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研究生:楊正旗
研究生(外文):Cheng-Chi Yang
論文名稱:多掃瞄鏈之測試資料壓縮經由可變動切片方式
論文名稱(外文):Data Compression for Multiple Scan Slices Using Slice Run Length
指導教授:曾王道
學位類別:碩士
校院名稱:元智大學
系所名稱:資訊工程學系
學門:工程學門
學類:電資工程學類
論文種類:學術論文
論文出版年:2009
畢業學年度:97
語文別:英文
論文頁數:39
中文關鍵詞:切片可變動切片方式多掃瞄鏈
外文關鍵詞:Scan SliceSlice Run LengthMultiple Scan Chain
相關次數:
  • 被引用被引用:0
  • 點閱點閱:105
  • 評分評分:
  • 下載下載:0
  • 收藏至我的研究室書目清單書目收藏:0
在本篇論文中我們提出一種可以有效減少工業用測試資料的方法,來面對越來越龐大的測試資料。有別於以往multiple scan chains的壓縮方式,我們提出的方法不是單純的只針對每筆slice做處理,更是結合了run length技巧。所提出的方法不需要動到任何CUT的內部架構,也不需要特定的演算法,我們只利用在slice中極少數的specified bits。因此其壓縮率是依據specified bits在slice中分散的密度決定。編碼也不同於一般的編碼方式, codeword的長度是不固定的,而是根據不同的參數來調整壓縮率以及編碼的長度。我們的硬體架構很簡單,只需要簡單的buffer、decoder及數個counter即可。最後從實驗結果中可以發現,隨著電路的增大,如我們一開始預期般的一樣,其效率會越明顯,這是在multiple slices的效用有展現出來。
In this thesis, we proposed an effective compression method to reduce large amounts of test data volume for multiple-scan testing. Different from other compression methods using multiple scan chains, in this method, we not only deal with each slice but also combine the run-length-based technique. There is no need to change the internal structure of CUT, nor do we use a particular algorithm. Only a few specified bits in each slice are exploited. Hence, the compression ratio is decided according to the specified bits density in each slice. Our code is quite different; the length of each codeword is not fixed. We will follow different parameters to adjust the compression ratio and the length of each codeword. Our hardware structure is simple, only a buffer, decoder and several counters are needed. Finally, experiment results show, our method is especially effective as the circuit size grows.
1. Introduction -1-
2. Previous Work -4-
3. Proposed Method -10-
3.1 Motivation -10-
3.2 Basic Structure -10-
3.3 Slices Partition -11-
3.4 Multiple slice mode and Single slice mode -12-
3.5 Single-bit mode and Group mode -13-
3.6 Dummy code -16-
3.7 Encoding Flow and Example -17-
4. Variations -20-
5. Decompressor -22-
6. Experimental Results -25-
7. Conclusion -34-
Reference -35-
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