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研究生:郭馨蕙
研究生(外文):Hsin-Hui Kuo
論文名稱:以良率指標建構製程評選模式
論文名稱(外文):Evaluation and Selection of Processes Based on Yield Index
指導教授:林真如林真如引用關係
學位類別:碩士
校院名稱:元智大學
系所名稱:工業工程與管理學系
學門:工程學門
學類:工業工程學類
論文種類:學術論文
論文出版年:2011
畢業學年度:99
語文別:中文
論文頁數:65
中文關鍵詞:製程能力良率與最佳組之多重比較
外文關鍵詞:process capabilityyieldmultiple comparisons with the best
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產品品質的優劣和製造過程息息相關,從最初採購原料時的供應商選擇到製程參數設定,皆面臨到同時評鑑多個製程的選擇問題,其中,良率為衡量品質差異的主要條件之一。然而現今技術精進,諸多製程的良率極高,並且不同製程的良率僅有微幅差異,這些現況皆造成決策者難以挑選最佳的供應商或生產線。在高品質製程中,製程良率指標Spk為有效衡量製程良率的工具之一,然而先前的研究尚無發展適用於Spk指標之多重比較技術,一般比較母體平均值大小的多重比較檢定技術並不適用於衡量多組製程良率指標,無法解決篩選最佳製程的問題。因此本研究針對Spk指標,提出與最佳組的多重比較方法,達到有效評選最高品質製程的目標,並建立各製程良率指標與最高良率指標差異的信賴區間。研究結果顯示,相較於一般兩兩比較方法,本研究方法更容易判斷何組製程具備最高良率,解決製程評選問題。

The quality of products is closely related to production procedures. The selection of multiple manufacturing processes is a common problem from the very beginning of supplier selection to the selection of different manufacturing parameters. Among different criteria for process evaluation, production yield is one of the key requirements. The yield rates are extremely high with small differences nowadays that make it difficult to determine the best production lines. The Spk yield index is an effective tool for yield evaluation under high quality. However, previous literatures do not develop the multiple comparison methods for comparing a group of Spk’s. The conventional multiple comparisons techniques for evaluating different means cannot be directly applied to evaluate yield indices. Thus, this paper proposes a multiple comparisons with the best (MCB) method based on the yield index Spk. With the established confidence intervals of the difference between every yield index and the highest one, the best production line with the highest yield can be effectively identified. Comparing to the all-pairwise comparisons, the results show that the proposed method can easily conclude the best production line.

摘要...i
ABSTRACT...ii
誌謝辭...iii
目錄...iv
表目錄...v
圖目錄...vi
符號表...vii
符號表...viii
第一章緒論...1
1.1研究背景與動機...1
1.2研究目的...2
1.3研究架構...3
第二章文獻探討...5
2.1製程能力指標...5
2.2多重比較方法...10
2.2.1調整單一檢定誤差率之多重比較技術...11
2.2.2與控制組之多重比較...17
2.2.3與最佳組之多重比較...17
第三章研究方法...19
3.1與最佳良率之多重比較程序...19
3.2臨界值之計算...21
3.3信心水準之推導...24
第四章模擬分析...31
4.1製程偏移程度對檢定方法之影響...31
4.2檢定力趨勢...37
4.3樣本數需求...41
4.4指標上界對檢定方法之影響...45
4.5範例說明...47
4.6比較Spk之UMCB與檢定Spk比值兩方法...51
第五章結論與未來研究方向...61
參考文獻...63

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