臺灣博碩士論文加值系統

本篇論文將反射式紅外光譜應用於有機高分子太陽能電池元件上，藉此分析元件主動層在不同溶劑中受到退火處理後，其薄膜形貌的改變。實驗室使用的主動層材料為poly(3-hexylthiophene)(P3HT)以及C60的衍生物[6,6]-phenyl-C61-butyric acid methyl ester(PCBM)，首先是分析P3HT的共軛平面在不同溶劑且變溫的情況下，有何翻轉變化，接著把PCBM混入P3HT中，觀察PCBM支鏈上的苯環與酮基變化情形，最後，也嘗試著將所得到的紅外光譜與製作成的元件作一個連結，探討主動層中的材料分子受到退火及溶劑的影響，使得形貌改變，會如何影響元件表現。

In this study, we applied Reflection Absorption Infrared Spectrometry (RA-IR) to organic polymer solar cell devices to analysis the morphology of the active layer in the different solvents and annealing treatment. The materials of active layer we used are poly(3-hexylthiophene)(P3HT) and [6,6]-phenyl-C61-butyric acid methyl ester(PCBM). First, we observed how to rotate the conjugating plane in the different solvents and different annealing temperature. In the next step, we doped PCBM with P3HT, and then observed the variation of the functional groups of PCBM to compare with P3HT’s absorption peak. Finally, we tried to combine the IR results with device performance to discusse relation between the morphology of materials and device efficiency.

目錄
中文摘要.....................................................................................................I
Abstract.....................................................................................................II
誌謝..........................................................................................................III
目錄..........................................................................................................IV
表目錄...................................................................................................VIII
圖目錄.......................................................................................................X


第一章 緒論 1
1-1 前言 1
1-2 有機太陽能電池簡介 3
1-2-1 有機太陽能電池的類型 3
1-2-2 有機太陽能電池工作原理 11
1-3 研究動機與大綱 14
1-3-1 薄膜形貌之影響 14
1-3-2 研究動機 14
1-3-3 大綱 16
第二章 紅外線光譜儀的結構與工作原理 19
2-1 紅外線光譜儀工作原理介紹 19
2-1-1 紅外線光譜儀的簡介 19
2-1-2 分子的偶極矩變化 19
2-1-3 分子的振動模式 19
2-1-4 分子的轉動 21
2-1-5 傅利葉紅外光光譜儀(FT-IR) 22
2-2 反射式紅外光譜的工作原理 26
2-2-1 前言 26
2-2-1 光的極化 26
2-2-2 光的入射角 27
2-2-3 分子偶極的方向 27
2-3 紅外線光譜儀的系統結構 30
2-3-1 結構簡介 30
2-3-2 Michelson干涉儀 30
2-3-3 樣品載台 30
2-3-4 偵測器：焦電偵測器 31
2-3-5 偵測器：光導偵測器 32
第三章 實驗的製作與量測過程 35
3-1 元件實驗流程簡介 35
3-2 元件製作 36
3-2-1 ITO基板圖案蝕刻 36
3-2-2 ITO基板清洗 38
3-2-3 電洞傳輸層 38
3-2-4 主動層成膜 39
3-2-5 電極蒸鍍 40
3-3 元件量測 43
3-3-1 I-V量測 43
3-3-2 P3HT：PCBM標準元件的表現 44
3-4 IR的sample製作 47
3-4-1 FT-IR 47
3-4-2 RA-IR 48
3-5 IR的sample量測 50
3-5-1 FT-IR 50
3-5-2 RA-IR 50
第四章 討論P3HT的共軛平面在不同溶劑中受到退火處理的形貌變化 52
4-1 前言 52
4-2 比較P3HT的共軛平面在不同溶劑之變化 54
4-3 討論P3HT以ODCB當溶劑成膜後並受到加熱後的形貌變化 58
4-3 討論P3HT以Chloroform當溶劑成膜後並受到加熱後的形貌變化 61
4-5 結論 64
第五章 討論P3HT:PCBM以不同溶劑成膜並受到退火處理的形貌變化 65
5-1 前言 65
5-2 討論P3HT:PCBM以ODCB當溶劑成膜後並受到加熱後的形貌變化 67
5-3 討論P3HT:PCBM以Chloroform當溶劑成膜後並受到加熱後的形貌變化 69
5-5 結論 79
第六章 總結與未來展望 80
6-1 總結 80
6-2 未來工作及建議 81
自述 86

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