|
[1] S. Nakamura, M. Senoh, N. Iwasa, S.-I. Nagahama, Jap. J. of Appl. Phys. 35, 797 (1995) [2] S. Nakamura, M. Senoh, S.-I Nagahama, N. Iwasa, T. Yamada, T. Matsushita, Jap. J. of Appl. Phys. 35, 74 (1996) [3] S. Nakamura, T. Mukai, M. Senoh, Appl. Phys. Lett. 64, 1687 (1994) [4] S. Guha, N. A. Bojarczuk, Appl. Phys. Lett. 72, 415 (1998) [5] B.H. Le, S. Zhao, N. H. Tran, Z. Mi, Appl. Phys. Lett. 105, 231124 (2014) [6] U. K. Mishra, L. Shen, T. E. Kazior, Proceedings of the IEEE. 96, 287 (2008) [7] Y. F. Wu, D. Kapolnek, J. P. Ibbetson, P. Parikh, B. P. Keller, U. K. Mishra, IEEE Transactions On Electronic Devices. 48, 586 (2001) [8] H. Amano, N. Sawaki, I. Akasaki, Appl. Phys. Lett. 48, 353 (1986) [9] K. Hiramatsu, S. Itoh, H. Amano, I. Akasaki, N. Kuwano, T. Shiraishi, K. Oki, J. Cryst. Growth 115, 628 (1991) [10] H. Amano, I. Akasaki, K. Hiramatsu, N. Koide, N. Sawak, Thin Solid Films 163, 415 (1988) [11] H. Amano, T. Asahi, I. Akasaki, Jpn. J. Appl. Phys. 29, 205 (1990) [12] David J. Smith, D. Chandrasekhar, Appl. Phys. Lett. 67, 1830 (1995) [13] W. C. Hughes, W. H. Rowland, Jr., M. A. L. Johnson, Shizuo Fujita, J. W. Cook, Jr., J. F. Schetzina, J. Vac. Sci. Technol. B 13, 1571 (1995) [14] I. Lo, C. H. Hsieh, Y. C. Hsu, W. Y. Pang, M.C. Chou, Appl. Phys. Lett. 94, 062105 (2009) [15] T. Ishii, Y. Tazoh, S. Miyazawa, J. Cryst. Growth 189, 208 (1998) [16] X. Gu, M. A. Reshchikov, A. Teke, D. Johnstone, H. Morkoc, B. Nemeth, J. Nause, Appl. Phys. Lett. 84, 2268 (2004) [17] HadisMorkoç, Handbook of Nitride Semiconductors and Devices, (WILEY-VCH, Germany, 2008), Chap. 1, pages 2-10. [18] F. Bernardini, V. Fiorentini, Phys. Rev. B. 56, 10025 (1997) [19] R. Zhang, H. Lin, Y. Yu, D. Chen, J. Xu, Y. Wang, Laser Photonics Rev. 8, 158 (2014) [20] S. Nakamura, M. Senoh, N. Iwasa, S. I. Nagahama, Jap. J. of Appl. Phys 34, L797-799 (1995) [21] F.A. Ponce, D.P. Bour, Nature 386, 351 (1997) [22] HadisMorkoç, Handbook of Nitride Semiconductors and Devices, (WILEY-VCH, Germany, 2008), Chap. 1, pages 90-97 [23] M.Asif Khan, A. Bhattarai, J.H. Kuznia, D.T Olson, Appl. Phys. Lett. 63, 1214 (1993) [24] Y. C. Hsu, I. Lo, C. H. Shih, W. Y. Pang, C. H. Hu, Y. C. Wang, Mitch M. C. Chou, Appl. Phys. Lett. 100, 242101 (2012) [25] T. l. Tansley, C. P. Foleya, J. Phys. Lett. 59, 3241 (1986) [26] Y. Nanishi, Y. Saito, T. Yamaguchi, Jap. J. of Appl. Phys 42, 2549 (2003) [27] J.Wu, J. Phys. Lett. 106, 011101 (2009) [28] P. Waltereit, O. Brandt, A. Trampert, H. T. Grahn, J. Menniger, M. Ramsteiner, M. Reiche, K. H. Ploog, Nature. 406,865 (2000) [29] S. F. Chichibu, A. Uedono1, T. Onuma,, H. Amano, I. Akasaki, J.Han,T.Sota, nature materials 5 801(2006) [30] C. H. Hsieh, I. Lo, M. H.Gau, Y. L. Chen, M. C. Chou, W. Y.Pang, Y. I. Chang, Y. C. Hsu, M. W. Sham, J. C.Chiang, J. K.Tsai, Jap. J. of Appl. Phys. 47, 891(2008) [31] C. H. Shih, I. Lo, W. Y. Pang, Y. C. Wang, M.C. Chou, Thin Solid Films. 519, 3569 (2011). [32] Qian Sun, Soon-Yong Kwon, Zaiyuan Ren, Jung Han, Takeyoshi Onuma, Shigefusa F. Chichibu, Shaoping Wang, Appl. Phys. Lett. 92, 051112 (2008) [33] HadisMorkoç, Handbook of Nitride Semiconductors and Devices, (WILEY-VCH, Germany, 2008), Chap. 3, pages 323-380. [34] R. Schuber, M.M.C. Chou, D.M. Schaadt, Thin Solid Films. 518, 6773 (2010) [35] M. D. Craven, F. Wu, A. Chakraborty, B. Imer, U. K. Mishra, S. P. DenBaars, J. S. Specka, Appl. Phys. Lett. 84, 1281 (2002) [36] T. Kawashima, T. Nagai, D. Iida, A. Miura, Y. Okadome, Y. Tsuchiya, M. Iwaya, S. Kamiyama, H. Amano, I. Akasaki, Cryst. Growth. 298, 261 (2007) [37] S. K. Hong, H. J. Ko, Y. Chen, T. Hanada, T. Yao, J. Vac. Sci. Technol. B. 18, 2313(2000) [38] J.N. Dai, X.Y. Han, Z.H. Wu, C.H. Yu, R.F. Xiang, Q.H. He, Y.H. Gao, C.Q. Chen , X.H. Xiao, T.C. Peng, Journal of Alloys and Compounds. 489,519(2010) [39] Atsushi Kobayashi, Satoshi Kawano, Yuji Kawaguchi, Appl. Phys. Lett. 90, 041908 (2007) [40] SuviSärkijärvi, Sakari Sintonen, Filip Tuomisto, Markus Bosund, Sami Suihkonen , Harri Lipsanen, Cryst. Growth. 398, 18 (2014) [41] C. Y. Chang, H. M. Huang, Y. P.Lan, T. C. Lu, L. W. Tu, W. F. Hsieh, Cryst. Growth Design. 13, 3098 (2013). [42] K. Nakahara, H. Takasu, P. Fons, A. Yamada, K. Iwata, K. Matsubara, R. Hunger, S. Niki, Appl. Phys. Lett. 79 , 4139 (2001) [43] Y. Xia, J. Brault, P. Vennéguès, M. Nemoz, M. Teisseire, M. Leroux, J.-M.Chauveau, Cryst. Growth. 388, 35(2014) [44] T. Yao, S. K. Hong, Oxide and Nitride Semiconductors, (Springer, Germany, 2008), Chap. 7, pages 313-315 [45] B. Liu, R. Zhang, Z. L. Xie, J. Y. Kong, J. Yao, Q. J. Liu, Z. Zhang, D. Y. Fu, X. Q. Xiu, P. Chen, P. Han, Y. Shi, Y. D. Zheng, S. M. Zhou, G. Edwards, Appl. Phys. Lett. 92, 261906 (2008) [46] S. Ghosh, P. Waltereit, O. Brandt, H.T. Grahn, K.H. Ploog, Phys. Rev. B 65, 075202 (2002) [47] M. A. Reshchikova, H.Morkoc, J. Appl. Phys. 97, 061301(2005) [48] P. A. Rodnyi, I. V. Khodyuk, Optics and Spectroscopy. 111, 776 (2011) [49] M.Kumar,T. H. Kim, S. S. Kim, B. T. Lee, Appl. Phys. Lett. 89, 112103(2006) [50] R. Armitage, H. Hirayama, Appl. Phys. Lett. 92, 092121 (2008) [51] R. Armitage, M. Horita, J. Suda, T. Kimoto, J. Appl. Phys. 101, 033534 (2007) [52] X. Ni, M. Wu, J. Lee, X. Li, A. A. Baski, Ü. Özgür, H. Morkoçb, Appl. Phys. Lett. 92, 111102(2009) [53] N. F. Gardner, J. C. Kim, J. J. Wierer, Y. C. Shen, M. R. Krames, Appl. Phys. Lett. 86, 111101 (2005) [54] M. Marezio, Acta Crystallogr 18, 481(1965). [55] R. Schuber, M.M.C. Chou, D.M. Schaadt, Cryst. Growth. 388, 6773 (2010) [56] R. Schuber, Y.L. Chen, C.H. Shih, T.H. Huang, P. Vincze, I. Lo, L.W. Chang,Th. Schimmel, M.M.C. Chou, D.M. Schaadt, Thin Solid Film. 323, 76 (2011) [57] C.H. Shih, I. Lo, W.Y.Pang, Y.C. Wang, Mitch M.C. Chou, Cryst. Growth. 340, 61 (2012) [58] Mitch M.C. Chou, C.L. Chen, D.R. Hang, W.T. Yang, Thin Solid Film. 519, 5066 (2011) [59] T. Ishii, Y. Tazoh, S.Miyazawa, Cryst. Growth. 189, 208 (1998) [60] C.L. Chen, C.A. Li, S.H. Yu, Mitch M.C. Chou, Cryst. Growth. 402, 325 (2014) [61] P. Waltereit, O. Brandt, M. Ramsteiner, R. Uecker, P. Reiche, K.H. Ploog, Cryst. Growth. 218, 143 (2000) [62] A. Kelly, K. M. Knowles, Crystallography and Crystal Defects, (WILEY-VCH, Germany, 2012), Chapter 6, page 181-191 [63] T. Yao, S. K. Hong, (Springer, Germany, 2008), Chapter 1, page 6-10 [64] A. E. Romanov, T. J. Baker, S. Nakamura, J. S. Speck, J. Appl. Phys. 100, 023522(2006) [65] C. Kisielowski, J. KruÈger, S. Ruvimov, T. Suski, J. W. Ager III, E. Jones, Z. Liliental-Weber, M. Rubin, E. R. Weber, Phys. Rev. B 54, 17745 (1996) [66] P. R. Evans, Acta Cryst. D57, 1355 (2001) [67] Darakchieva, T. Paskova, M. Schubert, H. Arwin, P. P. Paskov, B. Monemar, D. Hommel, M. Heuken, J. Off, F. Scholz, B. A. Haskell, P. T. Fini, J. S. Speck, S. Nakamura, Phys. Rev. B 75, 195217(2007) [68] C.H. Shih, T.H. Huang, R. Schuber, Y.L. Chen, L.W. Chang, I. Lo, Mitch M.C. Chou, D. M Schaadt, Nanoscale Research Letters 6, 425 (2011) [69] A.F. Wright, J. Appl. Phys. 82, 2833 (1997) [70] A. Polian, M. Grimsditch, I. Grzegory, J. Appl. Phys. 79, 3343 (1996) [71] S. Einfeldt, H. Heinke, V. Kirchner, D. Hommel, J. Appl. Phys. 89, 2160 (2001) [72] J. Han, M. H. Crawford, R. J. Shul, J. J. Figiel, M. Banas, and L. Zhang, Y. K. Song, H. Zhou, A. V. Nurmikko, Appl. Phys. Lett. 73, 1688 (1998) [73] Y. Y. Zhang, Y. A. Yin, Appl. Phys. Lett. 99, 221103 (2011) [74] C. S. Xia, Z. M. Simon Li, W. Lu, Z. H. Zhang, Y. Sheng, W. D. Hu, L. W. Cheng, J. Appl. Phys. 111, 094503 (2012) [75] W. Braun, Applied RHEED, Springer Germany 1999, chapter 5, page 76-85 [76] M.A. Herman, H.Sitter, molecular Beam Epitaxy Fundamentals and Current status,,chapter 4, page137-145 [77] M.A. Reshchikov, H. Morkoç, J. Appl. Phys. 97, 061301 (2005) [78] J.P. Zhang, S. Wu, S. Rai, V.i Mandavilli, V.Adivarahan, A. Chitnis, M. Shatalov, M. A. Khan, Appl. Phys. Lett. 83, 3456(2003) [79] T. Y. Chang, M. A. Moram, C. McAleese, M. J. Kappers, C. J. Humphreys, J. Appl. Phys.105, 123522 (2010) [80] J. Mickevicˇius, J. Jurkevicˇius, K. Kazlauskas, A. Zˇukauskas, G. Tamulaitis, M. S. Shur, M. Shatalov, J. Yang, R. Gaska, Appl. Phys. Lett. 100, 081902 (2012) [81] Z. Bryan, I. Bryan, S. Mita, J. Tweedie, Z. Sitar, R. Collazo, Appl. Phys. Lett. 106, 232101 (2015) [82] HadisMorkoç, Handbook of Nitride Semiconductors and Devices, (WILEY-VCH, Germany, 2008), Chap. 1, pages 11 [83] Y.S. Liu, S.Wang, H. Xie, T.T. Kao, K.Mehta, X. Jia Jia, S.C. Shen, P. D. Yoder, F. A. Ponce, T. Detchprohm, R. D. Dupuis, Appl. Phys. Lett. 109, 081103 (2016) [84] X. Li, H. Xie, F. A. Ponce, J.H. Ryou, T. Detchprohm, R.D. Dupuis, Appl. Phys. Lett. 107, 241109 (2015) [85] H. Angerer, D. Brunner, F. Freudenberg, O. Ambacher, M. Stutzmann, R. HoÈpler, T. Metzger, E. Born, G. Dollinger, A. Bergmaier, S. Karsch, and H.-J. KoÈrner, Appl. Phys. Lett. 71, 1504 (1997) [86] G. Chen, X. Q. Wang, K. Fu, X. Rong, H. Hashimoto, B. S. Zhang, F. J. Xu, N. Tang, A. Yoshikawa, W. K. Ge, B. Shen, Appl. Phys. Lett. 104, 172108 (2014) [87] C. Q. Chen, J. P. Zhang, M. E. Gaevski, H. M. Wang, W. H. Sun, R. S. Q. Fareed, J. W. Yang, M. Asif Khan, Appl. Phys. Lett. 81, 4961 (2002) [88] S. Bals, B. Kabius, M. Haider, V. Radmilovic, C. Kisielowski, Solid State Communications 130, 675–680 (2004)
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