACT ii
致謝 iii
第一章 緒論 1
1.1　前言 1
1.2　文獻探討 2
1.3　文章架構 9
第二章 可靠度工程 11
2.1　可靠度的定義 11
2.2　可靠度試驗定義與目的 12
2.3　可靠度預估 13
2.3.1　MIL美軍預估方式 13
2.3.2　Telcordia預估方式 14
2.3.3　可靠度預估與浴缸曲線 15
2.4　失效模式與效應分析 16
2.5　可靠度計算 17
2.5.1　失效率 17
2.5.2　平均失效間隔時間 18
2.5.3　可靠度 18
第三章　實驗理論與分析 20
3.1　低通濾波器定義與設計 20
3.1.1　主動濾波器 20
3.1.2　實驗電路 21
3.2　數位信號處理 23
3.2.1　窗化 23
3.2.1.1　Regular 24
3.2.1.2　Hamming 24
3.2.1.3　Hanning 24
3.2.1.4　Blackman-Harris 24
3.2.2　奈奎斯特取樣定理 25
3.3　傅立葉轉換 26
3.3.1　離散傅立葉轉換 26
3.3.2　快速傅立葉轉換 27
3.4　韋伯分析 28
3.4.1　兩參數式韋伯分佈 28
3.4.2　三參數式韋伯分佈 29
3.4.3　韋伯機率分佈圖 29
3.5　可靠度方塊圖 31
3.6　加速性試驗 32
3.6.1　Coffin-Manson Model 32
3.6.2　Arrhenius Model 33
3.6.3　加速因子與加速性試驗分析方式 34
3.7　公差分析 37
第四章　實驗規劃與設計 38
4.1　實驗材料 39
4.2　實驗規範 40
4.3　實驗機台 41
4.4　實驗設計 42
4.5　失效機制與失效模式 44
第五章　實驗結果與分析 45
5.1　RBD模擬 45
5.1.1　元件設定 46
5.1.2　RBD連接與設定 46
5.1.3　系統模擬運算及操作溫度設定 48
5.1.4　系統於70℃的預估結果 50
5.1.5　系統於-20℃的預估結果 51
5.1.6　系統於80℃的預估結果 52
5.1.7　系統於-30℃的預估結果 54
5.1.8　系統於90℃的預估結果 55
5.1.9　系統於-40℃的預估結果 57
5.1.10　系統於50℃的預估結果 58
5.1.11　系統於20℃的預估結果 60
5.1.12　系統可靠度與失效率比較 61
5.2　公差分析結果 63
5.3　電性實驗分析 64
5.3.1　溫度循環圖 64
5.3.2　電性功能測試結果分析 66
5.3.2.1　截止頻率檢測 66
5.3.2.2　元件性能檢驗 69
5.4　電容結構分析 73
5.4.1　溫差在90℃下電容結構分析 74
5.4.2　溫差在110℃下電容結構分析 79
5.4.3　溫差在130℃下電容結構分析 84
5.4.4　失效機制比較 89
5.5　韋伯分析 91
5.5.1　溫差在90℃下的韋伯分析 91
5.5.2　溫差在110℃下的韋伯分析 94
5.5.3　溫差在130℃下的韋伯分析 95
5.5.4　韋伯分析結果與比較 97
5.6　加速因子與正常環境操作下壽命評估 98
5.6.1　Coffin-Manson參數評估 98
5.6.2　溫差在90℃下加速因子評估 99
5.6.3　溫差在110℃下加速因子評估 100
5.6.4　溫差在130℃下加速因子評估 101
5.6.5　正常操用狀態下壽命評估與驗證 102
第六章　結論與未來展望 103
6.1　結論 103
6.2　未來展望 104
參考文獻 105
附錄A 電子材料規格 110
附錄B 電子檢驗設備 113
附錄C 冷熱衝擊環境試驗機規格 117
作者簡介 118

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