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[1]J. C. Campbell, C. A. Burrus, A. G. Dentai, K. Ogawa, APPLIED PHYSICS LETTERS, Vol. 39, pp.820-821 (1981) [2]P. D. Wright, R. J. Nelson, T. Cella, APPLIED PHYSICS LETTERS, Vol. 37, pp.192-194 (1980) [3]Y. Wang, E. S. Yang, W. I. Wang, JOURNAL OF APPLIED PHYSICS, Vol. 74, pp. 6978-6981 (1993) [4]Z. Huang, J. Oh, J. C. Campbella, APPLIED PHYSICS LETTERS, Vol. 85, pp. 2386-2388 (2004) [5]J. Oh, J. C. Campbell, S. G. Thomas, S. Bharatan, R. Thoma, C. Jasper, R. E. Jones, T. E. Zirkle, IEEE JOURNAL OF QUANTUM ELECTRONICS, Vol. 38, pp. 1238-1241 (2002) [6]S. Y. Lo, Y. L. Wei, R. H. Yeh, J. W. Hong, ELECTRONICS LETTERS, Vol. 41 (2005) [7]C. S. Lin, L. P. Tu, R. H. Yeh, J. W. Hong, IEEE PHOTONICS TECHNOLOGY LETTERS, Vol. 15, pp.996-968 (2003) [8]D. Buca, S. Winnerl, S. Lenk, Ch. Buchala, D. X. Xu, APPLIED PHYSICS LETTERS, Vol.80, pp. 4172-4174 (2002) [9]Jia Fa; Fan, Haruhiro Oigawa, Yasuo Nannichi, Jpn. J. Appl. Phys., Volume: 27, No: 11, pp. L 2125-L 2127 (1988) [10]M. K. Lee, C. F. Yen, J. J. Huang, Journal of The Electrochemical Society, Volume 153, F77-F80 (2006) [11]M. K. Lee, J. J. Huang, C. F. Yen, Journal of The Electrochemical Society, Volume 154, G117-G121 (2007) [12]M. K. Lee, C. F. Yen, J. J. Huang, S. H. Lin, Journal of The Electrochemical Society, Volume 153, F266-F270 (2006) [13]M. K. Lee, C. F. Yen, S. H. Lin, Journal of The Electrochemical Society, Volume 154, G229-G233 (2007) [14]M. K. Lee, C. F. Yen, Jpn. J. Appl. Phys., Volume: 46, No: 47, pp. L1173-L1175 (2007) [15]M. K. Lee, C. F. Yen, Jpn. J. Appl. Phys., Volume: 47, No: 5, pp. 3590-3593 (1988) [16]C. Y. Yu, C. Y. Lee, C. H. Lin, C. W. Liu, APPLIED PHYSICS LETTERS, Volume 89, pp. 101913 (2006) [17]C. H. Lin, Y. T. Chiang, C. C. Hsu, C. H. Lee, C. F. Huang, C. H. Lai, T. H. Cheng, C. W. Liu, APPLIED PHYSICS LETTERS, Volume 91, pp. 041105 (2007) [18]T. H. Cheng, M. H. Liao, L. Yeh, T. L. Lee, M. S. Liang, C. W. Liu, JOURNAL OF APPLIED PHYSICS, Volume 103, pp. 016103 (2008) [19]L. H. Laih, T. C. Chang, Y. A. Chen, W. C. Tsay, J. W. Hong, ELECTRONICS LETTERS, Vol. 35, pp.1022-1023 (1999) [20]L. H. Laih, W. C. Tsay, Y. A. Chen, T. S. Jen, R. H. Yuang, J. W. Hong, ELECTRONICS LETTERS, Vol. 31, pp. 2123-2124 (1995) [21]C. T. Lee, H. Y. Lee, IEEE ELECTRON DEVICE LETTERS, Vol. 24, pp. 532-534 (2003) [22]H. Y. Lee, C. T. Lee, IEEE, pp.15-18 (2003) [23]C. T. Lee, H. Y. Lee, IEEE PHOTONICS TECHNOLOGY LETTERS, Vol. 17, pp. 462-464 (2005) [24]L. Colace, G. Masini, F. Galluzzi, G. Assanto, G. Capellini, L. D. Gaspare, E. Palange, F. Evangelisti, APPLIED PHYSICS LETTERS, Volume 72, pp. 3175-3177 (1998) [25]H. Zang, S. J. Lee, W. Y. Loh, J. Wang, M. B. Yu, G. Q. Lo, D. L. Kwong, B. J. Cho, APPLIED PHYSICS LETTERS, Volume 92, pp. 051110 (2008) [26]D. Buca, S. Winnerl, S. Lenk, S. Mantl, Ch. Buchal, JOURNAL OF APPLIED PHYSICS, Volume 92, pp. 7599-7605 (2002) [27]J. D. Hwang, Y. H. Chen, C. Y. Kung, J. C. Liu, Journal of The Electrochemical Society, Volume154, J365-J368 (2007) [28]J. Oh, S. K. Banerjee, J. C. Campbell, IEEE PHOTONICS TECHNOLOGY LETTERS, Vol. 16, pp. 581-583 (2004) [29]K. W. Ang, S. Y.. Zhu, J. Wang, K. T. Chua, M. B. Yu, G. Q. Lo, D. L. Kwong IEEE ELECTRON DEVICE LETTERS, Vol. 29, pp. 704-707 (2008) [30]C. Y. Chang, IEEE TRANSACTIONS ON ELECTRON DEVICES, Vol. ED-33, pp. 1829-1830 (1986)
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