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研究生:杜坤璟
研究生(外文):Kun-Jing Du
論文名稱:900-1700 nm波段高光譜影像儀之系統優化及評估
論文名稱(外文):System Optimization and Evaluation of a Hyperspectral Imager for 900-1700nm
指導教授:柯正浩
指導教授(外文):Cheng-Hao Ko
口試委員:徐勝均沈志霖
口試委員(外文):Sheng-Jun XuZhi-Lin Shen
口試日期:2019-07-26
學位類別:碩士
校院名稱:國立臺灣科技大學
系所名稱:自動化及控制研究所
學門:工程學門
學類:機械工程學類
論文種類:學術論文
論文出版年:2019
畢業學年度:107
語文別:中文
論文頁數:152
中文關鍵詞:Offner光譜儀半高全寬調制轉移函數線寬度聚焦縱深光譜解析度
外文關鍵詞:Hyper spectrometerFull width at half maximumModulation transfer functionPitchDepth of focusSpectral resolution
相關次數:
  • 被引用被引用:1
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  • 收藏至我的研究室書目清單書目收藏:0
本研究為設計波段900~1700 nm Offner系統光譜儀,選定架構參數,包含光源設計波段、中心波長、繞射階數、光譜成像大小、光柵條紋間距、光源發散角、凸透鏡曲率半徑及透鏡間距,將可以得到整個Offner初始架構模型,再將資料匯至TracePro軟體進行實際光跡追蹤模擬。
本研究分成兩組,一組偵測器像素數規格128 × 128、像素大小1.4 μm × 1.4 μm及偵測器像素數規格50 × 50、像素大小20 μm × 20 μm兩種規格分析,再利用這兩個規格各分析點光源及前級光源,點光源大小為X方向1 nm、Y方向1 nm,前級光源大小為X方向20 μm、Y方向20 μm;另一組則將像素大小改變為0.75μm × 0.75 μm,其餘分析參數固定。
為了分析波段的成像品質,本研究將波段分成900 nm、1100 nm、1300 nm、1500 nm、1700 nm個別分析,進行光跡追蹤,另外再分別計算出MTF、Pitch、DOF及解析度數據及其圖形。
本研究針對Offner系統光譜儀,從參數建立、分析流程、模擬呈現、數據分析等步驟,主要比較凸透鏡曲率半徑大小得出最佳系統大小,並建立一套完整的Offner分析設計流程。
Design of an Offner system spectrometer used for 900 ~ 1700 nm wavebands is introduced in this thesis. All the system parameters are selected, including the wavebands of light source, the central wavelength, the diffraction orders, spectral imaging size, grating pitch, the divergence angle of the light source, radius of concave mirror and the distance of the lens. The entire Offner system model will be available and data will be exported to the TracePro software for ray tracing simulation.
This study is divided into two groups, one of the detector pixel number 128 × 128, pixel size 1.4 μm × 1.4 μm and the detector pixel number 50 × 50 , pixel size 20 μm × 20 μm two specifications. And then two specifications are used to analyze point source and the front-optics source. The size of light source is 1 nm × 1 nm. The size of front source is 20 μm × 20 μm;another group purpose to change pixel size 0.75μm × 0.75μm,the remaining parameters are fixed.
In order to analyze the quality of images, five specific wavelengths are selected to be analyzed individually, Which are 900 nm, 1100 nm, 1300 nm, 1500 nm, and 1700 nm. Ray tracing simulation are used to analyze MTF, Pitch, DOF, resolution data and graphics respectively.
This process mainly through compare radius of concave mirror to get an optimal system size. This study establishes a design process of complete Offner analysis.
致謝 I
摘要 II
Abstract III
目錄 IV
圖目錄 VI
表目錄 XIV
第一章 序論 1
1.1 研究背景 1
1.2 研究目的 2
1.3 本文架構 2
第二章Code V系統模擬分析 3
2.1選定市售偵測器 3
2.2 Offner模型建立流程 3
2.3 Code V參數建立流程 4
2.4系統參數設計 6
第三章Tracepro參數設計及建模分析 10
3.1底片規格的選用 10
3.2半高全寬(Full Width at Half Maximum FWHM) 10
3.3 調制轉移函數(Modulation Transfer Function MTF) 12
3.4 光譜解析度(Spectral Resolution SR) 13
3.5 聚焦縱深(Depth of Focus DOF) 14
3.6 光源大小及偵測器像素規格分析比較 15
第四章 模擬結果分析 18
4.1 偵測器128 × 128規格作點光源分析 18
4.2 偵測器128 × 128規格作狹縫光源分析 37
4.3 偵測器50 × 50規格作點光源分析 50
4.4 偵測器50 × 50規格作狹縫光源分析 60
4.5 偵測器128 × 128規格作點光源分析 72
4.6 偵測器128 × 128規格作狹縫光源分析 88
4.7 偵測器50 × 50規格作點光源分析 100
4.8 偵測器50 × 50規格作狹縫光源分析 111
第五章 數據分析 122
第六章 結論 129
參考文獻 131
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[14] K. Tsuchiya, K Nitta, O. Matoba, Y. Awatsuji, “Experimental evaluation of depth of focus by MTF in digital holographic microscopy,” 2013 Conference on Lasers and Electro-Optics Pacific Rim, pp. 1-2 (2013).
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