本篇論文是在探討有機半導體碳60和鐵磁性金屬鈷介面的磁特性，期望對未來有機自旋閥元件的發展能有所貢獻。選擇碳60分子的原因在於其結構穩定且被認為能夠讓自旋載子在傳輸過程中維持良好的自旋極化率，為發展自旋電子元件的潛力材料。本實驗樣品的製備方式係利用自製的碳60熱蒸鍍槍來製備碳60超薄膜(鍍率約1Å/min)；將其蒸鍍於已經具有室溫鐵磁性的Cu(100)/8 ML Co超薄膜結構上。利用X光光電子顯像式顯微術(X-PEEM)來量測此介面的電子結構及其磁特性。
實驗發現鈷和碳60的介面之間有電荷轉移的現象。根據此結果，我們探討碳60會不會因此而出現磁性特徵。實驗發現在低溫120K時C K-edge顯現出明顯的XMCD現象。這證實了鈷和碳60之間確實具有磁性的耦合。

第1章 緒論 1
1.1 前言 1
1.2 研究動機及文獻回顧 2
第2章 研究理論背景 7
2.1 磁學背景 7
2.1.1 磁性材料 7
2.1.2 鐵磁性金屬-鈷 10
2.2 有機半導體-碳60 10
2.3 自旋鬆弛 (SPIN RELAXATION) 11
2.3.1 自旋軌道交互作用 (Spin-Orbit Interaction) 12
2.3.2 超精細交互作用 (Hyperfine Interaction) 13
2.4 X光的圓偏振二向性現象 (X-RAY MAGNETIC CIRCULAR DICHROISM, XMCD) 14
第3章 實驗設備與儀器操作原理 17
3.1 同步輻射光源(SYNCHROTRON RADIATION) 18
3.2 歐傑電子能譜儀(AUGER ELECTRON SPECTROSCOPY, AES) 19
3.3 低能量電子繞射儀(LOW ENERGY ELECTRON DIFFRACTION, LEED) 21
3.4 中能量電子繞射儀(MEDIUM ENERGY ELECTRON DIFFRACTION, MEED) 23
3.5 碳60蒸鍍槍及石英晶體震盪器(QUARTZ CRYSTAL MICROBALANCE, QCM) 25
3.5.1 碳60蒸鍍槍 25
3.5.2 石英震盪器 26
3.6 X光顯像式電子顯微術 (X-RAY PHOTONEMISSION ELECTRON MICROSCOPY, X-PEEM) 及近緣X光吸收精細結構光譜 (NEAR EDGE X-RAY ABSORPTION FINE STRUCTURE, NEXAFS) 27
3.6.1 X光顯像式電子顯微鏡 27
3.6.2 近緣X光吸收精細結構光譜 28
3.6.3 XMCD-PEEM成像原理 30
第4章 實驗系統 : CU(100)/CO/C60 32
4.1 實驗系統 32
4.1.1 超高真空系統 32
4.1.2 超薄膜結構Co/C60的製備 33
4.2 實驗流程 33
4.2.1 銅單晶Cu(100)的清潔 33
4.2.2 樣品製備 35
4.2.3 量測流程 35
第5章 結果與討論 38
5.1 CU(100)/CO/MONOLAYER C60的製備及電子結構 38
5.1.1 Cu(100)/8 ML Co/C60 退火前後的C K-edge電子結構 38
5.1.2 Cu(100)/8 ML Co/monolayer C60的C K-edge、Co L-edge電子結構 41
5.2 室溫下CO/C60介面的巨觀磁特性 – CU(100)/8 ML CO/C60的NEXAFS 44
5.3 室溫下CO/C60介面的微觀磁特性 – CU(100)/8 ML CO/C60的PEEM微區影像及微區光譜 47
5.3.1 微區吸收光譜的XMCD效應 47
5.3.2 PEEM的微區影像 50
5.4 低溫下CO/C60介面的NEXAFS及微磁區影像 52
第6章 結論及未來展望 55

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