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研究生:劉信龍
研究生(外文):Liu, Sin-Long
論文名稱:有關低不良率產品之統計問題研究
論文名稱(外文):Some Statistical Aspects of the Products with Low Defective Rate
指導教授:桑慧敏桑慧敏引用關係
指導教授(外文):Song, Wheyming Tina
學位類別:博士
校院名稱:國立清華大學
系所名稱:工業工程與工程管理學系
學門:工程學門
學類:工業工程學類
論文種類:學術論文
論文出版年:2009
畢業學年度:97
語文別:中文
論文頁數:118
中文關鍵詞:統計製程管制工程製程管制加速壽命實驗信賴區間
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本論文探討四個有關低不良率產品之統計問題, 最終目地在提升這些產品之品質。

第一個課題探討如何在工程管制的機制下, 同時呈現統計製程管制圖。
本課題的困難在於若每個製程批次採用了工程管制的方式來調整參數, 未調整前的原始數據已不存在。本研究藉由估計相關參數, 進而估計原始數據, 以還原工程管制調整前的製程數據。

第二個課題探討如何估計樹酯式變壓器的壽命分配。 本課題的困難在於目前沒有足夠的樹酯式變壓器壽命資料。本研究分析樹酯式變壓器的核心部分 -- 樹酯。 以 Generalized Gamma - Arrhenius 作為壽命與壓力模式來估計樹酯壽命。

第三主題探討如何估計高可靠度的電子傳輸二元資料之傳位元錯誤率。傳統的模擬法沒有效率, 因為在高可靠度的電子傳輸設備中, 位元錯誤率的機率很小,
因此在有限的時間內無法得到足夠的錯誤訊息資料。本研究結合模擬方式與重點抽樣去降低模擬的時間或樣本數, 所估計出的位元錯誤率有比較好的統計特性。

第四個課題探討如何建立在參數 p 值很小時之伯努力分配參數 p 之信賴區間。 本課題的特例是探討第一個課題中高可靠度的電子傳輸二元資料之傳輸錯誤率之信賴區間。本課題的困難在於伯努力分配的二元離散性, 使得傳統的信賴區間之覆蓋率不穩定。
1緒論
1.1品質觀念的演進
1.1.2 品質手法
1.1.2 品質加嚴標準
1.2四個課題
1.2.1 處於工程制程管制下,建立統計制程管制下的管制圖
1.2.2 估計樹脂式變壓器壽命
1.2.3 估計傳輸系統上的位元錯誤率
1.2.4 當伯努力分配參數 p 值較小時, 建力立 p 的信賴區間
2 處於工程製程管制下, 建立統計製程管制下的管制圖
2.1 導論
2.2 文獻回顧
2.2.1 單一指數加權移動平均控制器
2.2.2 雙指數加權移動平均控制器
2.3 機會視窗的存在
2.4 兩種管制圖的比較與規則的建立
2.5 結論與未來研究
3 估計樹脂式變壓器壽命
3.1 導論
3.2 樹脂絕緣體的介紹: 結構與使用條件
3.3 壽命分配與壽命-應力模式的回顧
3.3.1壽命分配: 一般化伽瑪分配
3.3.2 壽命-應力模式: GG3-Arrhenius 模式
3.4 估計樹脂期望壽命與期望壽命的標準誤
3.5 實驗設計
3.5.1 測試資料的建立
3.5.2 Arrhenius 壽命-應力模式的驗證
3.5.3 點估計使用的可能
3.5.4 壽命期望值與期望值標準誤的估計值
3.6 結論與建議
4 估計傳輸系統上的位元錯誤率
4.1 導論
4.2 問題敘述
4.3 尾部偏差分配
4.3.1 高斯尾部偏差分配
4.3.2 雷氏尾部偏差分配
4.3.3 指數尾部偏差分配
4.4 混和偏差分配
4.4.1 高斯尾部+均勻分配
4.4.2 雷氏尾部+均勻分配
4.4.3 指數尾部+均勻分配
4.4.4 數據比較
4.5 結論
5 當伯努力分配參數 p 值較小時, 建立 p 的信賴區間
5.1 導論
5.2 回顧與擴展
5.2.1 標準信賴區間
5.2.2 威爾森信賴區間
5.2.3 伯努力參數的估計量
5.2.4 伯努力參數估計量的擴展
5.3建立新 CI 程序的想法
5.3.1 決定 t 分配的自由度
5.3.2 估計點估計的標準誤
5.4 提出的程序
5.4.1 程序 A: 調整後的標準程序
5.4.2 合併程序 W 與程序 A
5.5 績效評估
5.5.1 實際的涵蓋機率
5.5.2 區間半寬估計的期望值
5.5.3 估計區間半寬的標準差
5.6 摘要與結論
6 研究結論與後續研究方向
6.1.1 處於工程製程管制下, 建立統計製程管制下的管制圖
6.1.2 估計樹脂式變壓器壽命
6.1.3 估計傳輸系統上的位元錯誤率
6.1.4 當伯努力分配參數 p 值較小時, 建立 p 的信賴區間
6.2 後續研究方向
6.2.1 處於工程製程管制下, 建立統計製程管制下的管制圖
6.2.2 估計樹脂式變壓器壽命
6.2.3 估計傳輸系統上的位元錯誤率
6.2.4 當伯努力分配參數 p 值較小時, 建立 p 的信賴區間
附錄
1.Boning,D.S. and Mozumder,P.K.,``DOE/Opt:A System for
Design of Experiments,Response Surface Modeling,and
Optimization Using Process and Device Simulation''.IEEE
Transactions on Semiconductor Manufacturing,Vol. 7,pp.
233-244, 1994。
2.Box,G. and Kramer,T.(1992),``Statistical Process
Monitoring and Feedback Adjustment'', Technometrics,Vol
34,No 3, PP. 251-267
3.Butler,S.W. and Stefani,J.A.(1994),``Supervisory Run-to-
Run Control of a Polysilicon gate Etch Using in Situ
Ellipsometry ''.IEEE Transactions on Semiconductor
Manufacturing, Vol. 7, pp. 193-201
4.Castillo,E.D. and Hurwitz,A.M.,``Run-to-Run Process
Control:Literature Review and Extensions'',Journal of
Quality Technology, Vol 29, No 2, pp. 184-196, 1997。
5.Gaston,F.J. and Walton,A.J.(1994),``The Integration of
Simulation and Response Surface Methodology fro the
Optimization of IC Processes''.IEEE Transaction on
Semiconduction Manufacturing, Vol. 7,pp. 22-33
6.Sachs,E. Hu,A and Ingolfsson,A.(1991),``Modeling and
Control of a Epitaxial Silicon Deposition Process wth
Step Disturbances''.IEEE/SEMI Advanced Semiconductor
Manufacturing Conference Procedings, pp.104-107
7.Castillo,E.D.,``Long Run and Transient Analysis of a
Double EWMA Feedback Controller'',IIE Transactions}, Vol
31, pp.1157-1169, 1999.
8. Ingolfsson,A. and Sachs,E.,``Stability and Sensitivity
of an EWMA Controller'',Journal of Quality Technology,
Vol 25, pp. 271-287, 1993.
9.Sachs,E, Hu,A., and Ingolfsson,A,`` Run by Run Process
Control:Combining SPC and Feedback Control'', IEEE
Transactions on Semiconductor Manufacturing, vol. 8, No.
1, pp. 26-43, 1995.
10.John F. MacGregor,``A Different View of the Funnel
Experiment'',Journal of Quality Technology,Vol. 22,NO.
4, pp. 255-259, 1990.
11.Messina,W.S., Montgomery,D.C., Keats,J.B., and
Runger,G.C.,``Strategies fo Statistical Monitoring of
Integral Control for the Continuous Process
Industries'', Statistical Applications in Process
Control edited by J.B. Keats and D.C. Montgomery Marcel
Dekker, New York, NY, pp. 193-215, 1996.
12.Montgomery,D.C, Keats,J.B., Runger,G.C., and
Messina,W.S.,``Integrating Statistical Process Control
and Engineering Process Control'',Journal of Quality
Technology,NO. 26, pp. 79-97, 1994.
13.Montgomery,D.C. and Mastrangelo,C. M.,``Some Statistical
Process Control Methods for Autocorrelated
Data'',Journal of Quality Technology, NO. 23, pp. 179-
204, 1991.
14.MacGregor,J.F.,``On-Line Statistical Process Control '',
Chemical Engineering Process,NO. 10, pp. 21-31, 1988.
15.Box,G.E.P. and Kramer. T.,``Statistical Process
monitoring and feedback adjustment - a
Discussion'',Technometrics,NO. 34,PP. 251-285, 1992.
16.Tsung, F., Shi, J. and Wu, C.F.J.,``Joint Monitoring of
PID Controlled Processes'',Journal of Quality
Technology, No.31,pp. 275-285, 1999.
17.Tsung, F. and Shi, J., ``Integrated Design of Run-to-Run
PID Controller and SPC Monitoring for Process
Disturbance Rejection'', IIE Transactions, NO. 31,pp.
517-527, 1999.
18.Tsung, F., ``Improving Automatic-Controlled Process
Quality Using Adaptive Principal Component Monitoring'',
Quality and Reliability Engineering International,NO.
15, pp.135-144, 1999.
19.Tsung, F., ``Statistical Monitoring and Diagnosis of
Automatic Controlled Processes Using Dynamic PCA'',
International Journal of Production Research, NO. 38,
pp. 625-637, 2000.
20.Tsung, F.,``A Note on Statistical Monitoring of
Engineering Controlled Processes'', International
Journal of Reliability, Quality and Safety
Engineering,NO. 8, pp.1-14, 2001.
21.Butler, S.W. and Stefani, J.A.,``Supervisory run-to-run
control of a polysilicon gate etch using in situ
Ellipsometry'', IEEE Transactions on Semiconductor
Manufacturing, NO. 7, pp. 193-201, 1994.
22.Scott A. Vander Wiel, William T. Tucker, Frederick W.
Faltin, and Necip Doganaksoy,``Algorithmic Statistical
Process Control : Concepts and an Application'',
Technometrics, Vol. 34, No 3., pp. 286-297, 1992.
23.W.B. Nelson, ``Accelerated Testing-Statistical Models,
Test Plans, and Data Analysi'', John Wiley \& Sons, Inc.,
Hoboken, New Jersey, 2004.
24.ANSI/IEEE c57.96, ``Guide for Loading Dry-Type
Distribution and Power Transformers'', 1989.
25.ANSI/IEEE c57.92, ``Guide for Loading Mineral-Oil
Immersed Power Transformers Up to and Including 100MVA
with $55^{\circ}$ c or $65^{\circ}$ c average winding
rise'', 1981.
26.IEC 726, ``Dry-type power transformers'', 1982.
27.Lawless, J. F.,``Inference in the generalized gamma and
log-gamma distributions'', Technometrics, 22, 409-419,
1980.
28.STACY, E. W., September, ``A Generalization of the Gamma
Distribution'',Annals of Mathematical Statistics, 33,
No. 3, 1187-1192, 1962.
29.E. W. Stacy and G. A. Mihram, August., ``Parameter
Estimation for a Generalized Gamma Distribution'',
Technometrics, Vol. 7, No. 3, pp. 349-358, 1965.
30.Vern T. Farewell and Ross L. Prentice, February., ``A
Study of Distributional Shape in Life Testing'',
Technometrics, Vol. 19, No. 1, pp. 69-75, 1977.
31.William Q.Meeker and Luis A. Escobar, ``Statistical
Methods for Reliability Data'', John Wiley \& Sons, Inc,
1988.
32.Beaulieu, N. C.,``A composite importance sampling
technique for digital communication systems
simulation,''IEEE Trans. Commun, Vol 38, 393-396, 1990.
33.Bocquet, W., K. Hayashiand, and H. Sakai, ``Combined
frequency and spatial domains power distribution
for mimo-ofdm transmission,'' The 18th Annual IEEE
International Symposium on Personal, Indoor and Mobile
Radio Communications}, 2007.
34.Chang, Y. and D. Oh,``Fast ISI Characterization of
Passive Channels Using Extreme Value Distribution,''
IEEE, 127-130, 2007.
35.Chen, S.,``Importance sampling simulation for evaluating
the lower-bound BER of the Bayesian DFE,''IEEE Trans.
Commun., Vol 50, No 2, 179-182, 2002.
36.Chen, S., A. Livingstone, and L. Hanzo,``Minimum Bit-
Error Rate Design for Space-Time Equalization-Based
Multiuser Detection,'' IEEE Transactions on
communciations, Vol 54, No 5, 824-832, 2006.
37.Chen, S., A. Wolfgang, Y. Shi, and L. Hanzo,
``Space-time decision feedback equalisation using a
minimum bit error rate design for single-input
multiple-output channels,'' IET Commun., Vol 1, No 4,
671-678, 2007.
38.I, C. L., and B. B. Lusignan,``The optimum BER
estimation for digital satellite communication
systems,'' in AIAA 11th Commun. Satellite Syst. Conf.
San Diego, CA, Mar.,144--151, 1986.
39.Jeruchim, M. C.,``Techniques for estimating the bit
error rate in the simulation of digital communication
systems,'' IEEE J.Select. Areas, Commun, Vol 2, No 1,
153-170, 1984.
40.Kahn, H. and A. W. Marshall,``Methods of reducing sample
size in Monte Carlo computations,''J. Oper. Res.
Soc.Amer., Vol 1, 263--271, 1953.
41.Lee, B.,``Sequential Bayesian Bit Error Rate
Measurement,'' EEE Transactions on Instrumentation and
Measurement, Vol 53, No 4,947--954, 2004.
42.Patrin, J. and M. Li,``Comparison and correlation of
signal integrity measurement techniques,'' in Proc.
DesignCon Jan. 2002 High Performance System Design
Conf., Santa Clara, CA., 2002.
43.Roh, J. C. and B. D. Rao,``Transmit Beamforming in
Multiple-Antenna Systems With Finite Rate Feedback: A VQ-
Based Approach,'' IEEE Transactions on information
theory, Vol 52, No 3, 1101 -1112, 2006.
44.Shih, N. H. and W. T. Song,``Robust consideration of
importance sampling in digital communication system,''
Journal of the Chinese Institute of Engineers}, Vol 18,
No 5, 713--718, 1995.
45. Smith, P. J.,``Quick simulation: A review of importance
sampling techniques in communications system,'' IEEE
J. Select.Areas, Commun., Vol 15, No 4, 597-613, 1997.
46.Wang, Q. and V. K. Bhargava,``On the Application of
importance sampling to BER estimation in the simulation
of Digital Communication Systems,''IEEE Trans. Commun,
Vol 35,1231-1233, 1987.
47.Wang, Y. Y. and C. C. Lu,``Using Weibull density
function in importance sampling for digital communication
system simulation,'' IEEE J.Select.Areas, Commun., Vol
140, No 2,163--168, 1993.
48.Yoon, D. G., S. Y. Shin, W. H. Kwon, and H. S. Park,
``Packet Error Rate Analysis of IEEE 802.1lb under
IEEE 802.15.4 Interference,''IEEE, 1186 - 1190, 2006.
49.Brown, L. D., Cai, T., and Dasgupta, A., ``Interval
Estimation for a binomial proportion (with
discussion)'', Statist. Sci, Vol 16, 101-133, 2001.
50.Brown, L. D., Cai, T., and Dasgupta, A.,``Confidence
Intervals for a Binomial Proportion and Asymptotic
Expansion'', The Annual of Statistics, Vol. 30, No. 1,
160-201, 2002.
51.Chew, V., ``Point estimation of the Parameter of
the Binomial Distribution'', The American Statistician,
Vol 25, 47-50, 1971.
52.Geyer, C. J., and Meeden, G.D., ``Fuzzy and Randomized
Confidence Intervals and P-Values'', Statist. Sci, Vol
20, No 4, 358-366, 2005.
53.Henderson, M., and Meyer, M. C., ``Exploring the
confidence interval for a binomial parameter in a first
course in statistical computing'', The American
Statistician, Vol 55, No 4, 337-344, 2001.
54.Montgomery, D. C., and Runger, G. C.,
Applied statistics and probability for engineers, 4th
ed., Wiley, New York, 2006.
55.Song, W.-M. T., W.C. Chiu, and Goldsman, D.,
``Importance Sampling Techniques for Estimating
the Bit Error Rate in Digital Communication Systems'',
Proceedings of the 2005 Winter Simulation Conference, M.
E. Kuhl, N. M. Steiger, F. B. Armstrong, and J. A.
Joines, eds. 2710-2717, 2005.
56.Steinhaus, H., ``The problem of estimation'', The Annual
of Mathematical Statistics, Vol 28, 633-648, 1957.
57.Wilks, S. S., Mathematical Statistics, Princeton
University Press, Princeton, N. J, 200, 1962.
58.Wilson, E. B., ``Probable inference, the law of
succession, and statistical inference'', J. American
Statist. Assoc., Vol 22, 209-212, 1927.
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