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研究生:郭泯均
研究生(外文):GUO, MIN-JUN
論文名稱:非接觸式系統電路訊號檢測技術研究
論文名稱(外文):Research on Signal Detection of System Circuit by Non-contact Technology
指導教授:吳松茂
指導教授(外文):WU, SUNG-MAO
口試委員:林漢年王陳肇吳松茂
口試委員(外文):LIN, HAN-NIENWANG, CHEN-CHAOWU, SUNG-MAO
口試日期:2020-07-28
學位類別:碩士
校院名稱:國立高雄大學
系所名稱:電機工程學系碩博士班
學門:工程學門
學類:電資工程學類
論文種類:學術論文
論文出版年:2020
畢業學年度:108
語文別:中文
論文頁數:83
中文關鍵詞:近場量測技術去嵌入技術非接觸式訊號饋入等效模型建立
外文關鍵詞:Near Field MeasurementDe-embedding TechniqueNon-contact Signal ExciteEquivalent Circuit Model
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中文摘要 i
英文摘要 ii
致謝 iii
目錄 iv
圖目錄 vi
表目錄 x
第一章 緒論 1
1.1研究動機 1
1.2文獻回顧及探討 4
1.2.2 高頻探針接觸式量測發展 4
1.2.1近場量測的技術與應用 9
1.2.3 De-embedded的技術 14
1.3章節介紹 17
第二章 非接觸式饋入介面 18
2.1 目前近場量測於電路特性檢測之應用 20
2.1.1頻域近場量測架構 20
2.1.2 時域近場量測架構 21
2.1.3 靜電放電消散路徑時域近場量測架構 23
2.2非接觸訊號饋入引出之量測探頭選用 26
2.2.1基於頻域近場量測非接觸式訊號饋入量測架構 26
2.2.2基於時域近場量測非接觸式訊號饋入量測架構 29
2.2.3非接觸式訊號饋入架構建立 31
第三章 非接觸式訊號介面等效模型建立 34
3.1 訊號饋入探頭改善與模型建立 34
3.1.1 電場探頭設計與改善 34
3.1.2場探頭模型建立 39
3.2 非接觸式饋入量測架構模型建立 43
3.2.1待測物模型建立 43
3.2.2 量測架構模型建立 46
第四章 非接觸式量測系統電路訊號檢測方法驗證 51
4.1傳輸線De-embedding驗證 51
4.1.1 De-embedding還原待測物特性 52
4.1.2 探頭耦合與待測物特性驗證 54
4.2 濾波器De-embedding驗證 58
4.2.1 濾波器樣品設計與特性 58
4.2.2 探頭耦合與待測物特性驗證 61
4.3 De-embedding問題分析與探討 63
第五章 結論與未來展望 68
參考文獻 69
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[2]官聖洧,“新式微波雙面校正與量測技術之發展與驗證”,國立高雄大學電機工程學系碩士班碩士論文,民國九十九年.
[3]Ryo Sakamaki and Masahiro Horibe, " Proposal of a Precision Probe-Tilt Adjustment with the RF Signal Detection Technique," 2018 Conference on Precision Electromagnetic Measurements (CPEM 2018), July 2018
[4]許仁芳, “系統構裝電磁輻射干擾抑制與模型化研究,” 國立高雄大學電機工程學系碩士班碩士論文, 民國一百零三年.
[5]IEC 61967-6, Integrated Circuits-Measurement of Electromagnetic Emissions, 150kHz to 1GHz- part6 “Measurement of Conducted Emissions-Magnetic Probe Method”, 2002
[6]Wataru Ichimura, Sho Kiyoshige, and Toshio Sudo," EMI reduction by suppressing Q factor of total PDN with variable on-die capacitance and resistance," 2014 IEEE 23rd Conference on Electrical Performance of Electronic Packaging and Systems, Oct 2014
[7]陳泊佑,“近場量測技術應用於系統最佳化設計分析之研究,” 國立高雄大學電機工程學系碩士班碩士論文, 民國一百零六年
[8]Bo Pu, Jonghyeon Kim, Wansoo Nah, " A De-Embedding Technique of a Three-Port Network with Two Ports Coupled," Journal of Electromagnetic Engineering and Science, vol. 15, no. 4, 258~265, Oct 2015
[9]G. W. A. Dummer, " Electronic inventions and discoveries (4th ed.): electronics from its earliest beginnings to the present day," IOP Publishing Ltd. Bristol, UK, 1997
[10]Zhaowen Yan, Jianwei Wang, Wei Zhang, Yansheng Wang and Jun Fan, "A Miniature Ultrawideband Electric Field Probe Based on Coax-Thru-Hole via Array for Near-Field Measurement," IEEE Transactions on Instrumentation and Measurement, vol. 66, issue. 10, Oct. 2017
[11]Tim Williams, “EMC for Product Designers: Meeting the European EMC Directive,” Newnes, Jun 2004.
[12]Don DeGroot, Kaviyesh Doshi, David Dunham and Peter J. Pupalaikis, "De-embedding in High Speed Design," DesignCon, 2012
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[14]ANRITSU, “Application Note Embedding/De-embedding,” May 2002.
[15]Antoni Josep Canós Marín, Beatriz García-Baños, José M. Catalá-Civera, Felipe L. Peñaranda-Foix and José D. Gutiérrez-Cano, "Improvement in the Accuracy of Dielectric Measurement of Open-Ended Coaxial Resonators by an Enhanced De-Embedding of the Coupling Network," IEEE Transactions on Microwave Theory and Techniques, vol. 61, issue. 12, Dec. 2013
[16]James Frei, Xiao-Ding Cai and Stephen Mulle, "Multiport -Parameter and T-Parameter Conversion With Symmetry Extension," IEEE Transactions on Microwave Theory and Techniques, vol. 56, issue. 11, Nov. 2008
[17]Bichen Chen, Jiayi He, Xinglin Sun, Yuandong Guo, Shuai Jin,Xiaoning Ye and Jun Fan, "Differential S-Parameter De-embedding for 8-Port Network," 2018 IEEE Symposium on Electromagnetic Compatibility, Signal Integrity and Power Integrity (EMC, SI & PI), Jul 2018
[18]Daisuke Uchida, Toshiaki Nagai, Yoshitaka Oshima and Shinichi Wakana, "Novel high-spatial resolution probe for electric near-field measurement," 2011 IEEE Radio and Wireless Symposium, Jan 2011
[19]Yingjie Gao and Ingo Wolff, "Miniature electric near-field probes for measuring 3-D fields in planar microwave circuits, " IEEE Transactions on Microwave Theory and Techniques, vol. 46, issue. 7, Jul. 1998
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