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研究生:楊育哲
研究生(外文):Yu-Che Yang
論文名稱:極化敏感光學同調斷層掃瞄的實驗與應用
論文名稱(外文):Experiment and Application of Polarization Sensitive Optical Coherence Tomography
指導教授:鄭旭志鄭旭志引用關係
指導教授(外文):Hsu-Chih Cheng
學位類別:碩士
校院名稱:國立虎尾科技大學
系所名稱:光電與材料科技研究所
學門:工程學門
學類:電資工程學類
論文種類:學術論文
論文出版年:2013
畢業學年度:101
語文別:中文
論文頁數:52
中文關鍵詞:光學同調斷層掃描極化光雙折射
外文關鍵詞:Optical Coherence TomographyPolarized LightBirefringence
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在科技持續進步的同時,量測技術也持續的進步。在工業技術及醫療科技方面也不斷地朝著準確性,快速,非侵入式掃描的方向前進。而近年來的些許工業檢測樣品以及醫學方面的生物組織樣品皆為雙折射材質,早年量測技術可用超音波或探針來量測,近年來可利用光學檢測方法,將光引入樣品,將所反射的訊號再加以解析,找出其厚度及折射率。傳統的量測架構,無法正確得知雙折射訊息。因此,如何正確,精準、快速的測量出雙折射物體或組織的方法也一直在研究中。

本文主要是利用(PS-OCT)來測量雙折射樣品,使用極化光特性用於光學同調斷層掃描 (Optical Coherence Tomography;OCT)得知雙折射樣品的信息。極化敏感光學同調對層掃描是以傳統OCT架構上再做延伸,可以利用光的偏振特性測量待測物的一種方法。在系統中,可以控制入射光與待測物背向散射光的極化態,加以找出相位延遲以及光強度的圖像,完成了非侵入式掃描且快速,準確,穩定的方式。


At the moment of the advancement of science and technology, the techniques of measurement are continuously progressing simultaneously. It is non-stopping and promising to stride towards the directions of accuracy, quickness and non-invasive ways in the aspects of industrial techniques and medical technology, In recently years,several industrial testing samples and tests from medical biological tissues are both birefringence materials.In early stages,the measuring techniques can be applied to ultrasonic and probe for measurement. Lately, optics measurements can be utilized to make the analyze through the reflective signal coming from the samples cast by the light in order to find out the refractive index.The common structure of measurement cannot correctly receive any information of birefringence, but unable to obtain any information of birefringence,Therefore,the methods of how to accurately and promptly measure the birefringence objects or tissues have been constantly under research.

   This article mainly focuses on the employment of PS-OCT to measure the birefringence samples,and adapt the Polarized Of Light to Optical Coherence Tomography so as to retrieve the information of birefringence samples. The Polarized Optical Coherence Tomography is an extended research from the traditional OCT structure.The Polarization Properties of light can be used as one way of Analyte measurement.In the systems,the polarized states of the incident light and the backscattering light of Analyte can be controlled, and further search out the phase retardation as well as the image of light strength Luminous Instensity so as to complete the non-invasive scaning in a speedy,precise and stable way.


摘要 i
Abstract ii
致謝 iv
目錄 v
表目錄 vii
圖目錄 viii
第一章 緒論 1
1.1前言 1
1.2研究動機與目的 1
1.3文獻回顧 2
1.4論文結構 6
第二章 光學同調斷層掃描技術背景與原理介紹7
2.1簡介 7
2.2光學同調斷層掃描 7
2.3時域光學同調斷層掃描技術 9
2.4頻域光學同調斷層掃描技術11
2.5極化敏感光學同調斷層掃描技術13
2.6光的偏振態及Jones向量表示法13
2.6.1光的偏振態16
2.6.2 Jones向量表示法17
2.7光學同調斷層掃瞄之系統解析18
2.7.1縱向解析度18
2.7.2橫向解析度18
2.7.3景深19
2.7.4光路徑長度19
第三章 極化敏感OCT系統架構21
3.1研究架構與儀器介紹21
3.2極化敏感OCT的理論分析23
3.3實驗數據彙整與分析27
3.4實驗結果35

第四章 結論45
參考文獻46
英文大綱(Extended Abstract)49


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