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研究生:吳柏賢
研究生(外文):Bo-Shian Wu
論文名稱:超高頻射頻辨識標籤天線量測技術之探討
論文名稱(外文):The study of measurement techniques for UHF RFID tag antenna
指導教授:林明星林明星引用關係
指導教授(外文):Ming-Shing Lin
學位類別:碩士
校院名稱:國立雲林科技大學
系所名稱:電機工程系碩士班
學門:工程學門
學類:電資工程學類
論文種類:學術論文
論文出版年:2010
畢業學年度:98
語文別:中文
論文頁數:128
中文關鍵詞:非接觸式耦合量測無線射頻辨識標籤天線T型匹配
外文關鍵詞:T-matching networkradio frequency identification tag antennanon-contact coupling
相關次數:
  • 被引用被引用:4
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本論文提出三種不同結構的超高頻無線射頻辨識系統之標籤天線與應用於射頻辨識標籤之非接觸式耦合量測方法。在標籤天線方面,本論文提出一低成本、可貼附於金屬物體表面之被動式超高頻無線射頻辨識標籤天線,操作頻段為915 MHz。此天線由一T型匹配網路附有電感性耦合饋入迴圈、二對稱貼片天線、二短路板、一金屬接地板、FR-4玻璃纖維基板及一空氣層組成。由於此天線有金屬接地板的緣故,貼附於金屬表面時,天線的特性不會有劇烈的改變。且此天線可利用簡單調整天線尺寸改變輸入阻抗,同時維持天線大致結構不改變。天線於自由空間中實際貼附於金屬板表面,可得到10.2 m的讀取距離。
本論文也提出兩個縮小化的圓形無線射頻辨識系統之標籤天線,其操作頻段為915 MHz,天線結構由一電感性耦合饋入迴圈及蜿蜒結構所構成,其結構單純,製作容易,且天線可利用參數調整輸入阻抗。兩天線於自由空間中可得到5.2 m與7.2 m的讀取距離。
非接觸式耦合量測方面,本論文用FR4印刷電路板製作出方形及圓形激發天線,再與五個已知頻段且阻抗為50歐姆的天線進行非接觸式耦合量測後得出校正因子。在實際標籤之非接觸耦合量測時,利用此校正因子便可得標籤的操作頻段。研究中,以此架構進行五個標籤的量測結果,得知讀取距離最遠的兩個標籤與設計頻段相當一致。
In this thesis, three different UHF radio frequency identification (RFID) tags are proposed, and a non-contact coupling test procedure for measuring an RFID tag in the UHF band is presented. The first UHF RFID tag is a low-cost novel antenna operating around 915 MHz and mountable on metallic surface. This antenna consists of a T-matching network with an inductively-coupled feed loop, two symmetrical radiating patches shorted to the ground plane by shorting plates, an FR-4 substrate, and an air layer. Because the antenna has a ground plane, the antenna performance is found to not change much when the tag is attached on metallic surface. By simply adjusting the size of the antenna structure, desired impedance for any microchip can be achieved without significantly modifying the antenna structure. When the proposed antenna is mounted on a metallic plate and measured in free space, the maximum reading distance is about 10.2 m.
The other two novel miniaturized circular UFH RFID tag antennas can also be operated around 915 MHz. Each of the two antennas consists of an inductively-coupled feed loop and a meander structure. The structures of these antennas are simple and easy to fabricate. As before, desired impedances of these two antennas for any microchip can also be achieved simply by adjusting the structural parameters without significantly modifying the antenna structures. When measured in free space, these two antennas separately show a maximum reading distance of 5.2 and 7.2 m.
For the non-contact coupling test procedure, two exciting antennas, one being a square loop and the other a circular loop, are both printed on FR4 substrates. Correction factors were obtained after using the two exciting antennas to measure five 50-? antennas with known operating frequencies in the non-contact coupling test When tags under investigation were measured using the two exciting antennas in the non-contact coupling test, their operating frequencies can be obtained with the above correction factors taken into account. Five tags have been measured using this procedure. The two tags that have the largest reading distances have been verified that the measured operating frequencies using the non-contact coupling test agree with the frequencies at which the tags show best performance (i.e., largest reading distances).
Key words: radio frequency identification tag antenna, T-matching network, non-contact coupling
中文摘要 i
英文摘要 ii
致謝 iv
目錄 v
表目錄 vii
圖目錄 x
第一章 緒論 1
1.1 前言 1
1.2 文獻回顧 2
1.3 研究動機與目的 5
1.4 論文結構 6
第二章 無線射頻辨識系統簡介 7
2.1 無線射頻辨識系統的發展與歷史 7
2-2 無線射頻辨識系統與條碼之差異性比較 8
2.3 無線射頻辨識系統基本架構 10
2.4 無線射頻辨識系統之工作原理 11
2.5 無線射頻辨識系統之分類 13
2.6 無線射頻辨識系統使用頻段與相關法規 17
2.7 無線射頻辨識系統讀取器之介紹 18
2.7.1 Thing Magic-Mercury 4 19
2.7.2 Impinj-speedway 19
2.7.3 讀取器之發射功率和場形驗證 20
第三章 無線射頻辨識系統標籤天線之改良與設計 28
3.1 標籤天線之設計流程 28
3.2 天線匹配與縮小化技術 29
3.3 貼附於金屬上之標籤天線之改良 35
3.3.1 標籤天線之模擬與分析 35
3.3.2 標籤天線製作 44
3.3.3 阻抗量測與功率反射係數量測 44
3.3.4 天線參數微調與製作 50
3.3.5 天線參數微調後之阻抗與功率反射係數量測 54
3.3.6 讀取距離量測 59
3.3.7 天線輻射場形量測 61
3.4 圓形標籤天線設計 63
3.4.1 標籤天線之模擬與分析 64
3.4.2 標籤天線製作與阻抗量測 66
3.4.3 天線參數微調與製作 67
3.4.4 讀取距離量測 70
3.4.5 天線c與天線d之模擬與分析 71
3.4.6 天線c與天線d之製作量測與微調 76
3.4.7 天線e與天線f之讀取距離量測 80
3.4.8 天線輻射場形量測 82
第四章 非接觸耦合研究 85
4.1 低頻非接觸式耦合量測架構 85
4.2 高頻非接觸式耦合量測流程與架構 87
4.3 50歐姆待測天線之模擬分析與製作 89
4.4 激發天線模擬與製作 92
4.5 50歐姆待測天線之非接觸耦合模擬與量測 94
4.5.1 50歐姆待測天線之非接觸耦合模擬與量測結果 94
4.6 標籤天線之非接觸耦合模擬與量測 101
4.6.1 標籤天線之非接觸耦合模擬與量測結果 102
4.7 標籤的特性驗證 104
4.8 本章結論 107
第五章 結論 108
參考文獻 111
附錄A 量測Thing magic-mercury4之Gain 115
附錄B M形標籤天線設計與製作 118
B-1 標籤天線之模擬與分析 118
B-2 標籤天線製作 121
B-3 阻抗量測與功率反射係數量測 121
B-4 讀取距離量測 125
B-5 天線輻射場形量測 126
附錄C 128
C-1 不同頻段之待測天線與不同的激發天線模擬與量測結果 128
C-2 激發天線對不同頻段之待測天線的模擬與量測結果之整理表格 147
C-3 各激發天線的校正因子 154
C-4 激發天線與標籤的模擬與量測結果 159
C-5 激發天線與標籤的模擬與量測結果之整理表格 169
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