臺灣博碩士論文加值系統

本論文所探討的是無鉛壓電陶瓷材料，其中最具代表性的則是鋯鈦酸鉛(PZT)壓電陶瓷材料，具有高Kp與d33以及其他較佳的壓電常數，但材料其中含有鉛，研究指出鉛對環境會造成汙染以及對人體有害，因此現在的趨勢是尋找無鉛壓電陶瓷材料來取代PZT壓電陶瓷的含鉛系列。無鉛壓電陶瓷材料亦分為鈦酸鋇(BaTiO3)、鈮鉀鈉(KNN)等系列，其中KNN有較高的居里溫度，因此本論文用KNN系列來做為研究題目，組成則為Li(K,Na)(Nb,Ta)O3，利用傳統固態反應法來製備無鉛壓電陶瓷及其特性之研究。再將製備好的陶瓷塗上電極極化(4 KV/mm)，在物性分析方面，利用掃描式電子顯微鏡(SEM)來觀察表面結構和X-射線繞射法(XRD)來分析其晶相。而電性分析方面，則用阻抗分析儀(HP4294)來量測相對介電常數(εr)，以及有效機電耦合常數(Kp)，而d33 METER(YE2730A)則用來量測壓電電荷常數(d33)。由實驗結果得知燒結溫度，均有主結構鈣鈦礦(ABO3)。最後，本研究得到物性SEM、XRD，以及電性為: εr、Kp、d33，而組成參數對KNNLT無鉛壓電陶瓷特性的影響也將在本文中詳細探討。

The lead-free Li0.035(KXNa1-X)0.965(Nb0.9Ta0.1)O3 (x=0.4~0.6) piezoelectric ceramics were prepared by MO method. The influence of K and Na content of KNNLT ceramics is systematically studied. It is found that the ceramics with x=0.4 and x=0.6 have an orthorhombic structure, whereas the ceramics exhibits a tetragonal structure. The ceramics with shows the coexistence of the orthorhombic and tetragonal phase and high piezoelectric properties. K and Na have the effect of enhancing the ceramic sinter-ability, density, and piezoelectric properties. The best composition is obtained, the optimum characteristics. The lead-free piezoelectric ceramics were prepared by BO method. Because the B-site oxides were reacted in advance, it has the high activeness and the diffusibility, the broad sintering temperature in the solid-state reaction processing. Therefore, the ceramic compactness is good, and has the identical kind of composition as compared to the MO method. The piezoelectric characteristics are promoted, presenting the optimum characteristics kp(%), d33. The BO-method preparation also has the potential in the stable temperature characteristic, and the low aged speed than those preparing by MO method.

目次
摘要 I
ABSTRACT II
致謝 III
目次 IV
圖目次 VIII
表目次 X
第一章 前言 1
1.1 緒論 1
1.2 研究動機 2
1.3 無鉛壓電陶瓷 3
1.4 BATIO3 4
1.5 (KNA)NBO3 4
1.6 含鉛壓電陶瓷PZT 6
1.7 論文架構 7
第二章 理論 9
2.1 精密陶瓷 9
2.2鍵結 9
2.3 介電材料與壓電材料 9
2.4 同質異相和轉換 10
2.5 轉換 11
2.6 重組轉換 11
2.7 壓電效應 11
2.8 極化機制 12
2.9 居里溫度 14
2.10 陽離子對導電性之影響 14
2.11 晶體對稱性 15
第三章 製程與量測 16
3.1 實驗步驟 16
3.2 球磨 17
3.3 黏結劑 18
3.4 篩分 19
3.5 篩網 19
3.6 成形壓力 20
3.7 煆燒 22
3.8 燒結 22
3.9 掃描電子顯微鏡 24
第四章 結果與討論 26
4.1 LI0.035(KXNA1-X)0.965(NB0.9TA0.1)O3 (X=0.4~0.6) XRD圖(煆燒:910℃，持溫:4小時) 26
4.2 LI0.035(KXNA1-X)0.965(NB0.9TA0.1)O3 (X=0.4~0.6) XRD圖(燒結:1130℃，持溫:2小時) 27
4.3 LI0.035(KXNA1-X)0.965(NB0.9TA0.1)O3 (X=0.4~0.6) SEM圖(燒結:1130℃，持溫:2小時) 28
4.4 LI0.035(KXNA1-X)0.965(NB0.9TA0.1)O3 (X=0.4~0.6)介電常數與介電損失圖(燒結:1130℃，持溫:2小時，頻率:1KHZ) 29
4.5 LI0.035(KXNA1-X)0.965(NB0.9TA0.1)O3 (X=0.4)溫度對介電常數與介電損失影響圖(燒結:1130℃，持溫:2小時，頻率:1KHZ~1MHZ) 30
4.6 LI0.035(KXNA1-X)0.965(NB0.9TA0.1)O3 (X=0.45)溫度對介電常數與介電損失影響圖(燒結:1130℃，持溫:2小時，頻率:1KHZ~1MHZ) 31
4.7 LI0.035(KXNA1-X)0.965(NB0.9TA0.1)O3 (X=0.5)溫度對介電常數與介電損失影響圖(燒結:1130℃，持溫:2小時，頻率:1KHZ~1MHZ) 32
4.8 LI0.035(KXNA1-X)0.965(NB0.9TA0.1)O3 (X=0.55)溫度對介電常數與介電損失影響圖(燒結:1130℃，持溫:2小時，頻率:1KHZ~1MHZ) 33
4.9 LI0.035(KXNA1-X)0.965(NB0.9TA0.1)O3 (X=0.6)溫度對介電常數與介電損失影響圖(燒結:1130℃，持溫:2小時，頻率:1KHZ~1MHZ) 34
4.10 LI0.035(KXNA1-X)0.965(NB0.9TA0.1)O3 (X=0.4~0.6) TO-T相變點(燒結:1130℃，持溫:2小時)(1KHZ~1MHZ) 35
4.11 LI0.035(KXNA1-X)0.965(NB0.9TA0.1)O3 (X=0.4~0.6) TC相變點(燒結:1130℃，持溫:2小時)(1KHZ~1MHZ) 36
4.12 LI0.035(KXNA1-X)0.965(NB0.9TA0.1)O3 (X=0.4~0.6)溫度對介電常數與介電損失影響圖(燒結:1130℃，持溫:2小時，頻率:1KHZ) 37
4.13 LI0.035(KXNA1-X)0.965(NB0.9TA0.1)O3 (X=0.4~0.6)溫度對介電常數與介電損失影響圖(燒結:1130℃，持溫:2小時，頻率:10KHZ) 38
4.14 LI0.035(KXNA1-X)0.965(NB0.9TA0.1)O3 (X=0.4~0.6)溫度對介電常數與介電損失影響圖(燒結:1130℃，持溫:2小時，頻率:100KHZ) 39
4.15 LI0.035(KXNA1-X)0.965(NB0.9TA0.1)O3 (X=0.4~0.6)溫度對介電常數與介電損失影響圖(燒結:1130℃，持溫:2小時，頻率:1MHZ) 40
4.16頻率:1KHZ~1MHZ，TO-T晶相轉換溫度點LI0.035(KXNA1-X)0.965(NB0.9TA0.1)O3(X=0.4~0.6) 41
4.17 頻率:1KHZ~1MHZ，TC晶相轉換溫度點LI0.035(KXNA1-X)0.965(NB0.9TA0.1)O3(X=0.4~0.6) 42
4.18 壓電電荷常數與機械耦合常數圖(溫度:常溫) LI0.035(KXNA1-X)0.965(NB0.9TA0.1)O3(X=0.4~0.6) 43
第五章 結論 44
參考文獻 45

 
圖目次
圖1-1 陶瓷材料特性 3
圖1-2 鈣鈦礦結構圖 4
圖1-3 壓電陶瓷之應用圖 8
圖2-1 試片進行直流電壓極化內部圖 10
圖2-2 正、逆壓電效應 12
圖2-3 四種不同的極化機制 14
圖3-1 實驗與量測步驟 17
圖3.2 研磨時間對粉粒徑分佈之關係 18
圖3-3 在球磨機中球體運動示意圖 18
圖3-4 壓胚密度與成形壓力的關係 21
圖3-5 粉末成型各階段示意圖 21
圖3-6 典型粉末燒結過程分類示意圖 24
圖4-1 LI0.035(KXNA1-X)0.965(NB0.9TA0.1)O3 (X=0.4~0.6)煆燒910℃之XRD 26
圖4-2 LI0.035(KXNA1-X)0.965(NB0.9TA0.1)O3 (X=0.4~0.6)燒結1130℃之XRD 27
圖4-3 LI0.035(KXNA1-X)0.965(NB0.9TA0.1)O3 (X=0.4~0.6)燒結1130℃之SEM 28
圖4-4 LI0.035(KXNA1-X)0.965(NB0.9TA0.1)O3 (X=0.4)介電常數與介電損失於室溫、頻率1 KHZ之量測 29
圖4-5 LI0.035(KXNA1-X)0.965(NB0.9TA0.1)O3 (X=0.4)溫度對介電常數與介電損失影響圖(1KHZ~1MHZ) 30
圖4-6 LI0.035(KXNA1-X)0.965(NB0.9TA0.1)O3 (X=0.45)溫度對介電常數與介電損失影響圖(1KHZ~1MHZ) 31
圖4-7 LI0.035(KXNA1-X)0.965(NB0.9TA0.1)O3 (X=0.5) 溫度對介電常數與介電損失影響圖(1KHZ~1MHZ) 32
圖4-8 LI0.035(KXNA1-X)0.965(NB0.9TA0.1)O3 (X=0.55)溫度對介電常數與介電損失影響圖(1KHZ~1MHZ) 33
圖4-9 LI0.035(KXNA1-X)0.965(NB0.9TA0.1)O3 (X=0.6)溫度對介電常數與介電損失影響圖(1KHZ~1MHZ) 34
圖4-10 LI0.035(KXNA1-X)0.965(NB0.9TA0.1)O3 (X=0.4~0.6)之低溫轉換點TO-T 35
圖4-11 LI0.035(KXNA1-X)0.965(NB0.9TA0.1)O3 (X=0.4~0.6)之高溫轉換點TC 36
圖4-12 LI0.035(KXNA1-X)0.965(NB0.9TA0.1)O3 (X=0.4~0.6)溫度對介電常數與介電損失影響圖(1KHZ) 37
圖4-13 LI0.035(KXNA1-X)0.965(NB0.9TA0.1)O3 (X=0.4~0.6)溫度對介電常數與介電損失影響圖(10KHZ) 38
圖4-14 LI0.035(KXNA1-X)0.965(NB0.9TA0.1)O3 (X=0.4~0.6)溫度對介電常數與介電損失影響圖(100KHZ) 39
圖4-15 LI0.035(KXNA1-X)0.965(NB0.9TA0.1)O3 (X=0.4~0.6)溫度對介電常數與介電損失影響圖(1MHZ) 40
圖4-16 頻率1KHZ~1MHZ之TO-T相變點圖LI0.035(KXNA1-X)0.965(NB0.9TA0.1)O3 (X=0.4~0.6) 41
圖4-17頻率1KHZ~1MHZ之TC相變點圖LI0.035(KXNA1-X)0.965(NB0.9TA0.1)O3 (X=0.4~0.6) 42
圖4-18 LI0.035(KXNA1-X)0.965(NB0.9TA0.1)O3 (X=0.4~0.6)壓電電荷常數與機械耦合常數 43
 
表目次
表2-1 電子精密陶瓷機能性分類 9
表2-2 壓電陶瓷的各種應用[3] 12
表2-3缺陷:點缺陷、線缺陷、面缺陷、體缺陷與電子缺陷 13
表2-4 不同陽離子擴散時之活化能 15
表3-1 篩網目數與孔徑對照表 20
表3-2 成型壓力和密度的關係 20
表3-3 粉末生產方式 24

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