臺灣博碩士論文加值系統

摘要 i
Abstract iii
致謝 v
目錄 vi
圖目錄 ix
表目錄 xii
第一章 緒論 1
1.1前言 1
1.2研究動機與目的 2
第二章 文獻回顧 4
2.1鈣鈦礦材料簡介 4
2.1.1鈣鈦礦材料的基本性質介紹 4
2.1.2鈣鈦礦發光二極體之基本原理 7
2.2 提升鈣鈦礦發光二極體元件穩定性之方法 9
2.2.1透過金屬有機框架中組裝固定銫鉛鹵化物鈣鈦礦奈米晶體並提升穩定性 9
2.2.2利用金屬有機框架作為電動傳輸層調控鈣鈦礦均一尺寸 11
2.2.3調控鈣鈦鑛晶體在低溫下之光學性質 12
2.3 金屬有機框架之材料介紹 14
第三章 實驗流程及步驟 15
3.1實驗材料 15
3.2實驗儀器 17
3.3實驗流程 18
3.3.1 銅鋅配位化合物的合成 18
3.3.2 綠光準二維(qusai 2D)鈣鈦礦（CsPbBr3）晶體前驅液製備 21
3.3.3 銅鋅配位化合物之傳輸層溶液製備 21
3.3.4 鈣鈦礦光學性質量測薄膜的製備 21
3.3.5 準二維-鈣鈦礦PELEDs製備 21
3.4　儀器分析 23
3.4.1　紫外光-可見光光譜儀（UV-vis） 23
3.4.2　螢光光譜儀（PL） 24
3.4.3　傅立葉轉換紅外線光譜儀（FTIR） 25
3.4.4　時間解析螢光光譜儀（TRPL） 26
3.4.5　X光繞射儀（XRD） 27
3.4.6　掠角入射 X 光廣角散射儀（GIWAXS） 28
3.4.7　X射線光電子能譜儀（XPS） 28
3.4.8　紫外光電子能譜儀（UPS） 29
3.4.9 高解析掃描式電子顯微鏡（HR-SEM） 29
3.4.10　原子力顯微鏡（AFM） 30
3.4.11　開爾文探針力顯微鏡（KPFM） 30
3.4.12　發光二極體元件光電特性測量及各項數值介紹 31
第四章 結果與討論 32
4.1　銅鋅配位化合物合成官能基鑑定及分析 32
4.1.1　FT-IR分析銅鋅配位化合物之官能基鑑定 32
4.1.2　利用表X射線光電子能譜儀鑑定銅鋅配位化合物分析銅鋅配位化合物 33
4.2　銅鋅配位化合物的物理分析 35
4.2.1　X光繞射儀（XRD）分析銅鋅配位化合物之結晶訊號 35
4.2.2　銅鋅配位化合物之紫外光-可見光光譜儀（UV-vis）鑑定 36
4.2.3　利用UPS計算Cu-Zn@CP之價帶（HOMO） 37
4.2.4　開爾文探針力顯微鏡（KPFM）測試 40
4.2.5　熱重分析儀（TGA）測試 41
4.2.6　銅鋅配位化合物之接觸角（Contact Angle）測試 42
4.3　FT-IR探討銅鋅配位化合物與鈣鈦礦之官能基鑑定 43
4.4　Cu-Zn@CP在低溫情況下之光子衰減壽命之激子分離機制 44
4.5　銅鋅配位化合物與鈣鈦礦其晶體結構分析 46
4.5.1　X光繞射儀（XRD）分析將鈣鈦礦材料應用於不同傳輸層之比較 46
4.5.2　掠角入射 X 光廣角散射儀 (GIWAXS)分析鈣鈦礦材料與銅鋅配位化合物之結晶排列探討 48
4.6　將準二維鈣鈦礦應用於不同傳輸層之表面形貌分析 49
4.6.1　掃描式電子顯微鏡（SEM）分析鈣鈦礦薄膜之表面缺陷 49
4.6.2　原子力顯微鏡（AFM）分析鈣鈦礦薄膜之表面粗糙度 51
4.7　準二維-鈣鈦礦發光二極體之應用 52
4.7.1　探討Cu-Zn@CP/P.V.S.K. 在電場中的晶格動力學 52
4.7.2　比較PVK與Cu-Zn@CP之電荷傳輸 53
4.7.3　比較PVK與Cu-Zn@CP之表面電荷分布 54
4.7.4　發光二極體之元件性能 56
4.7.5　準二維-鈣鈦礦發光二極體元件穩定性 57
第五章　結論 59
參考文獻 60

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