臺灣博碩士論文加值系統

隨系統化構裝技術的成熟，構裝體的走線越趨密集且因應市場需求工作頻率也隨之提升，因此使電源完整性、訊號完整性及電磁干擾三大議題越趨重要，而傳統量測技術上對於這三個議題大多使用接觸性介面進行，其僅能對於點對點之間路徑上的分析，並無法有效且直觀的觀察到整體產品上問題發生的確切位置，若能透過近場量測系統的應用，將可快速的發現問題發生位置，其不僅可直觀的解決問題也可大幅降低成本。
基於上述理念，本論文以近場量測系統為藍圖，發展頻域及時域方面的量測架構，藉此可以觀察隨頻率或隨時間變化之待測樣品的近場輻射場型變化。本論文最重要的是提出頻域及時域兩種不同的量測架構，而此量測架構為新創之量測架構，透過具訊號換層架構之四層板樣品量測結果驗證此兩量測架構的可行性；後續進行解耦合電容的應用，驗證此兩架構的發展性及應用性。未來將可利用此兩量測架構對產品做非接觸式的量測，進而透過量測結果分析問題發生位置及原因，可直觀且有效的解析產品問題，並縮短除錯時間。

With the advantage of System in Package (SiP), the circuit more and more close in package and the higher frequency, so the Power Integrity (PI)、Signal Integrity(SI) and Electromagnetic Compatibility (EMC) issues are more and more important. And the traditional measurement technology usually using the contract interface for the three issues, these solutions just analyze the trace’s characteristic, that cannot observe the real problem’s location intuitively. If it can use the EM near field measurement system to measure, that can find out and figure out the problem and location. Not only can observe the real problem how to happen and where is intuitively, that can cost lower for debugging.
Above that, this paper bases on the EM near Field (Aprel EM-ISight) to research the frequency domain and time domain measurement. Because that, that can obverse the frequency and time domain’s near and fields. And, this paper designs the four different samples, verify the frequency domain and time domain measurement with the result of simulation and measurement. After all, that use the two measurements to be research the decoupling capacitance application. In the future, that can use the time domain and frequency domain measurement technology to debug the problems, that not only can obverse where the problem is and how to happen, that can cost the lower time to debugging.

目錄
中文摘要 i
英文摘要 ii
致謝 iii
目錄 iv
圖目錄 vi
表目錄 ix
第一章 緒論 1
1.1研究動機 1
1.2文獻回顧及探討 5
1.2.1同步切換雜訊成因及影響 5
1.2.2解耦合電容應用 8
1.2.3近場量測技術發展 11
1.3章節介紹 13
第二章 近場之頻域量測技術 14
2.1近場量測系統介紹 14
2.2於近場量測系統下之頻域量測架構 16
2.2.1頻域量測架構 16
2.2.2 頻譜分析儀DPX概述 19
2.3頻域量測與特性分析 21
2.3.1 樣品設計與諧振腔理論 21
2.3.2 頻域量測與模擬 26
第三章 近場之時域量測技術 30
3.1於近場量測系統下之時域量測架構 30
3.3.1 時域量測架構 30
3.3.2 時域之同步概念 32
3.2時域量測與特性分析 35
第四章 近場量測技術應用於解耦合電容分析 40
4.1解耦合電容特性及位置 40
4.2解耦合電容應用之頻域分析 44
4.3解耦合電容應用之時域分析 47
第五章 結論與未來展望 49
參考文獻 51

參考文獻
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