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研究生:胡希聖
研究生(外文):Shi-sheng Hu
論文名稱:利用溶膠凝膠法披覆二氧化矽奈米薄膜於Ce3+:YAG螢光粉應用於玻璃螢光體之研究
論文名稱(外文):The Study of Ce3+:YAG Phosphor Coating with SiO2 Nano Thin Film by Sol-Gel Processing in Application of Glass Phosphor
指導教授:鄭木海
指導教授(外文):Wood-Hi Cheng
學位類別:碩士
校院名稱:國立中山大學
系所名稱:光電工程學系研究所
學門:工程學門
學類:電資工程學類
論文種類:學術論文
論文出版年:2013
畢業學年度:101
語文別:中文
論文頁數:97
中文關鍵詞:高溫高濕測試高溫加速老化測試玻璃螢光體溶膠凝膠法
外文關鍵詞:damp heat testhigh temperature accelerated agingglass phosphorsol-gel method
相關次數:
  • 被引用被引用:4
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  • 下載下載:34
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本研究利用溶膠凝膠法來提升玻璃螢光體的螢光強度以及降低玻璃內雜質擴散問題。首先將Ce3+:YAG螢光粉周圍包覆上二氧化矽奈米薄膜,再將包覆二氧化矽奈米薄膜的Ce3+:YAG螢光粉與低溫玻璃粉均勻混合,並以700℃燒結成型。而這樣的方法所製作的螢光體稱為溶凝膠玻璃螢光體(SGCeYDG)。
  根據菲涅爾透射理論,可推算出包覆二氧化矽奈米薄膜的Ce3+:YAG螢光粉所產生之螢光經由粉體到環境中(空氣)的穿透率會上升5%,同時產生全反射的角度上升(33°→43°),可減少螢光在粉體內部的全反射機率。本研究利用積分球與螢光光譜儀比較SGCeYDG和一般玻璃螢光體(CeYDG)之量子效率與螢光強度。經量測後發現SGCeYDG相對於CeYDG之量子效率可提升3.95%,螢光強度可提升6.58%。
  藉由SEM、EDS、FTIR與HRTEM等儀器證實本實驗成功將二氧化矽薄膜鍍於Ce3+:YAG螢光粉。此外本實驗利用高溫加速老化測試以及高溫高濕測試來比較SGCeYDG、 CeYDG與矽膠螢光體(CeYDS)的流明損耗與色飄移。經高溫加速老化測試後,SGCeYDG的流明衰減為3.0%和色飄移5.50×10-3,CeYDG的流明衰減為7.00%和色飄移9.60×10-3,CeYDS則已碳化。經高溫高濕測試後,SGCeYDG的流明損耗約為3.35%和色飄移約為0.69×10-3,CeYDG的流明損耗約為5.07%和色飄移約為1.31×10-3,CeYDS的流明損耗約為6.81%和色飄移約為2.46×10-3。綜合以上結果,SGCeYDG的可靠度皆優於其他兩者,具有較好的抗熱性與抗濕性。SGCeYDG未來將可以應用於高功率白光LED的色轉換層材料來提升高功率白光LED模組的可靠度。
In this study, a sol-gel method is used to enhance the fluorescence intensity of the glass phosphor and reduce the problem of impurity diffusion inside the glass. Firstly, the Ce3+:YAG powder was coated with SiO2 nano thin film. The coated Ce3+:YAG powder was mixed uniformly with low temperature glass powder and sintered at 700℃. The glass phosphor is named as sol-gel Ce3+:YAG doped glass (SGCeYDG).
  According to the Fresnel transmission theory, the transmittance of Ce3+:YAG powder coated with SiO2 nano film was 5% higher than Ce3+:YAG powder without coated. Owing to the total internal reflection angle increasing (33°→43°), the total internal reflection of fluorescence will be reduced. A intergrating sphere and a fluorescence spectrometer were employed to measure the quantum efficiency and fluorescence intensity of glass phosphor. In comparison with Ce3+:YAG doped glass (CeYDG) without coated SiO2, the quantum efficiency and fluorescence intensity of SGCeYDG was improved about 3.95% and 6.58%, respectively.
  To verify the micro-structure and composition of SiO2 film, SEM, EDS, FTIR and HRTEM were employed. Furthermore, high temperature accelerated aging test and damp heat test were used to compare the reliability between SGCeYDG, CeYDG and Ce3+:YAG doped silicone (CeYDS). In the reliability test parts, the high temperature accelerated aging test (HTAAT) and damp heat test (DHT) were used to compare the reliability between SGCeYDG, CeYDG and CeYDS. At the HTAAT-450℃, the CeYDS has been carbonized. The lumen loss of SGCeYDG and CeYDG were about 3% and 7%, respectively. The color drift of SGCeYDG and CeYDG were about 5.5×10-3 and 9.6%×10-3, respectively. On the other hand, After the DHT, The lumen loss of SGCeYDG, CeYDG and CeYDS were about 3.35%, 5.07% and 6.81%, respectively. The color shift of SGCeYDG, CeYDG and CeYDS were about 0.69×10-3, 1.31×10-3 and 6.81×10-3, respectively. The results of reliability test exhibited that the lumen loss and color drift of SGCeYDG were lower than CeYDG and CeYDS. Therefore, the SGCeYDG has the potential to apply to develop as the phosphor of high power white LED as its good heat-resistance and moisture-resistance.
中文摘要 i
Abstract. ii
目錄 iv
圖次 vi
表次 ix
第一章 緒論 1
前言 1
1.1 研究背景與動機 2
1.2 研究目標與章節介紹 4
第二章 原理與介紹 5
2.1 LED元件發光原理 5
2.2 螢光粉發光原理 8
2.3 色彩學 12
2.4 白光LED封裝與設計介紹 21
2.5 溶膠凝膠法原理與應用 24
第三章 實驗方法與製程 28
3.1 低溫玻璃材料 28
3.2 螢光體製程 32
3.2.1 玻璃螢光體製程……..……………………………………………….32
3.2.2 溶膠凝膠法製程…………..………………………………………….37
3.2.3 矽膠螢光體製程..…………………………………………………….39
3.4 量測儀器與原理 42
3.4.1 場發射型掃描式電子顯微鏡………………………………………...42
3.4.2 能量散佈分析儀……………………………………………………...44
3.4.3 場發射型穿透式電子顯微鏡………………………………………...46
3.4.4 傅立葉轉換紅外光光譜儀....………………………………………...48
3.4.5 螢光光譜儀…………….…...………………………………………...49
3.4.6 積分球………………….…...………………………………………...51
3.5 可靠度測試 55
第四章 結果與討論 60
4.1 螢光體光學特性分析 60
4.2 螢光體材料特性分析 62
4.3 螢光體可靠度分析 67
4.3.1 高溫加速老化 67
4.3.2 高溫高濕測試 74
第五章 結論 78
參考文獻 80
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