參考文獻
[1] EN55022, 1998, Limits and Method of Measurement of Radio Interference
Characteristics of Information Technology Equipment.
[2] CNS 13438, 2006, 資訊技術設備-射頻干擾特性─限制值與量測方法, 經濟部
標準檢驗局(BSMI).
[3] IEC61967-1, 2002, Integrated Circuits, Measurement of Electromagnetic Emission,
150 KHz – 1GHz, Part1: General condition and Definitions, IEC Standard.
[4] IEC61967-2, 2005, Integrated Circuits, Measurement of Electromagnetic Emission,
150 KHz – 1GHz, Part2: Measurement of radiated emissions –TEM cell and
wideband TEM cell method, IEC Standard.
[5] IEC61967-3, 2005, Integrated Circuits, Measurement of Electromagnetic Emission,
150 KHz – 1GHz, Part3: Measurement of radiated emissions –Surface scan method,
IEC Standard.
[6] IEC61967-4, 2006, Integrated Circuits, Measurement of Electromagnetic Emission,
150 KHz – 1GHz, Part4: Measurement of conducted emissions –1Ω/150Ω direct
coupling method, IEC Standard.
[7] IEC61967-5, 2002, Integrated Circuits, Measurement of Electromagnetic Emission,
150 KHz – 1GHz, Part5: Measurement of conducted emissions – Workbench
Faraday Cage method, IEC Standard.
[8] IEC61967-6, 2008, Integrated Circuits, Measurement of Electromagnetic Emission,
150 KHz – 1GHz, Part6: Measurement of conducted emissions – Magnetic probe
method, IEC Standard.
[9] IEC62132, 2006, Integrated Circuits, Measurement of Electromagnetic Immunity,
150 KHz – 1GHz.
[10] 蕭國祥,展頻技術於積體電路電磁相容設計之應用,國立雲林科技大
學,碩士論文,2008.
[11] A. Boyer & E. Sicard, IC-EMC website, http://www.ic-emc.org/ .
[12] Chun-Ping Chen, Kohei Sugawara, Keren Li, Hiroshige Nihei, Tetsuo Anada and
C. Christopoulos,” Non-contacting Near-field Mapping of Planar Circuits in
Microwave Frequency Band,” Electromagnetic Compatibility. IEEE
International Symposium on, Page(s):1-6, 2008.
[13] Hao-Hsiang Chuang, Guang-Hua Li, Eakhwan Song, Hyun-Ho Park, Hyun-Tae
Jang, Hark-Byeong Park, Yao-Jiang Zhang, David Pommerenke, Tzong-Lin Wu,
and Jun Fan,” A Magnetic-Field Resonant Probe With Enhanced Sensitivity for RF
Interference Applications,” Electromagnetic Compatibility, IEEE Transactions on
Volume: 55, Issue: 6, DECEMBER 2013.
[14] Yien-Tien Chou and Hsin-Chia Lu,” Magnetic Near-Field Probes With High-Pass
and Notch Filters for Electric Field Suppression,” Microwave Theory and
Techniques, IEEE Transactions on Volume: 61, Issue: 6, JUNE 2013.
[15] Ando, N. ; Masuda, N. ; Tarnaki, N. ; Kuriyama, T. ; Saito, S. ; Kato, K. ; Ohashi,
K. ; Saito, M. ; Yarnaguchi, M.” Miniaturized thin-film magnetic field probe with
high spatial resolution for LSI chip measurement,” Electromagnetic Compatibility
. EMC 2004. 2004 International Symposium on Volume: 2, Page(s): 357 – 362,
2004.
[16] Constantine A. Balanis, Antenna Theory – Analysis and Design, A JOHN
WILEY & SONS, INC., PUBLICATION, Third Edition, 2005.
[17] Clayton R. Paul, Inductance-Loop and partial, A JOHN WILEY & SONS,
INC., PUBLICATION, 2010.
[18] INSA website, http://www.insa-toulouse.fr/fr/index.html .
[19] A. Boyer & E. Sicard, 2011, IC-EMC User manual, INSA Toulouse, France,
Version 2.5.
[20] WinSPICE website, http://www.winspice.co.uk/
[21] 王振宇,積體電路電磁相容近場量測之研究,國立雲林科技大學,碩士論文,2009.
[22] 楊順景,積體電路電磁干擾量測製具與分析方法之建構,國立雲林科技大學,
碩士論文,2010.
[23] Yien-Tien Chou and Hsin-Chia Lu,” Space Difference Magnetic Near-Field Probe
With Spatial Resolution Improvement,” Microwave Theory and Techniques, IEEE
Transactions on Volume: 61, Issue: 12, DECEMBER 2013.
[24] Jung-Min Kim, Woo-Tae Kim, and Jong-Gwan Yook, “Resonance-Suppressed
Magnetic Field Probe for EM Field-Mapping System,” Microwave Theory and
Techniques, IEEE Transactions on Volume: 53, Issue: 9, SEPTEMBER 2005.
[25] Ansys website, http://www.ansys.com/Products/
[26] Hiroki Funato and Takashi Suga, “Magnetic Near-field Probe for GHz band and
Spatial Resolution Improvement Technique,” Electromagnetic Compatibility, 2006. EMC-Zurich 2006. 17th International Zurich Symposium on, Page(s): 284-287, Feb. 27 2006.
[27] Satoshi Aoyama, Shoji Kawahito, and Masahiro Yamaguchi, “An Active Magnetic
Probe Array for the Multiple-Point Concurrent Measurement of Electromagnetic
Emissions,” Magnetics, IEEE Transactions on Volume: 42, Issue: 10, OCTOBER
2006.
[28] Sung-Mao Wu, Tai-Chiuan Wang, and Chiao-Han Lan, “Detecting Defects on
Planar Circuits by Using Non-Contacting Magnetic Probe,” Microwave
Conference Proceedings (APMC) Asia-Pacific, Page(s): 1440-1443, 2010.
[29] 葉中雄,盧裕溢,蔡儒學,電磁相容實習,全華圖書股份有限公司,2007.
[30] 林明星,”電磁相容理論與實務”,課堂講義,2010.
[31] Tim Williams, EMC for Product Designers, Newnes, Third Edition, 2001.
[32] 蕭志良,電路板之輻射放射的模擬與分析,國立雲林科技大學,碩士論文,2010.
[33] Patrick G. André, Kenneth Wyatt, EMI Troubleshooting Cookbook for
Product Designers, SciTech Publishing, 2014.