臺灣博碩士論文加值系統

本篇論文主要針對窄頻物聯網晶片(Narrowband IoT SoC)技術規格進行探討，並且藉由自動化測試機(ATE)針對晶片所有功能，快速且完整的驗證，完成自動化大量生產的實現。
自動化測試機量測有別於一般實驗室儀器的量測。一般在實驗室，需要由許多不同的儀器拼湊在一起，一次只能量測晶片內單一功能的訊號。自動化測試機可透過測試載板(Load Board)，快速且穩定的將數位、類比及射頻訊號做整合，一次完成晶片內所有不同區塊的功能量測。藉由測試機優異的MSE (Multi-Site Efficiency)特性，大大降低了測試的成本。
本篇論文用來實現自動化測試量產與分類所採用的機台，是由愛德萬測試公司(ADVANTEST CORP)的V93000 Port Scale RF測試機台所完成。
關鍵字：窄頻物聯網、自動化測試、量產

This thesis is focuses on the NB-IoT(Narrowband Internet of Things) SoC(System on the Chip) testing specifications implemented by ATE (Automatic Testing Equipment) for fast and complete verification of all chip functions in mass production.
ATE measurement is different from the measurement of general laboratory instruments. In the laboratory, several different instruments need to be pieced together to measure a single function. The ATE can quickly and consistently integrate digital, analog and RF signals through the Load Board to perform all functional measurements of all the different blocks in the device at one time. With the excellent MSE (Multi-Site Efficiency) feature of the ATE, the cost of the test is greatly reduced.
ADVANTEST V93000 Port Scale RF tester were used to automatic testing mass production and classification and have shown good testing performance for all NB-IoT RF specifications including Power, EVM, Gain, Noise Figure, I/Q Mismatch and IIP3.
Keywords: Narrowband IoT, ATE, Mass Production.

摘要 i
Abstract ii
誌謝 iii
目錄 iv
表目錄 vi
圖目錄 vii
第一章 緒論 1
1.1 研究動機 1
1.2 論文概要 2
第二章 NB-IoT待測物介紹及量產瓶頸 3
2.1 物聯網簡介 3
2.2 低功率廣域網路(LPWAN) 4
2.3 什麼是NB-IoT 5
2.4 NB-IoT SoC待測物簡介 7
2.5 量產規劃設計瓶頸 8
第三章 自動化測試機台架構說明 11
3.1 自動化測試機台簡介 11
3.2 自動化測試機台結構與外觀 12
3.3 電源供應模組 (Device Power Supplies) 13
3.4 數位訊號模組 (Digital channels) 15
3.5 射頻子系統 (Port Scale RF subsystem) 17
3.6 類比訊號子系統 (Analog Signal subsystem) 19
第四章 ATE量產測試解決方案 21
4.1 資源共用共享 21
4.2 Semi-parallel 25
4.3 Site Interlacing 25
4.4 SMC(SmartCalc) 26
第五章 NB-IoT SoC測試電路實際驗證 28
5.1 DC Test 28
5.2 TX & RX Test 30
5.3 Analog Test 35
第六章 結論與未來展望 37
6.1 結論 37
6.2 未來展望 37
參考文獻 38

[1]Dino Flore. “3GPP Standards for the Internet-of-Things”. 3GPP, 2016
[2]ADVANTEST (2019), V93000 “https://www.advantest.com/products/ic-test-syste
ms/v93000”
[3]ADVANTEST (2019), V93000 Technical Document Center online website “https://
cs.advantest.com/V93000/help/index.jsp”
[4]WIKIPIDIA (2019), “https://en.wikipedia.org/wiki/Error_vector_magnitude”
[5]林育典，2013，"自動化測試設備之長期演進技術單晶片測試"，中華大學電機工程學系碩士論文
[6]Guy Perry. “The Fundamentals of Digital Semiconductor Testing”, Soft Test Inc., 1999.
[7]Joe Kelly, “Multi-Site Efficiency and Throughput”, Verigy technical paper, 2008.
[8]Joe Kelly, “Cold Noise Method of Measuring Noise Figure in SOC Receivers“, Verigy, 2006.
[9]儲新正，2010，“無線通訊收發器量測實務與研究”，中華大學電機工程學系碩士論文
[10]Jerry Chen, Edwin Lowery, Kimi Chiang, Jerry Yang (2018) , "Modern LTE IoT, Technology, Learnings and x16 Volume Testing on PSRF", Advantest 2018 VOICE technical paper.