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研究生:陳敬宇
研究生(外文):Jing-Yu Chen
論文名稱:考慮實體資訊並應用於缺陷診斷之關鍵路徑追蹤
論文名稱(外文):Physical-aware Critical Path Tracing for Defect Diagnosis
指導教授:李建模
指導教授(外文):Chien-Mo, Li
口試委員:呂學坤饒建奇陳柏瑞
口試委員(外文):Shyue-Kung LuJiann-chyi RauPo-Juei Chen
口試日期:2015-07-24
學位類別:碩士
校院名稱:國立臺灣大學
系所名稱:電子工程學研究所
學門:工程學門
學類:電資工程學類
論文種類:學術論文
論文出版年:2015
畢業學年度:103
語文別:英文
論文頁數:54
中文關鍵詞:診斷實體資訊關鍵路徑追蹤
外文關鍵詞:diagnosisphysical-awarecritical path tracing
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這篇論文針對缺陷診斷提出一個考慮實體資訊的關鍵路徑追蹤技術,為了處理遮蔽效應、增強效應和拜占庭效應,提出了導線片段和基於導線片段之錯誤模擬的觀念。為了處理扇出重新聚合的問題,提出了反向支配者的概念。在三個ISCAS’89和ITC’99電路上,複數導線斷路缺陷的實驗證明了我們的技術有效。我們技術的平均準確率(0.87)較傳統的關鍵路徑追蹤的平均準確率(0.81)來的高,我們技術的平均解析度(3.9)也較傳統的關鍵路徑追蹤的平均解析度(5.59)來的好。

This thesis presents a physical-aware critical path tracing technique for defect diagnosis. To cope with masking effect, reinforcement effect, and Byzantine effect, the concept of section and section-based fault simulation are proposed. To solve fanout reconvergence problem, the idea of reverse dominator is proposed. Simulation on three ISCAS’89 and ITC’99 benchmark circuits with multiple open defects demonstrate the effectiveness of our technique. The average accuracy of our technique (0.87) is higher than traditional critical path tracing technique’s (0.81). Our technique also has better resolution (3.9) than traditional critical path tracing technique’s (5.59)

Chapter 1 Introduction 1
1.1 Motivation 1
1.2 Proposed Techniques 5
1.3 Contributions 6
1.4 Organization 8
Chapter 2 Background 9
2.1 Prior Work in Multiple defects Diagnosis 9
2.2 Masking and Reinforcement Effects 11
2.3 Byzantine Effect 12
2.4 Pin-Based Fault Simulation 13
2.5 Critical Path Tracing 16
Chapter 3 Proposed Techniques 19
3.1 Overall Flow 19
3.2 Key Concept 23
3.2.1 Section 23
3.2.2 Section-Based Fault Simulation and Seed Section 24
3.2.3 Reverse Dominator 28
3.3 Seed Section Tracing 29
3.4 Multiple Defect Physical-aware Diagnosis 35
3.4.1 Compressed Diagnosis Dictionary 35
3.4.2 Single Location In a Cluster (SLIC) 36
3.4.3 Defect Mapping 39
Chapter 4 Experimental Results 41
4.1 Simulation Setup 41
4.2 Simulation Results 43
4.2.1 Comparison of APR between SST and CPT 43
4.2.2 Comparison of Diagnosis Result between SST and CPT 45
4.2.3 Fault Simulation Cost Reduction 47
4.2.4 Diagnosis Result of MD-PhD 49
Chapter 5 Conclusion and Future Work 51
References 53


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[Chen 2015]Po-Hao Chen, “Multiple defects Physical-aware Diagnosis with Novel Dictionary,” National Taiwan Unversity, 2015
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[Nangate 09]“Nangate 45nm Opec Cell Library,” http://www.nangate.com


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