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研究生:彭柏偉
研究生(外文):Peng Bo-Wei
論文名稱:液體折射率之正向反射量測法
論文名稱(外文):The Measurement of Refractive Index of Liquid in Normal Reflection Method
指導教授:鄭劭家
指導教授(外文):Cheng Chao-Chia
學位類別:碩士
校院名稱:中華大學
系所名稱:電機工程學系(所)
學門:工程學門
學類:電資工程學類
論文種類:學術論文
論文出版年:2007
畢業學年度:95
語文別:中文
論文頁數:63
中文關鍵詞:正向反射量測法液體折射率
外文關鍵詞:Normal Reflection Methodrefractive index
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本論文提出了一種利用中空式三稜鏡容器(Hollow Prism)來量測液體折射率的技術,稱之為正向反射量測法(Normal Reflection Method)。將裝有待測液體的中空三稜鏡置於旋轉平台上,量測入射光於第一面玻璃的反射光,此時旋轉平台轉動的角度為參考角度。再轉動一角度讓稜鏡容器內折射光垂直入射(Normal Reflection)第二面玻璃,量測反射光可得第二個角度。將第二面垂直反射的角度減去參考角度,得到稜鏡旋轉的角度。依據Snell’s Law,代入中空三稜鏡頂角參數,就可計算出容器內液體折射率。 我們利用自行製作的中空式三稜鏡容器(Hollow Prism)、精密旋轉平台、光感測元件以He-Ne雷射光源,建構成一套液體折射率量測系統,其具中空三稜鏡擺放旋轉平台位置的容忍度,以及液體折射率量測精確度可達小數點後第3位的優點。 考慮量測系統的誤差,中空三稜鏡容器玻璃的wedge angle,以及反射光的光程距離,都會影響系統精確度。將wedge angle參數代入折射定律修正公式,即可計算出液體折射率量測精確度達小數點後第5位。
We present here a method called “Normal Reflection Method” for index measurement for the liquid in Hollow-Prism. The measurement system adopted a probe He-Ne laser beam impinging into a liquid filled Hollow- Prism which located on a rotating platform. This probe beam will be deflected with specific angle according to the index of liquid. The “Normal Reflection Method” determined this deflected angle by the included angle between the normal reflected beams from the front and rear surfaces of the hollow prism. The index of the liquid could be deduced easily by Snell’s Law with the measured deflected angle. The liquid index measurement system consist in a hand-made Hollow Prism, well accuracy rotating platform, photodiode component and He-Ne laser. The system demonstrated good tolerances for the prism location and the probe beam alignment. The measurement accuracy of index could reach 10-3. Some parameters reduce the accuracy of system measurement. The parameters include the wedge angle of each hollow prism’s glasses plate and the traveling distance of probe beam. The modified equation with wedge angle correction could calculate more precise refractive index to 10-5.
摘要 I Abstract II 致謝 III 目錄 IV 圖目錄 VI 表目錄 IX 第一章 緒論 1 1-1 前言 1 1-2 量測技術的介紹與比較 2 1-3 論文大綱與結構 12 第二章 中空三稜鏡(Hollow Prism) 正向反射量測法 14 2-1 正向反射量測法 14 2-2 正向反射量測法之優點 22 2-3 量測流程 26 第三章 系統設計 29 3-1 系統架構介紹 29 3-2 系統各元件裝置之規格 30 3-3 光感測電路討論與分析 35 第四章 量測結果分析與誤差討論 45 4-1 對去離子水(D.I. water)量測結果 45 4-2 中空三稜鏡容器的楔角(wedge angle)量測討論 50 4-3 誤差分析 53 4-3-1 wedge angle的誤差分析與討論 53 4-3-2 光程距離(L)的影響 56 4-4 對氯化鈉(NaCl)溶液的折射率量測 59 第五章 結論 61 參考文獻 62
[1] Shyam Singh. Measuring the refractive index of a liquid using a laser. Physic Education, 2002(3); 152-153 [2] Nemoto S. Measuring of the refractive index of liquid using laser beam displacement. Appl. Opt. 1992, 31: 6690-6694 [3] 王明, 用光纖楊氏干涉量測液體的折射率, 大學物理實驗, 2005, 18(1): 8-10 [4] 張全法, 郭茂田, 楊海彬 等, 利用CCD量測液體折射率, 半導體光電, 2002, 21(3): 229-232 [5] Chao-Chia Cheng, Accurate index measurement of liquid enhanced by an iteration method, Department of Electrical Engineering, Chung-Hua University [6] 辛督強, 朱民, 解延雷, 張濤, 量測液體折射率的幾種方法, College Physics, Vol.26 No.1, Jan. 2007 [7] Michael D. Edmiston, A liquid prism for refractive index studies, Journal of chemical education, Vol. 78, No.11, November 2001 [8] Michael D. Edmiston, Measuring refractive indices, The physics teacher, March 1986 [9] http://www.lasos.com [10] www.sigma-koki.com [11] Burr-Brown Products From Texas Instruments, Monolithic photodiode and single supply transimpedance amplifier, SBBS002A- January 1994- Revised October 2003 [12] Burr-Brown Corporation, Precision, low power instrumentation amplifier, PDS1199D, 1998 [13] David R. Line, Handbook of Chemistry and Physics, 82nd ed., CRC(2002) [14] Harry M. Dobbins, Edson R. Peck, Change of refractive index of water as a function of temperature, Journal of the Optical Society of America, Vol.63, No.3, March 1973, 318-320 [15] Eugene Hecht, Optics, 4th ed., Addison Wesley, CITY (2002) [16] Cheng-Chih Hsu, Kun-Huang Chen, Der-Chin Su, Normal incidence refractometer, Optics Communications, 218(2003),205-211 [17] Dileep V. Sathe, Fixed angle of incidence method for the refractive index of a prism, Am. J. Phys. 53(5), May 1985 [18] F. El-Ghussein, J. M. Wrobel, and M. B. Kruger, Dispersion measurements with minimum and maximum deviated beams, Am. J. Phys. 74(10), October 2006 [19] Edward Richard Van Keuren, Refractive index measurement using total internal reflection, Am. J. 73(7), July 2005
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