Baaklini, N. and E. H. Mamdani, “Prescriptive methods for deriving control policy in a fuzzy-logic controller,” Electron. Lett., 11, 1975, 625-626.
Box, George E. P. and Alberto Luceño, “Discrete Proportional-Integral Control with Constrained Adjustment ,” The Statistician, 44, 4, 1995, 479-495.
Box, George and Tim Kramer, “Statistical Process Monitoring and Feedback Adjustment-A Discussion,” American Statistical Association and the American Society for Quality Technometrics, 34, 3, 1992, 251-285.
Capilla, Carmen, Alberto Ferrer and Rafael Romero, “Integration of Statistcal and Engineering Process Control in a Continuous Polymerization Process,” American Statistical Association and the American Society for Quality Technometrics, 41, 1, 1999, 14-28.
Cho, Hyun-Woo and Kwang-Jae Kim, “A Method for Predicting Future Observations in the Monitoring of a Batch Process,” Journal of Quality Technology, 35, 1, 2003, 59-69.
del Castillo, Enrique, “Closed-Loop Disturbance Identification and Controller Tuning for Discrete Manufacturing Processes, ” American Statistical Association and the American Society for Quality Technometrics, 44, 2, 2002, 134-141.
del Castillo, Enrique, “A Variance-Constrained Proportional-Integral Feedback
Controller That Tunes Itself, ” IIE Transactions, 32, 6, 2000, 479-491.
del Castillo, Enrique, “Long Run And Transient Analysis of a Double EWMA Feedback Controller, ” IIE Transactions, 31, 12, 1999, 1157-1169.
del Castillo, Enrique, Statistical Process Adjustment for Quality Control, John Wiley, 2002.
del Castillo, Enrique and Arnon M. Hurwitz, “Run-to-Run Process Control: Literature Review and Extensions, ” Journal of Quality Technology, 29, 2, 1997, 184-196.
del Castillo, Enrique and Jinn-Yi Yeh, “An Adaptive Run-to-Run Optimizing Controller for Linear and Nonlinear Semiconductor Processes, ” IEEE Transactions on Semiconductor Manufacturing,11, 2, 1998, 285-295.
del Castillo, Enrique and Ramkumar Rajagopal, “A Multivariate Double EWMA Process Adjustment Scheme for Drifting Processes, ” IIE Transactions, 34, 12, 2002, 1055-1068.
Hu, S. Jack and Chinmo Roan, “Change Patterns of Time Series-Based Control Charts,” Journal of Quality Technology, 28, 3, 1996, 302-312.
Jiang, Wei and Kwok-Leung Tsui, “An Economic Model for Integrated APC and SPC Control Charts,” Journal of Quality Technology, 32, 6, 2000, 505-513.
Jiang, Wei and Kwok-Leung Tsui, “SPC Monitoring of MMSE- and PI-controlled Processes,” Journal of Quality Technology, 34, 4, 2002, 384-398.
Jiang, Wei, Kwok-Leung Tsui and William H. Woodall, “A New SPC Monitoring Method: The ARMA Chart,” American Statistical Association and the American Society for Quality Technometrics, 42, 4, 2000, 399-410.
Jiang, Wei, et al., “Proportional Integral Derivative Charts for Process Monitoring,” American Statistical Association and the American Society for Quality Technometrics, 44, 3, 2002, 205-214.
Lee, Chien-Hui and Sheng-De Wang, “A Self-Organizing Adaptive Fuzzy Controller,” Fuzzy Sets and Systems, 80, 1996, 295-313.
Lee, Chuen Chien, “Fuzzy Logic in Control Systems: Fuzzy Logic Controller-Part I,” IEEE Transactions on Systems, Man, and Cybernetics. 20, 2, 1990a, 404-418.
Lee, Chuen Chien, “Fuzzy Logic in Control Systems: Fuzzy Logic Controller, Part II,” IEEE Transactions on Systems, Man, and Cybernetics. 20, 2, 1990b, 419-435.
Luceno, Alberto, “Performance of Discrete Feedback Adjustment Schemes With Dead Band, Under Stationary Versus Nonstationary Stochastic Disturbance,” American Statistical Association and the American Society for Quality Technometrics, 40, 3, 1998, 223-233.
M. Gupta, Madan, Jerzy B. Kiszka and G. M. Trojan, “Multivariable Structure of Fuzzy control Systems, ” IEEE Transactions on Systems, Man, and Cybernetics. 16, 5, 1986, 638-656.
Macgregor, “A Different View of the Funnel Experiment,” Journal of Quality Technology, 22, 4, 1990, 255-259.
Mizumoto, M., “Realization of PID Control by Fuzzy Control Methods,” Fuzzy Sets and Systems, 70, 1995,171-182.
Montgomery, Douglas C., Introduction to Statistical Quality Control, John Wiley, 2001.
Montgomery, Douglas C. and Christina M. Mastrangelo, “Some Statistical Process Control Methods for Autocorrelated Data,” Journal of Quality Technology, 23, 3, 1991, 179-193.
Moyne, James, Enrique del Castillo and Arnon Max Hurwitz, Run-to-Run Control in Semiconductor Manufacturing, CRC Press LLC, 2001.
Nembhard, Harriet Black, “Simulation Using The State-Space Representation of Noisy Dynamic Systems to Determine Effective Integrated Process Control Designs, ” IIE Transactions, 30, 3, 1998, 247-256.
Nembhard, Harriet Black and Christina M. Mastrangelo, “Integrated process control for startup operations,” Journal of Quality Technology, 30, 3, 1998, 201-211.
O’Shaughnessy, Patrick T. and Larry D. Haugh, “An EWMA-based bounded adjustment scheme with adaptive noise variance estimation,” Journal of Quality Technology, 34, 3, 2002, 327-338.
Sachs, Emanuel, Albert Hu, and Armann Ingolfsson, “Run by Run Process Control: Combining SPC and Feedback Control, ” IEEE Transactions on Semiconductor Manufacturing, 8, 1, 1995, 26-43.
Shieh, Jiann Shing, Hierarchical Fuzzy Logic Monitoring and Control in Anaesthesia, PhD thesis, University of Sheffield, UK, 1994.
Singh Y. P., “A Modified Self-Organizing Controller for Real-Time Process Control Applications,” Fuzzy Sets and Systems, 96, 1998, 147-159.
Tanaka, Kazuo and Hua O. Wang, Fuzzy Control Systems Design and Analysis, John Wiley, 2001.
Tsung, Fugee, Jianjun Shi and C. F. J. Wu, “Joint Monitoring of PID-Controlled Processes,” Journal of Quality Technology, 31, 3, 1999, 275-285.
Tsung, Fugee, Huaiqing Wu and Vijayan N. Nair, “On the Efficency and Robustness of Discrete Proportional-Integral Control Schemes, ” American Statistical Association and the American Society for Quality Technometrics, 40, 3, 1998, 214-222.
Tseng, Sheng-Tsaing, Rouh-Jane Chou and Shui-pin Lee, “A Study on a multivariate EWMA Controller, ” IIE Transactions, 34, 6, 2002, 541-549.
Tsung, Fugee and Apley, Daniel W., “The dynamic Chart for Monitoring Feedback-Controlled Process,” IIE Transactions, 34, 2002, 1043-1053.
Vander Wiel, S.A., “Monitoring Processes That Wander Using Integrated Moving Average Models, ” American Statistical Association and the American Society for Quality Technometrics, 38, 2, 1996, 139-151.
Vander Wiel, S.A., et al., “Algorithmic Statistical Process Control: Concepts and an Application, ” American Statistical Association and the American Society for Quality Technometrics, 34, 3, 1992, 286-297.
Vander Wiel, S.A., et al. “Algorithmic Statistical Process Control: An Elaboration, ” American Statistical Association and the American Society for Quality Technometrics, 35, 4, 1993, 363-375.
Wardell, Don G., Herbert Moskowitz and Robert D. Plante, “Run-Length Distributions of Special-Cause Control Charts for Correlated Processes, ” American Statistical Association and the American Society for Quality Technometrics, 36, 1, 1994, 3-17.
Yan, Jun, Michael Ryan and James Power, Using Fuzzy Logic: Towards Intelligent Systems, Prentice Hall, 1994.
Yeh, Jinn-Yi, “ Object-Oriented Design and Implementation of an Optimizing Run-to-Run Quality Controller for Semiconductor Manufacturing Process,’’ The University of Texas at Arlington, 1997.
Yen, John, Reza Langari, Fuzzy Logic Intelligence, Control, and Information, Prentice Hall, 1999.
王進德、蕭大全,類神經網路與模糊控制理論入門,第一版,全華,台北,2001。
任志宏,「多變量自適應控制應用於半導體R2R製程」,元智大學工業工程與管理研究所碩士論文,2001。范書愷、龔彬,「模糊控制器應用於多變量R2R 控制之研究」,輔仁大學統計學術研討會論文,2003。
孫宗瀛、楊英魁,Fuzzy控制理論、實作與應用,第一版,全華,台北,1999。