|
[ 1 ] F. S.-S. Chien, et. al., J. Appl. Phys. 89, 2465 (2001). [ 2 ] A. R. Champagne et. al., Apll. Phys. Lett. 82, 1111 (2003). [ 3 ] J.W. Lyding, et. al., Appl. Surf. Sci. 130, 221 (1998). [ 4 ] (1) J.-L. Lin, et. al., Appl. Phys. Lett., 78, 829 (2001). (2) J.-L. Lin, et. al., J. Appl. Phys. 86, 5492 (1999). [ 5 ] D. Welipitiya, et. al., Surf. Sci. 418, 466 (1998). [ 6 ] O. Fruchart, et.al., Phys. Rev. Lett. 83, 2769 (1999). [ 7 ] P. Finnie, Y. Homma, Appl. Phys. Lett. 72, 827 (1998). [ 8 ] Z. Jin et. al., J. Appl. Phys. 84, 194 (1998). [ 9 ] A. Kirakosian, J. L. McChesney, R. Bennewitz, J. N. Crain, J.-L. Lin, F. J. Himpsel, Surf. Sci. 498, 109 (2002). [10] D. Lee, S. Kim, Appl. Phys. Lett. 82, 2619 (2003). [11] S. Liang, R. Islam, et al. Appl. Phys. Lett. 88, 113111 (2006). [12] Z. He, D. J. Smith, P. A. Bennett, Phys. Rev. Lett. 93, 256102 (2004). [13] 徐欣然, National Chiayi University Master Thesis, (2007). [14] J. L. McChesney, A. Kirakosian, R. Bennewitz, J. N. Crain, J. L. Lin, F. J. Himpsel, Nanotech. 13, 545 (2002). [15] B. C. Harrison, P. Ryan, J. J. Boland, Surf. Sci. 582, 79 (2005). [16] Y. Chen, D. A. A. Ohlberg, R. S. Williams, J. Appl. Phys. 91, 3213 (2002). [17] D. Lee, D. K. Lim, S. S. Bae, S. Kim, R. Ragan, D. A. A. Ohlberg, Y. Chen, R. S. Williams, App. Phys. A 80, 1311 (2005). [18] B. Z. Liu, J. Nogami, Nanotech. 14, 873 (2003). [19] B. Z. Liu, J. Nogami, Surf. Sci. 540, 136 (2003). [20] R. Ragan, Y. Chan, D. A. A. Ohlberg, G. Medeiros-Ribeiro and R. S. Williams, J. Cryst. Growth, 251, 657 (2003). [21] I. Zutic, Nature Material, 5, 771 (2006). [22] S. Pearton, Nature Material, 3, 203 (2004). [23] Y. Yamamoto, T. Sueyoshi, T. Sato, M. Iwatsuki, Surf. Sci. 466, 183 (2000). [24] R. Butz, H. L�厎h, Surf. Sci. 365, 807 (1996). [25] K. Arima, J. Katoh, K. Endo, Appl. Phys. Lett. 85, 6254 (2004). [26] Omicron NanoTechnology GmbH, SPM Probe Surface Science System User's Guide. [27] Omicron NanoTechnology GmbH, SPM Probe Surface Science System VT-STM User's Guide. [28] T. An, M. Yoshimura, K. Ueda, Surf. Sci. 576, 165 (2005). [29] D. R. Bowler, J. H. G. Owen, G. A. D. Briggs, Phy. Rev. B 59, 14868 (1999). [30] M. Cavallini, F. Biscarini, Rev. Sci. Instrum. 71, 4457 (2000). [31] M. V. Rastei, J. P. Bucher, J. Phys.: Condens. Matter, 18, 619 (2006). [32] A.Kubetzka, M.Bode, O. Pietzsch, R. Wiesendanger, Phys. Rev. Lett. 88, 057201 (2002). [33] J. Prokop, A. Kukunin, H. J. Elmers, Phys. Rev. Lett. 95, 187202 (2005). [34] M. Yoshimura, M. Odawara, K. Ueda, Materials Science and Engineering, B 91-92, 120 (2002). [35] 廖彥傑, National Chiayi University Master Thesis, (2008). [36] Omicron NanoTechnology GmbH, Instruction Manual UHV Evaporator EFM2/3/3s/4. [37] D. Dijkkamp, E. J. van Loenen, A. J. Hoeven, J. Dieleman, J. Vac. Sci. Technol. A 8, 218 (1990). [38] A. A. Stekolnikov, J. Furthm�刜ler, F. Bechstedt, Phys. Rev. Lett. 93, 136104 (2004). [39] N. D. Kim, Y. K. Kim, C.-Y. Park, H. W. Yeom, H. Koh, E. Rotenberg, J. R. Ahn, Phys. Rev. B 75, 125309 (2007). [40] C. Kittel, Introduction to solid state physics -7th ed. Ch. 15, 490 (1996).
|