臺灣博碩士論文加值系統

鈣鈦礦奈米雷射擁有包含高吸收、小尺寸與波長易調變的特性，使得鈣鈦礦奈米雷射可以在許多領 域中發揮特性。本篇論文主要探討鈣鈦礦雷射在光學繞射極限附近的雷射特性，並藉由楊氏干涉系統來辨別不同模態的差異。在研究中，我們分別在藍寶石基板與銀薄膜上轉移了不同尺寸的鈣鈦礦，並首先利用原子力顯微鏡觀察鈣鈦礦的結構特性並篩選出適合的結構。再來，藉由 u-PL系統我們觀察到藍寶石基板上與銀薄膜上的鈣鈦礦雷射因尺寸微縮造成雷射閾值有不同的變化，我們也利用楊氏干涉系統歸納同橫模間不同縱模的特性並發現銀薄膜上的鈣鈦礦雷射隨著尺寸微縮有非常大的群折射率。我們搭配理論模擬與實驗對不同基板上的隨著尺寸微縮的鈣鈦礦進行特性上的比較。

Perovskite nanolaser have numerous characteristics including high absorption coefficient, small size and tunable bandgap. These advantages make it promising in multiple fields, and attract many researchers attend to related researches. In this research, we discussed the lasing properties of perovskite laser with its size around diffraction limits and observed its mode difference using young’s interference system. To achieve that, we first respectively transfer perovskite onto sapphire and silver substrate, perceive its structural characteristic and select out the fitted one. Then, with the help of u-PL system, we found out that the threshold changes differently for silver substrate and sapphire as the downsizing of the perovskite happens. Also, we came up with a method to classify modes on the same perovskite sample and found out that the group index of perovskite on silver is large as the size shrink. Last, we analyzed our experimental data along with our simulation results to thoroughly discussed the distinctions between perovskite on different substrate as the size minimizes.

摘 要 i
Abstract ii
Acknowledgement iii
Contents iv
List of Figures vi
Chapter 1 Preface 1
1.1 Introduction to LASER 1
1.2 Introduction to perovskite 4
1.3 Perovskite application on light-emitting device 6
1.4 Introduction to surface plasmon 8
1.5 Previous report on cavity analysis and introduction to young’s interference 13
1.6 Motivation 16
Chapter 2 Experimental Instruments 18
2.1 Fabrication instruments and materials 18
2.1.1 PDMS fabrication 18
2.1.2 Perovskite micro/nano scale fabrication 19
2.1.3 Atomic layer deposition system (ALD) 21
2.1.4 E-gun evaporator 22
2.2 Measurement & Analysis instruments 23
2.2.1 Scanning Electron Microscopy 23
2.2.2 Atomic Force Microscope (AFM) 24
2.2.3 Micro-photoluminescence measurement system( u-PL) 25
2.2.4 4-f system 26
2.2.5 Finite element method 27
Chapter 3 Fabrication Process & Measurement Method 30
3.1 Sample fabrication process 30
3.2 AFM measurement method 33
3.3 Measuring method combining young’s interference and polarization 34
Chapter 4 Lasing Behavior of perovskite laser on different condition 37
4.1 Discussion on morphology with AFM result 37
4.2 Simulation Results 38
4.3 Relation on threshold and width 43
4.4 Polarizaion of perovskite laser on different substrate 45
4.5 Relation on group index and width 47
Chapter 5 Conclusion 53
References 54

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