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研究生:梁能凱
研究生(外文):Neng-KaiLiang
論文名稱:基於模型預測控制法於精密追跡之實現與驗證-以原子力顯微鏡為例
論文名稱(外文):The Implementation and Verification of Model Predictive Control for Precision Tracking- an Example with the AFM
指導教授:田思齊
指導教授(外文):Szu-Chi Tien
學位類別:碩士
校院名稱:國立成功大學
系所名稱:機械工程學系
學門:工程學門
學類:機械工程學類
論文種類:學術論文
論文出版年:2015
畢業學年度:103
語文別:中文
論文頁數:130
中文關鍵詞:模型預測控制圖形使用者介面實時資料交換原子力顯微鏡
外文關鍵詞:Model Predictive ControlGraphical User InterfaceReal Time Data ExchangeAtomic Force Microscope
相關次數:
  • 被引用被引用:0
  • 點閱點閱:153
  • 評分評分:
  • 下載下載:30
  • 收藏至我的研究室書目清單書目收藏:0
本研究以原子力顯微鏡為例,以模型預測控制器來達成精密追跡的目標,並獲得最佳化輸入。透過控制原子力顯微鏡的 z 軸致動器來追蹤樣品形貌。此外,藉由Microsoft Foundation Class(MFC)軟體設計之圖形使用者介面(GUI)與原子力顯微鏡整合,並利用實時資料交換(Real Time Data eXchange,RTDX)實現主/從處理器間的資料傳輸,使系統的操作上更為簡便如直接。實驗結果顯示,設計之控制器可達到精確地追蹤樣品形貌,且
兼顧性能與輸入的最佳化控制。
This research utilizes model predictive control to achieve precision tracking with optimal input, and demonstrates this method with an atomic force microscope
example. By controlling the actuator of the atomic force microscope in z-axis, the sample topography can be tracked. Besides, a graphical user interface(GUI) constructed with Microsoft Foundation Class (MFC) is integrated with the atomic force microscope and the data exchange between the master and the slave processors
is implemented with real time data exchange technique. Therefore, the overall system becomes more convenient and intuitive for operation. Experimental results show that the proposed controller can track the sample topography precisely with the optimal consideration on both performance and input.
圖目錄 iii
表目錄 vii
符號表 viii
第一章 緒論 1
1.1 研究動機 1
1.2 論文架構 3
第二章 原理與問題 4
2.1 原子力顯微鏡原理 4
2.2 問題描述 9
第三章 系統架構 14
3.1 二維壓電定位平台 14
3.2 步進馬達升降平台 19
3.3 探針驅動系統 20
3.4 光路感測系統 23
3.5 圖形使用者介面 25
3.5.1 介面的介紹與建立 25
3.5.2 RTDX通訊傳輸數據 31
第四章 控制理論與模擬 34
4.1 模型預測控制 34
4.2 系統建模 44
4.2.1 二維壓電平台動態系統建模 44
4.2.2 z 軸探針系統建模 50
4.3 二維壓電平台的控制 57
4.4 z 軸系統控制 62
第五章 實驗與討論 77
5.1 實驗設備與實驗流程 77
5.1.1 實驗設備 78
5.1.2 實驗流程 86
5.2 實驗結果 87
5.3 討論 100
第六章 結論與展望 105
6.1 結論 105
6.2 未來工作 105
參考文獻 106
附錄A 電路圖 111
附錄B 實驗器材規格 116
附錄C 校正數據 123
附錄D 權重W 126
附錄E 控制模擬比較 127
附錄F 掃描實驗比較 129
附錄G 圖形使用者介面 130
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