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研究生:潘建合
研究生(外文):Chen-Ho Pan
論文名稱:智慧型預測保養系統監控與建模伺服器之設計與實作
論文名稱(外文):Design and Implementation of a Monitoring-and-Model-Creation Server for an Intelligent Predictive Maintenance System
指導教授:鄭芳田鄭芳田引用關係楊浩青楊浩青引用關係
指導教授(外文):Fan-Tien ChengHao-Ching Yang
學位類別:碩士
校院名稱:國立成功大學
系所名稱:製造工程研究所碩博士班
學門:工程學門
學類:機械工程學類
論文種類:學術論文
論文出版年:2009
畢業學年度:97
語文別:中文
論文頁數:80
中文關鍵詞:通用型嵌入式裝置監控與建模伺服器可插型應用模組
外文關鍵詞:PAMGEDMMCSPluggable Application ModuleMonitoring-and-Model-Creation ServerGenetic Embedded Device
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隨著產品製造科技發展日新月異,工廠機台設備越趨精密;然機台性能常隨著長時間運轉,致使相關零組件逐漸老化或變異,從而惡化產品的品質。因此,實需一可監控機台的設備錯誤預測系統,以確保機台性能長期運轉之穩定性。
本研究基於智慧預測保養系統架構,設計一監控與建模伺服器
(Monitoring-and-Model-Creation Server, MMCS)。在即時監控上,MMCS亦具圖形化監控介面,易於確保機台運轉之穩定性外。在模型建立上,MMCS 可彙整來自於機台側的泛用型嵌入元件(Generic Embedded Device,GED)所蒐集機台資訊回報之工程資料,透過整合資料前處理與錯誤分類演算法等技術,以自動化建立所對應機台之設備錯誤預測模型,並將模型轉換為可插型應用模組(Pluggable Application Module, PAM)以供GED監控設備錯誤之用。
在應用上,MMCS 透過彙整數值加工機台CNC 的多軸振動資料與加
工參數,從而建立該CNC 的軸承錯誤預測模型,不僅達到即時線上模型監控之目標,預期亦將可有效提升整體機台之效率。
With rapidly change of product manufacturing technology, the equipment is tending to increasingly complicated and precise than before; however, after long-run equipment usually losses its performance, which is affected by
failure, aging or varying of the equipment’s components, and eventually destroys the product quality. To prevent the component ill-effects, a prognostic system is needed to monitor the equipment for ensuring the long-run performance.
Based on an intelligent prognostic architecture, a MMCS (Monitoring-and-Model-Creation Server) is proposed in this study. In real time monitoring, MMCS supports users with GUI to supervise equipment. In model creation,
MMCS integrates engineering data which is collected from GED (Genetic Embedded Device) attached by equipment to create a prognostic model using data preprocessing and fault classification technologies, and MMCS transfers
the model into the Pluggable Application Module for providing GED to monitor the equipment.
In application, MMCS developed a CNC bearing prognostic model by integrating multi-axes vibration data and processing parameters. As a result, we not only achieve the goal of real-time model based monitoring the CNC, but also improve the CNC overall performance by reducing downtime.
目錄 i
圖目錄 iii
表目錄 v
第一章 緒論 1
1.1 研究背景 1
1.2 研究動機 3
1.3 研究目的 3
1.4 論文架構 4
第二章 文獻探討與方法基礎 5
2.1 Intelligent Prognostics System 5
2.2 Interface-A(EDA)Standards 8
2.3 MTConnect 9
2.4 MTConnect & Interface A Comparison 11
第三章 系統需求分析 14
3.1 系統開發流程 14
3.2 MMCS系統功能需求分析 14
第四章 MMCS物件導向分析與設計 18
4.1 MMCS物件導向分析(OOA)之使用案例圖 18
4.1.1 MMCS Use Cases – Actor敘述 19
4.1.2 MMCS Use Cases – Use Case 說明 20
4.2 MMCS物件導向分析之類別圖 28
第五章 MMCS架構設計 32
5.1 Intelligent Predictive Maintenance System架構設計 32
5.2 Generic Embedded Device架構設計 34
5.3 MMCS架構設計 38
5.4 MMCS系統流程 42
5.4.1 MMCS建模演算法流程 42
5.4.2 MMCS建模功能流程 43
5.4.3 MMCS監控功能流程 44
第六章 MMCS系統實作與應用 45
6.1 開發環境與實驗環境 45
6.2 系統實作 47
6.2.1 IPS系統訓練模式 50
6.2.2 IPS系統運轉模式 63
6.3 開發成果與現況之比較 67
第七章 結論 68
7.1 研究成果與論文總結 68
7.2 未來研究方向 69
參考文獻 71
附錄 A. 物件導向設計之順序圖 73
[1]M.-H. Hung, K.-Y. Chen, R.-W. Ho, and F.-T. Cheng, “Development of an
e-Diagnostics/Maintenance Framework for Semiconductor Factories with
Security Considerations”, in the Special Issue on Intelligent Maintenance
Systems for Int. Journal of Advanced Engineering Informatics, vol. 17, pp.
165-178, October 2004.
[2]e-Diagnostic and EEC Workshop, International SEMITECH, Austin, Texas, USA, Oct. 19, 2001. [Online]. Available: http://www.semitech.org
[3]ISMT e-Diagnostic Capability Definitions. [Online]. Available: http://www.sematech.org/public/resources/ediag/index.htm
[4]Y.-C. Su, F.-T. Cheng, M.-H. Hung, and H.-C. Huang,“Intelligent Prognostics System Design and Implementation”, IEEE Transactions on Semiconductor Manufacturing, vol. 19, no. 2, May 2006.
[5]Gino Crispispieri, ISMI Manufacturing Initiative, Interface A Standards Implementation, 1998.
[6]Gino Crispispieri, ISMI Manufacturing Initiative, Interface A Usage Guidance, 1998.
[7]ISMI Manufacturing Initiative, Interface A Standards, March 2004.
[8]A new organization promoting open standards addressing manufacturing systems interoperability on the shop floor. [Online]. Available: http://www.mtconnect.org/
[9]William Sobel, MTConnect Standard Part 1 – Overview and Procotol, pp. 9, 2009 [Online]. Available: http://mtconnect.org/images/documents/standard/MTC_Part_1_Overview_v1.0.1.pdf
[10]William Sobel, MTConnect Standard Part 2 –Components and Data Items, pp. 9, 2009 [Online]. Available: http://mtconnect.org/images/documents/standard/MTC_Part_2_Components_v1.0.1.pdf
[11]William Sobel, MTConnect Standard Part 3 –Stream, Event, and Samples, pp. 9, 2009 [Online]. Available: http://mtconnect.org/images/documents/standard/MTC_Part_3_Streams_v1.0.1.pdf
[12]Paul Warndorf,Will Sobel, MTCOnnect With Paper, June, 20, 2007.
[13]G. Booch, J. Rumbaugh, I. Jacobson, The Unified Modeling Language User Guide, ADDISON-WESLEY, April 2000.
[14]Y.-C. Su, M.-H. Hung, F.-T. Cheng, and T.-P. Lee, “Development of a Data Pre-processing Scheme and Pluggable Application Modules for an Intelligent Equipment Prognostics System”, in Proc. the 3rd International IEEE Conference on Industrial Informatics – INDIN’05, Perth, Western Australia, August 2005.
[15]F.-T. Cheng, G.-W. Huang, C.-H. Chen, and M.-H. Hung, "A Generic Embedded Device for Retrieving and Transmitting Information of Various Customized Applications," in Proc. 2004 IEEE International Conference on Robotics and Automation, New Orleans, Louisiana, U.S.A., pp. 978-983, April 2004.
[16]Chi-Yao Lo, Fan-Tien Cheng, Intelligent Computer Performance Evaluator, Master Thesis, Institute of Manufacturing Engineering, National Cheng Kung University, 2007.
[17]Chan-Cho Liu, Fan-Tien Cheng , Virtual Metrology Model Creation Server Design and Implementation, Master thesis, Institute of Manufacturing Engineering National Cheng Kung University, 2008.
[18]Deng-Lin Zeng, Fan-Tien Cheng, Yu-Chian Su. Evaluation Reliance Level of a Virtual Metrology System, 2007
[19]F.-T. Cheng, H.-C. Yang, and J.-Y. Lin,” Development of Holonic Information Coordination Systems with Failure-Recovery Considerations” , IEEE Transactions on Automation Science and Engineering, vol. 1, no. 1, pp. 58-72, July 2004.
[20]M.-H. Hung, F.-T. Cheng, and S.-C. Yeh, “Development of a Web-Services-based e-Diagnostics Framework for the Semiconductor Manufacturing Industry”, IEEE Transactions on Semiconductor Manufacturing, vol. 18, no. 1, pp. 122-135, February 2005.
[21]M.-H. Hung, T.-L. Wang, F.-Y. Hsu, and F.-T. Cheng, “Development of an Interface C Framework for Semiconductor e-Diagnostics Systems”, Robotics and Computer-Integration Manufacturing, vol. 24, no. 3, pp. 370-383, June 2008.
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