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研究生:何全民
研究生(外文):Cyuan-Min He
論文名稱:應用近場探棒分析電路之輻射放射的模擬與量測
論文名稱(外文):Simulation and Measurement of radiated emission for circuit by using near-field probe
指導教授:林明星林明星引用關係
指導教授(外文):Ming-Shing Lin
口試委員:林明星許崇宜曾振東吳俊德
口試委員(外文):Ming-Shing LinChung-I G. HsuJan-Dong TsengCHUN-TE WU
口試日期:2015-07-10
學位類別:碩士
校院名稱:國立雲林科技大學
系所名稱:電機工程系
學門:工程學門
學類:電資工程學類
論文種類:學術論文
論文出版年:2015
畢業學年度:103
語文別:中文
論文頁數:97
中文關鍵詞:磁場探棒法
外文關鍵詞:magnetic probe method
相關次數:
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摘 要
  本論文旨在探討電路板上的迴路所產生的輻射放射效應。首先,設計與製作四種做為近場輻射掃描工具的磁場探棒,其相異處主要是饋入方式不同(帶線、微帶線、共平面波導、背覆金屬之共平面波導),其中的帶線饋入磁場探棒是依據IEC 61967-6所建議的結構所製作。接著,研究這些磁場探棒的特性,包括靈敏度、電場隔離度、天線效應以及空間解析度,並利用微帶線校正法將磁場探棒之校正因子求出。

本論文所採用的待測電路為兩個已知頻段之迴路天線以仿效實際電路佈線情形作,而後利用Ansys Q3D Extrator進行參數萃取及理論值推估計算出等效電路模型參數,建立磁場探棒及迴路天線之等效電路模型並一同匯入由法國INSA所開發軟體IC-EMC進行輻射放射模擬,觀察模擬結果之輻射放射量進而評估實際近場量測主要輻射放射頻率點。而實際近場量測的部分,乃是使用20MHz震盪器做為迴路天線訊號源,將磁場探針連接至頻譜分析儀後對迴路天線進行近場輻射放射掃描,並與模擬結果相互比對,而後透過校正因子將量測值轉換至磁場強度值並比較四支磁場探棒結果。文末亦探討外加元件對於迴路天線之共振頻率與反射損失的影響,其結果可應用於改善電路輻射放射之頻率與振幅。

關鍵字:電磁干擾、磁場探棒法、迴路天線、等效電路模型、輻射放射

ABSTRACT
This thesis aims to investigate the radiated emission owing to an electric loop on a printed circuit board. First, we designed and fabricated four magnetic probes for scanning near magnetic fields. These magnetic probes are different mainly in their feeding structures, including a stripline, a microstrip line, a coplanar waveguide, and a conductor-backed coplanar waveguide. The magnetic probe fed using the stripline was designed according to the structure suggested in IEC61967-6. Many properties of the four magnetic probes, including sensitivities, E-field isolations, antenna effects, and spatial resolutions, were simulated, measured, and compared. In addition, the frequency-dependent calibration factors of each probe were calculated using a microstrip line method.

Second, two antennas with different resonant frequency were fabricated as the device under test (DUT) to emulate the real circuit. With the help of Ansys Q3D Extrator, relevant parameters of the equivalent circuit were extracted. The equivalent circuit models of both the magnetic field probe and the loop antenna were built and then loaded into the IC-EMC software developed by INSA in France to find the frequencies for which strong radiated emission occurs.

Finally, a 20 MHz oscillator was used as the signal source of the loop antenna. The fields produced by the loop antenna were scanned in the near-field region by using the magnetic field probe that was connected to a spectrum analyzer. Measured results shown on the spectrum analyzer were subsequently converted to magnetic field intensities using the well-established calibration factors. They were found to compare reasonably well with simulated ones. At the end of the thesis, the loop antennas were investigate the effect of resonant frequency and amplitude with the extra components, the result can be applied in modifying the circuit radiated emission


Keyword : Electromagnetic Interference、magnetic probe method、loop antenna、
equivalent circuit model、radiated emission

目錄
摘 要 I
ABSTRACT II
致謝 IV
目錄 V
表目錄 VII
圖目錄 VIII
第一章 緒論 1
1.1 研究動機目的與背景 1
1.2 文獻回顧 3
1.3 論文大綱 4
第二章 積體電路電磁放射標準與模擬分析軟體介紹 6
2.1 IEC 61967積體電路電磁放射標準[3]-[8] 6
2.1.1 IEC 61967-1 通則與定義(General conditions and definitions)[3] 6
2.1.2 IEC 61967-2 橫向電磁波室與寬頻橫向電磁波室法(TEM cell and
wideband TEM cell method)[4] 7
2.1.3 IEC 61967-3 表面掃描法(Surface scan method)[5] 9
2.1.4 IEC 61967-4 1Ω/150Ω直接耦合法(1 Ω/150 Ω direct coupling
method)[6] 10
2.1.5 IEC 61967-5 工作台法拉第箱體法(Workbench Faraday Cage
method)[7] 11
2.1.6 IEC 61967-6磁場探棒法 (Magnetic probe method)[8] 12
2.2 電磁相容模擬軟體 14
第三章 磁場探棒設計與等效電路模型建立 18
3.1 磁場探棒設計與模擬 19
3.1.1 磁場探棒A (帶線饋入) 22
3.1.2 磁場探棒B (微帶線饋入) 23
3.1.3 磁場探棒C (共平面饋入) 24
3.1.4 磁場探棒D (背覆金屬之共平面波導方式饋入) 25
3.1.5 模擬架構說明 26
3.2 磁場探棒製作與量測 32
3.3 等效電路模型建立 40
3.3.1 磁場耦合模擬架構 41
3.3.2 電場耦合模擬架構 44
第四章 迴路天線設計與輻射放射模擬量測驗證 47
4.1 仿效電路佈線之迴路天線設計模擬與量測 47
4.2 迴路天線等效電路參數萃取與理論值計算 53
4.2.1 以Ansys Q3D Extractor萃取迴路天線等效電路參數 53
4.2.2 以理論值推估迴路天線等效電路參數 56
4.3迴路天線近場輻射放射模擬與量測驗證 60
4.3.1 以IC-EMC執行輻射放射模擬 60
4.3.2 近場輻射放射量測驗證其模擬結果 66
4.4 改變迴路天線上的元件探討對共振頻率與反射損失之影響 71
4.4.1 改變迴路天線之並聯電容C3 71
4.4.2 改變迴路天線之串聯電容C4 73
4.4.3 於迴路天線中加入串聯電阻R5 75
第五章 結論 77
參考文獻 79

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