臺灣博碩士論文加值系統

隨著消費者需求的增加與電子技術的發展，微型化電子裝置、移動式電子裝置已經徹底融入每個人的生活，但這些移動式電子裝置與傳統使用外部測試儀器進行測試的方法卻格格不入，此類產品尚無一能在手邊沒有外部測試儀器的場合也能進行測試的方法，此問題的重要性在一些需極高可靠性之穿戴式醫療電子裝置或車用電子裝置則更為突出。
本篇論文實現一具備獨立測試、快速驗證及操作簡易等三大特性之獨立自動測試平台，其能主動讀取位於外部儲存裝置之測試資料、對待測試電路進行掃描測試與顯示測試結果於外接螢幕，整體操作僅需使用者提供一致能訊號即可完成。此平台建立使用者為導向之簡單操作機制並為注重高度安全性之移動式電子裝置提供高可靠性之保證，亦可推廣應用於各種移動式電子裝置。
另外，本篇論文亦實現一硬體除錯技術中事件觸發技術之實際應用軟體工具。事件觸發技術被應用於監測一個電路或系統的狀態，當一個核心或系統的狀態滿足用戶所指定的事件或條件時，一些預先被設定好的除錯動作將會被觸發。此軟體工具與本實驗室開發之除錯硬體結合，提供一有效應用於現場可程式化閘陣列之除錯解決方案。

Mobile electronics have become a portion of everyone’s life. However testing these electronics in field is not easy as the current test techniques rely on non-mobile automatic test equipment. Addressing this problem is urgent as more and more wearable medical electronics that require timely test to ensure their high reliability are desired nowaday.
In this work, we develop a test platform that have the features of autonomous test, quick verification and simple operation. This platform can access external storage, perform scan test for the circuits under test, and show the test results on external display panel under the control of a simple external enable signal, thereby enabling the highly-desired in-field testing. This test platform is a user-oriented design and can be popularized to almost all kinds of mobile electronics.
In addition, in this thesis we also develop a software tool to support an event-trigger-based hardware debugger, where the event-trigger technique is used to monitor the states of a core or system under the users’ command. When a user-specified event or condition is satisfied, a pre-defined debugging operation will be activated so as to help the debugging of hardware of interest. This software tool has been integrated into a commercial field-programmable-gate-array based (FPGA-based) debug tool which can greatly improve the debug of an electronic system being developed in a FPGA prototyping platform.

CHAPTER 1 INTRODUCTION 1
CHAPTER 2 PREVIOUS WORK 3
2.1. ON-CHIP TESTING 3
2.2. IN-FIELD TESTING 4
CHAPTER 3 ON-CHIP AUTONOMOUS TEST PLATFORM 8
3.1. OVERVIEW OF ON-CHIP AUTONOMOUS TEST PLATFORM 8
3.2. TEST PROCEDURES OF ON-CHIP AUTONOMOUS TEST PLATFORM 10
CHAPTER 4 IMPLEMENTATION OF THE ON-CHIP AUTONOMOUS TEST PLATFORM 13
4.1. OVERALL ARCHITECTURE OF ON-CHIP AUTONOMOUS TEST PLATFORM 13
4.2. DESIGNS FOR TAM CONTROLLER 14
4.2.1. Control Unit 14
4.2.2. Setup Register Unit 15
4.2.3. AHB Interface Unit 15
4.2.4. Shift Buffer Unit 15
4.2.5. Decoding Unit 15
4.2.6. Compare Unit 16
4.2.7. Local Memory Unit 16
4.2.8. JTAG Unit 16
4.3. DESIGNS FOR TEST PROCEDURE CONTROLLER 16
4.4. DESIGNS FOR EXTERNAL STORAGE ACCESS 18
4.4.1. Control Unit 19
4.4.2. Command Sender 20
4.4.3. Master/Slave Interface 21
4.5. DESIGNS FOR DISPLAY PANEL 21
4.5.1. Control Unit 22
4.5.2. Page Data Prepare Unit 22
4.5.3. Data Transmitter/SPI Interface 23
CHAPTER 5 SOFTWARE TOOL FOR FPGA-BASED DEBUGGER 24
5.1. OVERVIEW OF SOFTWARE TOOL 24
5.2. FRAMEWORK OF SOFTWARE TOOL 26
5.3. OPERATING PROCEDURE OF SOFTWARE TOOL 27
CHAPTER 6 EXPERIMENTAL RESULTS 29
6.1. EXPERIMENTAL ENVIRONMENT 29
6.2. EMULATION RESULTS 30
6.3. SYNTHESIS RESULTS OF ON-CHIP AUTONOMOUS TEST PLATFORM 31
CHAPTER 7 CONCLUSIONS 32
REFERENCE 33

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