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[1]呂紹旭,光運雙月刊2012年1月,No 97。 [2]許世傑,科學月刊2014年3月27日。 [3]L. Chuang , “Optical Gain of strained wurtziteGaN quantum-well lasers,”IEEE J.Quantum Electron.,32,1791(1996) [4]E. H. Rhoderick, R. H. Williams, Metal-Semiconductor Contacts, Clarendon Press. Oxford (1998) [5]S. M. Sze, Semiconductor Device Physics and Technology, pp.160 (1985) [6]A. Schmitz, A Ping, M. Khan,Q. chen,J. Yang, and I.Adesida, “Metal contacts to n-type GaN”,Journal of Electronic Materials, vol.27,pp.255-260,(1998) [7]R. Roy, V. G. Hill, E. F. Osborn, “Polymorphism of Ga2O3 and the System Ga2O3-H2O”, Journal of the America Ceramic Society, vol. 74, pp. 719-722 (1952) [8]S. Geller, “Crystal structure of β- Ga2O3”, The Journal of Chemical Physics, vol. 33, pp. 676-684 (1990). [9]E. G. Villora, M. Yamaga, T. Inoue, S. Yabasi, Y. Masui, T. Sugawara, T. Fukuda, “Optical spectroscopy study on β- Ga2O3”, Japanese Journal of Applied Physics, vol. 41, pp. 622-625 (2002). [10]M. Orita, H. Hiramatsu, H. Ohta, M. Hirano, and H. Hosono, “Electrical conductivity control in transparent p-type (LaO)CuS thin films prepared by rf sputtering”, Thin Solid Films, vol. 411, pp. 134 (2002). [11]Z. Yu, C. D. Overgaard, R. Droopad, M. Passlack and J. K. Abrokwah, “Growth and physical properties of Ga2O3 thin films on GaAs(001) substrate by molecular-beam epitaxy” Applied Physics Letter. vol. 82, pp. 2978 (2003). [12]H. W. Kim, N. H. Kim, “Annealing effects on the properties of Ga2O3 thin films grown on sapphire by MOCVD”, Applied Surface Science, vol. 230, pp. 301 (2004). [13]Z. Li, C. de Groot, J. H. Moodera, “Gallium oxide as an insulating barrier for spin-dependent tunneling junctions”, Applied Surface Science. vol. 77, pp. 3630-3632 (2000). [14]M. Higashiwaki, K. Sasaki, T. Kamimura, M. H. Wong, D. Krishnamurthy, A. Kuramata, T. Masui, S. Yamakoshi, “Depletion-mode Ga2O3 metal-oxide-semiconductor field-effect transistorson β-Ga2O3 (010) substrates and temperature dependence of their device characteristics”, Applied Physics Letter, vol. 103, pp. 123511 (2013). [15]P. Feng, J. Y. Zhang, Q. H. Li, T. H. Wang, “Individual β-Ga2O3 nanowires as solar-blind photodetectors”, Applied Physics Letter, vol. 88, pp. 153107(2006). [16]A. R. Phani, S. Santucci, S. Di Nardo, L. Lozzi, M. Passacantando, P. Picozzi, “Preparation and characterization of bulk ZnGa2O4”, Journal of Materials Science, vol. 33, pp. 3969-3973 (1998). [17]M. Vasile, C. Ianasi, A. –V. Birdeanu, E. Vasile, “Structural properties of undoped and doped with Er3+ ions ZnGa2O4 nanomaterials obtained by hydrothermal method”, Journal of Optoelectronic and Advanced Materials, vol. 13, no. 10, pp. 1273-1278 (2011). [18]B. Qiao, Z. L. Tang, Z. T. Zhang, L. Chen, “Study on ZnGa2O4:Cr3+ a.c. powder electroluminescent device”, Materials Letters, vol. 61, pp. 401-404 (2007). [19]S. M. Chung, S. H. Hanb, Y. J. Kimb, “Characterization of compositional variation and luminescence of ZnGa2O4:Mn thin film phosphor” Materials Letters, vol. 59, pp. 786-789 (2005). [20]R. Roy, V. G. Hill, E. F. Osborn, “Polymorphism of Ga2O3 and the System Ga2O3-H2O”, Journal of the America Ceramic Society, vol. 74, pp. 719-722 (1952). [21]K. Matsuzaki, H. Hiramatsu , K. Nomura, H. Yanagi, T. Kamiya, M. Hirano, H. Hosono, “Growth, structure and carrier transport properties of Ga2O3 epitaxial film examined for transparent field-effect transistor”, Thin Solid Films, vol. 496, pp. 37–41 (2006). [22]中國藝術網,尖晶石結構與尖晶石硬度你了解多少?, (2015)。 [23]林子豪,長庚大學碩士論文, (2005)。 [24]施敏 原著,張俊彥 翻著,半導體元件物理與製程技術,第三版,高立圖書有限公司,台北,台灣,pp192-206,2000 [25]E. Letts, T. Hashimoto, M. Ikari, and Y. Nojima, “Development of GaN wafers for solid-state lighting via the ammonothermal method”, Journal of Crystal Growth,vol.350,pp-66-68,jul 2012. [26]F. A. Kish, D. A. Vanderwater, D. C. DeFevere, D. A. Steigerwald, G. E. Hofler, K. G. Park, and F. M. Steranka, "Highly reliable and efficient semiconductor wafer-bonded AlGaInP/GaP light-emitting diodes," Electronics Letters, vol. 32, pp. 132-134, 1996. [27]12V. M. Bermudez, "Study of oxygen chemisorption on the GaN(0001)-(1x1) surface," Journal of Applied Physics, vol. 80, pp. 1190-1200, Jul 1996. [28]Z. L. Li, X. D. Hu, C. Ke, R. J. Nie, X. H. Luo, X. P. Zhang, T. J. Yu, B. Zhang, C. Song, Z. J. Yang, Z. Z. Chen, and G. Y. Zhang, "Preparation of GaN-based cross-sectional TEM specimens by laser lift-off," Micron, vol. 36, pp. 281-284, 2005.
[29]史光國 著,半導體發光二極體及固體照明,全華圖書股份有限公司,台灣,pp.10-82,2010。 [30]P. N. Arne Roos, P. Nostell, D. Ronnow and A. Roos, “Single-beam integrating sphere spectrophotometer for reflectance andstransmittance measurements versus angle of incidence in the solar wavelength range on diffuse and specular samples”, Rev. Sci. Instrum, vol. 70, p. 2481, 1999. [31]陳隆建,發光二極體之原理與製程,台灣,2006。 [32]R.H. Horng, K.C. Shen, Y.W. Kuo and D.S. Wuu, "Effects of Cell Distance on the Performance of GaN High-Voltage Light Emitting Diodes," ECS Solid State Letters, vol. 1, pp. 21-23, 2012. [33]P. N. Arne Roos, P. Nostell, D. Ronnow and A. Roos, “Single-beam integrating sphere spectrophotometer for reflectance andstransmittance measurements versus angle of incidence in the solar wavelength range on diffuse and specular samples”, Rev. Sci. Instrum, vol. 70p. 2481, 1999. [34]T. Ding, A. P. J. Middelberg, T. Huber and R. J. Falconer,“Far-infrared spectroscopy analysis of linear, cyclic peptides, and lysozyme”, Vib. Spectrosc, vol. 61, pp. 144-150, 2012. [35]黃英碩,科儀新知第二十六卷第四期,94.2 , 2008。 [36]陳隆建 著,發光二極體之原理與製程,台灣,2006。
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