[1]Giovannini, H., Amra, C., ''Dielectric thin films for maximized absorption with standard quality black surfaces''. Applied Optics, 1998. 37(1): p. 103-105.
[2]J. Angele, P.D., D. Laroche, P. Payen, in Proceedings of the International Conference on Space Optics, 1997. ICSO’97 ~Centre National d’Etudes Spatiales, Toulouse, France,.
[3]Mestreau, A., et al., in Proceedings of the International Conference on Space Optics, 1997. ICSO’97 ~Centre National d’Etudes Spatiales,Toulouse, France.
[4]Wong, F.L., Fung, M. K., Jiang, X., Lee, C. S., Lee, S. T., ''Non-reflective black cathode in organic light-emitting diode''. Thin Solid Films, 2004. 446(1): p. 143-146.
[5]X. D. Feng, R.K., Z. H. Lu, ''Metal–organic–metal cathode for high-contrast organic light-emitting diodes''. APPLIED PHYSICS LETTERS, 2004. 85(3).
[6]Poitras, D., C.-C. Kuo, and C. Py, ''Design of high-contrast OLEDs with microcavity effect''. OPTICS EXPRESS, 2008. 16(11).
[7]Daniel Poitras, J.A.D., Tom Cassidy, Clive Midwinter, C. Thomas McElroy, ''Black layer coatings for the photolithographic manufacture of diffraction gratings''. APPLIED OPTICS, 2002. 41(16).
[8]Dobrowolski, J.A., Sullivan, B. T., Bajcar, R. C., ''Optical Interference, Contrast-Enhanced Electroluminescent Device''. Applied Optics, 1992. 31(28): p. 5988-5996.
[9]Steigerwald, ''Antiflector black matrix having successively a chromium oxide layer, a molybdenum layer and a second chromium oxide layer''. United States Patent, 1996(No. 5,566,011).
[10]Raniero, L., et al., ''Influence of the layer thickness and hydrogen dilution on electrical properties of large area amorphous silicon p-i-n solar cell''. Solar Energy Materials and Solar Cells, 2005. 87(1-4): p. 349-355.
[11]李正中, ''薄膜光學與鍍膜技術 第五版''. 藝軒圖書出版社, 2006.
[12]王宣文, ''以電漿表面預處理法在塑膠基板上製鍍抗反射膜''. 中央大學,碩士論文, 民國94年.[13]R. M. A. Azzam, N.M.B., ''Analysis and Improvement of Reflection-type Transverse Modulation Optical Voltage Sensors''. North-Holland Publish Company, 1977.
[14]Fujiwara, H., ''Spectroscopic Ellipsometry Principles and Applications''. John Wiley & Sons, Ltd, 2007.
[15]李佳真, ''直流磁控濺鍍氧化膜界面應力之研究''. 國立中央大學, 碩士論文, 民國98年.[16]Ordal, M.A., et al., ''Optical properties of fourteen metals in the infrared and far infrared: Al, Co, Cu, Au, Fe, Pb, Mo, Ni, Pd, Pt, Ag, Ti, V, and W.''. APPLIED OPTICS, 1985. 24(24).
[17]Yamamoto, M. and T. Namioka, ''In situ ellipsometric study of optical properties of ultrathin films''. APPLIED OPTICS, 1992. 31(10).
[18]Hien V. Nguyen, I.A., R. W. Collins, ''Evolution of the optical functions of thin-film aluminum: A real-time spectroscopic ellipsometry study''. PHYSICAL REVIEW B, 1993. 47(7).
[19]Li, H.Y., et al., ''Analysis of the Drude model in metallic films''. Applied Optics, 2001. 40(34): p. 6307-6311.
[20]Charton, C., Fahland, M., ''Optical properties of thin Ag films deposited by magnetron sputtering''. Surface & Coatings Technology, 2003. 174: p. 181-186.
[21]Wook-Jae Lee, J.-E.K., Hae Yong Park, Suntak Park, Min-su Kim, Jin Tae Kim, Jung Jin Ju, ''Optical constants of evaporated gold films measured by surface plasmon resonance at telecommunication wavelengths''. JOURNAL OF APPLIED PHYSICS, 2008. 103(073713).
[22] A.A. Schmidt, H.E., K. Herwig, R. Anton, Surf. Sci., 1996. 349(301).
[23]蘇維彬, 張嘉升, and 鄭天佐, ''二維鉛量子島的成長機制與過程''. 物理雙月刊, 2003. 廿五卷五期.[24]P. Andreazza, C.A.-V., J.P. Rozenbaum, A.-L. Thomann, P. Brault, ''Nucleation and initial growth of platinum islands by plasma sputter deposition''. Surface and Coatings Technology, 2002. 151–152: p. 122–127.
[25]SENNETT, R.S. and G.D. SCOTT, ''The Structure of Evaporated Metal Films and Their Optical Properties''. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA, 1950. 40(4).
[26] MIKHAILOVS, I.F., et al., Cryst. Reg. Technol., 1994. 29(5).
[27] Palik, E.D., ''Handbook of Optical Constants of Solids''. Academic Press.
[28] C. Himcinschi, N.M., S. Hartmann, M. Gersdorff, M. Friedrich, H.-H. Johannes, W. Kowalsky, M. Schwambera, G. Strauch, M. Heuken, D.r.t. Zahn, ''Optical properties of multilayered Alq3/a-NPD structures investigated with spectroscopic ellipsometry''. Appl. Phys. A, 2005. 80: p. 551–555.