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研究生:李俊昇
研究生(外文):Lee, Chun-Sheng
論文名稱:運用趨勢特徵擷取法建構預測性維修決策模型
論文名稱(外文):Developing a Predictive Maintenance Model by Trend Attribute Extraction
指導教授:劉敦仁劉敦仁引用關係
指導教授(外文):Liu, Duen-Ren
學位類別:碩士
校院名稱:國立交通大學
系所名稱:管理學院資訊管理學程
學門:電算機學門
學類:電算機一般學類
論文種類:學術論文
論文出版年:2013
畢業學年度:102
語文別:英文
論文頁數:35
中文關鍵詞:predictive maintenance
外文關鍵詞:predictive maintenance
相關次數:
  • 被引用被引用:1
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  • 下載下載:46
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Although numerous attempts have been made on the study of predictive maintenance, little is known about to develop a predictive model that can detect the failure for the machines that run at different conditions.
One of the major reasons is that a machine’s failure mode strongly depends on the customer’s machine parameter setting. Some customers run machine at tight specifications while others run different specifications for their operation of purposes. It is difficult to develop a golden predictive model that can applicable for all machines the run under different condition settings.
Moreover, the ‘failure data’ for model building is unexplained or difficult to acquire. The poor quality of ‘failure data’ will increase the difficulty of analysis on the predictive model, and could lead to wrong decision.
A new un-supervised modeling approach - Trend Attribute Extraction based Predictive Modeling (TAE-PM) is proposed to detect the potential machine failures. Compared with traditional predictive maintenance modeling, the presented methodology shows its adaptability and effectiveness to a gradually deteriorating system.

Although numerous attempts have been made on the study of predictive maintenance, little is known about to develop a predictive model that can detect the failure for the machines that run at different conditions.
One of the major reasons is that a machine’s failure mode strongly depends on the customer’s machine parameter setting. Some customers run machine at tight specifications while others run different specifications for their operation of purposes. It is difficult to develop a golden predictive model that can applicable for all machines the run under different condition settings.
Moreover, the ‘failure data’ for model building is unexplained or difficult to acquire. The poor quality of ‘failure data’ will increase the difficulty of analysis on the predictive model, and could lead to wrong decision.
A new un-supervised modeling approach - Trend Attribute Extraction based Predictive Modeling (TAE-PM) is proposed to detect the potential machine failures. Compared with traditional predictive maintenance modeling, the presented methodology shows its adaptability and effectiveness to a gradually deteriorating system.

ABSTRACT II
ACKNOWLEDGEMENT III
TABLE OF CONTENTS IV
LIST OF FIGURES V
LIST OF TABLES V
1 INTRODUCTION 1
1.1 LITHOGRAPHY SYSTEM BACKGROUND 1
1.2 THE CHALLENGES OF PREDICTIVE MAINTENANCE 2
1.3 MOTIVATION AND GOALS 4
2 LITERATURE REVIEW 6
2.1 PREDICTIVE MAINTENANCE REVIEW 6
2.2 TREND ANALYSIS REVIEW 7
2.3 SEMICONDUCTOR EQUIPMENT PERFORMANCE MEASUREMENT 9
2.3.1 RELIABILITY 10
2.3.2 AVAILABILITY 10
3 TREND ATTRIBUTE EXTRACTION BASED PREDICTIVE MODELING (TAE-PM) 11
3.1 CONCEPT OF METHODOLOGY 11
3.2 RESEARCH FRAMEWORK 12
3.3 MODELING PREPARATION 13
3.3.1 THE DATA SOURCE 13
3.3.2 DATA COLLECTION AND PREPROCESS 14
3.4 TREND ANALYSIS MODELING 15
3.5 MODEL VALIDATION AND EXECUTION 19
4 EVALUATION – THE CASE STUDY 20
4.1 TREND MODELING CASE STUDY 21
4.2 MODEL VALIDATION – HISTORICAL DATA 27
4.3 MODEL DEPLOYMENT 29
4.4 MODEL VALIDATION – REAL CASE 30
5 CONCLUSION 33

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